{"id":"https://openalex.org/W4408017446","doi":"https://doi.org/10.1109/les.2025.3546847","title":"Fault Analysis in Induction Motors Through Signal Acquisition With Hilbert Transform and FPGA","display_name":"Fault Analysis in Induction Motors Through Signal Acquisition With Hilbert Transform and FPGA","publication_year":2025,"publication_date":"2025-02-27","ids":{"openalex":"https://openalex.org/W4408017446","doi":"https://doi.org/10.1109/les.2025.3546847"},"language":"en","primary_location":{"id":"doi:10.1109/les.2025.3546847","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2025.3546847","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116447471","display_name":"I A Juarez-Trujillo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210138655","display_name":"Centro Nacional de Investigaci\u00f3n y Desarrollo Tecnol\u00f3gico","ror":"https://ror.org/0314ecq26","country_code":"MX","type":"facility","lineage":["https://openalex.org/I4210138655"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"I. A. Juarez-Trujillo","raw_affiliation_strings":["Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","Electrical Engineering Department, TecNM / Cenidet, Interior internado Palmira S/N, Cuernavaca, México"],"raw_orcid":"https://orcid.org/0000-0002-6658-3881","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","institution_ids":["https://openalex.org/I4210138655"]},{"raw_affiliation_string":"Electrical Engineering Department, TecNM / Cenidet, Interior internado Palmira S/N, Cuernavaca, México","institution_ids":["https://openalex.org/I4210138655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035794964","display_name":"Susana Estefany De Le\u00f3n Aldaco","orcid":"https://orcid.org/0000-0002-1189-4228"},"institutions":[{"id":"https://openalex.org/I4210138655","display_name":"Centro Nacional de Investigaci\u00f3n y Desarrollo Tecnol\u00f3gico","ror":"https://ror.org/0314ecq26","country_code":"MX","type":"facility","lineage":["https://openalex.org/I4210138655"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Susana De Le\u00f3n-Aldaco","raw_affiliation_strings":["Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","Electrical Engineering Department, TecNM / Cenidet, Interior Internado Palmira S/N, Cuernavaca, Mèxico"],"raw_orcid":"https://orcid.org/0000-0002-1189-4228","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","institution_ids":["https://openalex.org/I4210138655"]},{"raw_affiliation_string":"Electrical Engineering Department, TecNM / Cenidet, Interior Internado Palmira S/N, Cuernavaca, Mèxico","institution_ids":["https://openalex.org/I4210138655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003026675","display_name":"J. G. Vel\u00e1squez-Aguilar","orcid":"https://orcid.org/0000-0002-5708-5688"},"institutions":[{"id":"https://openalex.org/I4210105205","display_name":"Universidad Del Valle De Cuernavaca","ror":"https://ror.org/01deq2m43","country_code":"MX","type":"education","lineage":["https://openalex.org/I4210105205"]},{"id":"https://openalex.org/I884181516","display_name":"Universidad Aut\u00f3noma del Estado de Morelos","ror":"https://ror.org/03rzb4f20","country_code":"MX","type":"education","lineage":["https://openalex.org/I884181516"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"J. G. Velasquez-Aguilar","raw_affiliation_strings":["Faculty of Chemical Sciences and Engineering, Universidad Autónoma del Estado de Morelos, Cuernavaca, Mexico","Faculty of Chemical Sciences and Engineering /UAEM, Av. Universidad, Cuernavaca, Mèxico"],"raw_orcid":"https://orcid.org/0000-0002-5708-5688","affiliations":[{"raw_affiliation_string":"Faculty of Chemical Sciences and Engineering, Universidad Autónoma del Estado de Morelos, Cuernavaca, Mexico","institution_ids":["https://openalex.org/I884181516","https://openalex.org/I4210105205"]},{"raw_affiliation_string":"Faculty of Chemical Sciences and Engineering /UAEM, Av. Universidad, Cuernavaca, Mèxico","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025271513","display_name":"J. Aguayo","orcid":"https://orcid.org/0000-0002-0567-0033"},"institutions":[{"id":"https://openalex.org/I4210138655","display_name":"Centro Nacional de Investigaci\u00f3n y Desarrollo Tecnol\u00f3gico","ror":"https://ror.org/0314ecq26","country_code":"MX","type":"facility","lineage":["https://openalex.org/I4210138655"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"J. Aguayo-Alquicira","raw_affiliation_strings":["Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","Electrical Engineering Department, TecNM / Cenidet, Interior Internado Palmira S/N, Cuernavaca, Mèxico"],"raw_orcid":"https://orcid.org/0000-0002-0567-0033","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, TecNM /Cenidet, Cuernavaca, Mexico","institution_ids":["https://openalex.org/I4210138655"]},{"raw_affiliation_string":"Electrical Engineering Department, TecNM / Cenidet, Interior Internado Palmira S/N, Cuernavaca, Mèxico","institution_ids":["https://openalex.org/I4210138655"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5116447471"],"corresponding_institution_ids":["https://openalex.org/I4210138655"],"apc_list":null,"apc_paid":null,"fwci":3.2997,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.90803088,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"17","issue":"6","first_page":"390","last_page":"393"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10504","display_name":"Sensorless Control of Electric