{"id":"https://openalex.org/W1976248695","doi":"https://doi.org/10.1109/lgrs.2013.2247377","title":"Improved Edge Enhancing Diffusion Filter for Speckle-Corrupted Images","display_name":"Improved Edge Enhancing Diffusion Filter for Speckle-Corrupted Images","publication_year":2013,"publication_date":"2013-03-13","ids":{"openalex":"https://openalex.org/W1976248695","doi":"https://doi.org/10.1109/lgrs.2013.2247377","mag":"1976248695"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2013.2247377","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2013.2247377","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055821822","display_name":"L. Fabbrini","orcid":null},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Fabbrini","raw_affiliation_strings":["Electronics and Telecommunications Department, Florence University, Firenze, Italy","Electron. & Telecommun. Dept., Florence Univ., Florence, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Department, Florence University, Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]},{"raw_affiliation_string":"Electron. & Telecommun. Dept., Florence Univ., Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001313610","display_name":"M. Greco","orcid":"https://orcid.org/0000-0003-0809-2993"},"institutions":[{"id":"https://openalex.org/I4210139705","display_name":"Ingegneria dei Sistemi (Italy)","ror":"https://ror.org/03spsm219","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210139705"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mario Greco","raw_affiliation_strings":["IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]},{"raw_affiliation_string":"Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101955479","display_name":"M. Messina","orcid":"https://orcid.org/0000-0001-8474-0548"},"institutions":[{"id":"https://openalex.org/I4210139705","display_name":"Ingegneria dei Sistemi (Italy)","ror":"https://ror.org/03spsm219","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210139705"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Messina","raw_affiliation_strings":["IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]},{"raw_affiliation_string":"Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002346912","display_name":"G. Pinelli","orcid":"https://orcid.org/0000-0001-5150-2404"},"institutions":[{"id":"https://openalex.org/I4210139705","display_name":"Ingegneria dei Sistemi (Italy)","ror":"https://ror.org/03spsm219","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210139705"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gianpaolo Pinelli","raw_affiliation_strings":["IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IDS\u2014Ingegneria Dei Sistemi S.p.A., Signature Technology Laboratory, Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]},{"raw_affiliation_string":"Signature Technol. Lab., IDS-Ing. Dei Sist. S.p.A., Pisa, Italy","institution_ids":["https://openalex.org/I4210139705"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6576,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.85566903,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"11","issue":"1","first_page":"99","last_page":"103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-noise","display_name":"Speckle noise","score":0.8432791233062744},{"id":"https://openalex.org/keywords/anisotropic-diffusion","display_name":"Anisotropic diffusion","score":0.7636458873748779},{"id":"https://openalex.org/keywords/multiplicative-noise","display_name":"Multiplicative noise","score":0.7360183000564575},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.710954487323761},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.675284206867218},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.6569001078605652},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6376147270202637},{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.6063147783279419},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5679583549499512},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5653414130210876},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5566824674606323},{"id":"https://openalex.org/keywords/edge-preserving-smoothing","display_name":"Edge-preserving smoothing","score":0.497971773147583},{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.4724719226360321},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.39341962337493896},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.3606221079826355},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.30905020236968994},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16267910599708557},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.06216585636138916}],"concepts":[{"id":"https://openalex.org/C180940675","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle noise","level":3,"score":0.8432791233062744},{"id":"https://openalex.org/C203504353","wikidata":"https://www.wikidata.org/wiki/Q4765461","display_name":"Anisotropic diffusion","level":3,"score":0.7636458873748779},{"id":"https://openalex.org/C18015164","wikidata":"https://www.wikidata.org/wiki/Q6935000","display_name":"Multiplicative noise","level":5,"score":0.7360183000564575},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.710954487323761},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.675284206867218},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.6569001078605652},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6376147270202637},{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.6063147783279419},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5679583549499512},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5653414130210876},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5566824674606323},{"id":"https://openalex.org/C141651230","wikidata":"https://www.wikidata.org/wiki/Q5337637","display_name":"Edge-preserving smoothing","level":4,"score":0.497971773147583},{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.4724719226360321},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.39341962337493896},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.3606221079826355},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.30905020236968994},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16267910599708557},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06216585636138916},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C131021393","wikidata":"https://www.wikidata.org/wiki/Q7512759","display_name":"Signal transfer function","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2013.2247377","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2013.2247377","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.75,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W127809959","https://openalex.org/W1480546554","https://openalex.org/W2004928853","https://openalex.org/W2042243302","https://openalex.org/W2083609718","https://openalex.org/W2130094715","https://openalex.org/W2144494233","https://openalex.org/W2144851790","https://openalex.org/W2146052399","https://openalex.org/W2150134853","https://openalex.org/W2167758771","https://openalex.org/W3011612142"],"related_works":["https://openalex.org/W3114047281","https://openalex.org/W1492442610","https://openalex.org/W2746258982","https://openalex.org/W1989368580","https://openalex.org/W2122836938","https://openalex.org/W2084362290","https://openalex.org/W3047343582","https://openalex.org/W2965861097","https://openalex.org/W1976248695","https://openalex.org/W2114029818"],"abstract_inverted_index":{"In":[0],"the":[1,10],"context":[2],"of":[3,69],"automatic":[4],"image":[5],"processing,":[6],"noise":[7,55],"is":[8],"often":[9],"hardest":[11],"problem":[12],"to":[13,49],"cope":[14],"with.":[15],"This":[16],"is,":[17],"in":[18],"particular,":[19],"true":[20],"for":[21],"images":[22],"corrupted":[23],"by":[24,74],"multiplicative":[25],"speckle":[26],"noise,":[27],"such":[28,36],"as":[29],"synthetic":[30],"aperture":[31],"radar":[32],"images.":[33],"To":[34],"tackle":[35],"an":[37],"issue,":[38],"this":[39],"letter":[40],"proposes":[41],"a":[42,82],"novel":[43],"anisotropic":[44],"diffusion":[45],"filter":[46,71],"that":[47],"manages":[48],"simultaneously":[50],"fulfill":[51],"competing":[52],"requirements:":[53],"reduce":[54],"on":[56,81],"homogeneous":[57],"regions,":[58],"preserve":[59],"weak":[60],"edges,":[61],"and":[62],"keeping":[63],"hard":[64],"targets":[65],"intact.":[66],"The":[67],"capabilities":[68],"our":[70],"were":[72],"proved":[73],"comparing":[75],"it":[76],"with":[77],"other":[78],"state-of-the-art":[79],"filters":[80],"1-look":[83],"Cosmo-SkyMed":[84],"image.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}