Motors","score":0.97079998254776,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7756414413452148},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.712120771408081},{"id":"https://openalex.org/keywords/induction-motor","display_name":"Induction motor","score":0.6063628196716309},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49401170015335083},{"id":"https://openalex.org/keywords/hilbert-transform","display_name":"Hilbert transform","score":0.49277976155281067},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4842759966850281},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.46694982051849365},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46506837010383606},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44556158781051636},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.42683038115501404},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.37990644574165344},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.3577539920806885},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.19553107023239136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1694425344467163},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11027324199676514},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08889412879943848}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7756414413452148},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.712120771408081},{"id":"https://openalex.org/C80962145","wikidata":"https://www.wikidata.org/wiki/Q207450","display_name":"Induction motor","level":3,"score":0.6063628196716309},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49401170015335083},{"id":"https://openalex.org/C28799612","wikidata":"https://www.wikidata.org/wiki/Q685437","display_name":"Hilbert transform","level":3,"score":0.49277976155281067},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4842759966850281},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.46694982051849365},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46506837010383606},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44556158781051636},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.42683038115501404},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.37990644574165344},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.3577539920806885},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.19553107023239136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1694425344467163},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11027324199676514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08889412879943848},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/les.2025.3546847","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2025.3546847","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2031584938","https://openalex.org/W2045563143","https://openalex.org/W2074531155","https://openalex.org/W2886736823","https://openalex.org/W2915246138","https://openalex.org/W3206295520","https://openalex.org/W4312333512","https://openalex.org/W4381137438"],"related_works":["https://openalex.org/W4210376836","https://openalex.org/W4210925376","https://openalex.org/W1633995705","https://openalex.org/W2596211269","https://openalex.org/W2360384790","https://openalex.org/W4232397253","https://openalex.org/W4235913033","https://openalex.org/W2039966832","https://openalex.org/W2109284253","https://openalex.org/W2359819289"],"abstract_inverted_index":{"This":[0,135],"study":[1],"presents":[2],"an":[3,68],"innovative":[4],"methodology":[5],"for":[6,45,140],"the":[7,20,33,42,63,96,99,108,123,147,169,178],"detection":[8,55],"of":[9,35,56,98,103,110,125,149,165,173,180],"faults":[10,57],"in":[11,15,32,62,119,160],"electric":[12,150],"motors,":[13,18,151],"specifically":[14],"single-phase":[16],"induction":[17],"using":[19],"Hilbert":[21,43,93],"Transform":[22,44],"combined":[23],"with":[24,41,122],"spectral":[25],"density":[26],"analysis.":[27],"The":[28,65,92,113,163],"main":[29],"innovation":[30,164],"lies":[31],"integration":[34],"field-programmable":[36],"gate":[37],"array":[38],"(FPGA)":[39],"technology":[40],"real-time":[46,181],"data":[47,90],"acquisition":[48,88,143],"and":[49,74,77,101,144,157,171],"accurate":[50],"signal":[51,142],"analysis,":[52],"allowing":[53],"early":[54],"such":[58,131],"as":[59,132],"short":[60,133],"circuits":[61],"coils.":[64],"system":[66,167],"uses":[67],"analog-to-digital":[69],"converter":[70],"to":[71,85,177],"capture":[72],"current":[73],"voltage":[75],"signals,":[76],"a":[78,116],"first":[79,81],"in,":[80],"out":[82],"memory":[83],"buffer":[84],"ensure":[86],"continuous":[87],"without":[89],"loss.":[91],"transform":[94],"allows":[95],"decomposition":[97],"signals":[100],"extraction":[102],"analytical":[104],"frequencies,":[105],"which":[106],"facilitates":[107],"identification":[109,124],"fault-generated":[111],"harmonics.":[112],"results":[114],"show":[115],"significant":[117],"improvement":[118],"fault":[120,174],"detection,":[121],"high-frequency":[126],"harmonics":[127],"indicating":[128],"internal":[129],"problems":[130],"circuits.":[134],"approach,":[136],"by":[137],"integrating":[138],"FPGA":[139],"fast":[141],"processing,":[145],"optimizes":[146],"monitoring":[148,182],"enabling":[152],"more":[153],"effective":[154],"predictive":[155],"maintenance":[156],"reducing":[158],"downtime":[159],"industrial":[161],"applications.":[162],"this":[166],"improves":[168],"accuracy":[170],"efficiency":[172],"diagnosis,":[175],"contributing":[176],"advancement":[179],"technology.":[183]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}