{"id":"https://openalex.org/W2508561024","doi":"https://doi.org/10.1109/les.2016.2603918","title":"A Novel Method for Soft Error Mitigation in FPGA Using Modified Matrix Code","display_name":"A Novel Method for Soft Error Mitigation in FPGA Using Modified Matrix Code","publication_year":2016,"publication_date":"2016-08-26","ids":{"openalex":"https://openalex.org/W2508561024","doi":"https://doi.org/10.1109/les.2016.2603918","mag":"2508561024"},"language":"en","primary_location":{"id":"doi:10.1109/les.2016.2603918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2016.2603918","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101436820","display_name":"Swagata Mandal","orcid":"https://orcid.org/0000-0002-0534-3083"},"institutions":[{"id":"https://openalex.org/I1279672703","display_name":"Variable Energy Cyclotron Centre","ror":"https://ror.org/01v4s0f07","country_code":"IN","type":"government","lineage":["https://openalex.org/I1279672703","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Swagata Mandal","raw_affiliation_strings":["Variable Energy Cyclotron Center, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"Variable Energy Cyclotron Center, Kolkata, India","institution_ids":["https://openalex.org/I1279672703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025688547","display_name":"Rourab Paul","orcid":"https://orcid.org/0000-0001-5322-281X"},"institutions":[{"id":"https://openalex.org/I106542073","display_name":"University of Calcutta","ror":"https://ror.org/01e7v7w47","country_code":"IN","type":"education","lineage":["https://openalex.org/I106542073"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rourab Paul","raw_affiliation_strings":["University of Calcutta, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"University of Calcutta, Kolkata, India","institution_ids":["https://openalex.org/I106542073"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109478160","display_name":"Suman Sau","orcid":null},"institutions":[{"id":"https://openalex.org/I106542073","display_name":"University of Calcutta","ror":"https://ror.org/01e7v7w47","country_code":"IN","type":"education","lineage":["https://openalex.org/I106542073"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Suman Sau","raw_affiliation_strings":["University of Calcutta, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"University of Calcutta, Kolkata, India","institution_ids":["https://openalex.org/I106542073"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043543748","display_name":"Amlan Chakrabarti","orcid":"https://orcid.org/0000-0003-4380-3172"},"institutions":[{"id":"https://openalex.org/I106542073","display_name":"University of Calcutta","ror":"https://ror.org/01e7v7w47","country_code":"IN","type":"education","lineage":["https://openalex.org/I106542073"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Amlan Chakrabarti","raw_affiliation_strings":["University of Calcutta, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"University of Calcutta, Kolkata, India","institution_ids":["https://openalex.org/I106542073"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060036474","display_name":"S. Chattopadhyay","orcid":"https://orcid.org/0000-0003-1097-8806"},"institutions":[{"id":"https://openalex.org/I1279672703","display_name":"Variable Energy Cyclotron Centre","ror":"https://ror.org/01v4s0f07","country_code":"IN","type":"government","lineage":["https://openalex.org/I1279672703","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Subhasis Chattopadhyay","raw_affiliation_strings":["Variable Energy Cyclotron Center, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"Variable Energy Cyclotron Center, Kolkata, India","institution_ids":["https://openalex.org/I1279672703"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101436820"],"corresponding_institution_ids":["https://openalex.org/I1279672703"],"apc_list":null,"apc_paid":null,"fwci":0.3675,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.65466312,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"8","issue":"4","first_page":"65","last_page":"68"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8389346599578857},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7053146958351135},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5929754972457886},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5620715618133545},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.47712087631225586},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40765416622161865},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3916786015033722},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3770797848701477},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3584941029548645},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.166120707988739},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.14594000577926636}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8389346599578857},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7053146958351135},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5929754972457886},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5620715618133545},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.47712087631225586},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40765416622161865},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3916786015033722},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3770797848701477},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3584941029548645},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.166120707988739},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.14594000577926636},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/les.2016.2603918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2016.2603918","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1566296806","https://openalex.org/W1893624440","https://openalex.org/W2020228815","https://openalex.org/W2041252144","https://openalex.org/W2044586990","https://openalex.org/W2073687499","https://openalex.org/W2115353412","https://openalex.org/W2130511903","https://openalex.org/W2963102388","https://openalex.org/W4231340621","https://openalex.org/W6655571493"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W975040225","https://openalex.org/W4200391368","https://openalex.org/W2355315220","https://openalex.org/W2041615232","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W2149032943","https://openalex.org/W2061783171","https://openalex.org/W2056396287"],"abstract_inverted_index":{"Field":[0],"programmable":[1],"gate":[2],"arrays":[3],"(FPGAs)":[4],"are":[5,32],"readily":[6],"affected":[7],"by":[8],"transient":[9,44,83],"faults":[10],"in":[11,59,110],"the":[12,36,70,92,94],"presence":[13],"of":[14,77,112],"radiation":[15],"and":[16,29,62,104,118],"other":[17],"environmental":[18],"hazards":[19],"compared":[20],"to":[21,34,68],"application":[22],"specific":[23],"integrated":[24],"circuits.":[25],"Hence,":[26],"error":[27,57,119],"mitigation":[28],"recovery":[30],"techniques":[31],"necessary":[33],"protect":[35],"FPGA":[37,103],"hardware":[38,113],"from":[39,43],"soft":[40],"errors":[41],"arising":[42],"faults.":[45],"In":[46],"this":[47],"letter,":[48],"modified":[49],"matrix":[50],"code":[51],"(MMC)":[52],"is":[53,66],"used":[54],"for":[55,81,88],"multibit":[56],"correction":[58,85,120],"FPGA-based":[60],"systems,":[61],"dynamic":[63],"partial":[64],"reconfiguration":[65,71],"considered":[67],"reduce":[69],"time.":[72],"We":[73],"propose":[74],"a":[75,101],"first":[76],"its":[78,105],"kind":[79],"methodology":[80],"novel":[82],"fault":[84],"using":[86],"MMC":[87],"FPGAs.":[89],"To":[90],"validate":[91],"design,":[93],"proposed":[95],"method":[96],"has":[97,107],"been":[98,108],"tested":[99],"on":[100],"Kintex":[102],"performance":[106],"estimated":[109],"terms":[111],"complexity,":[114],"power":[115],"consumption,":[116],"overhead,":[117],"efficiency.":[121]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}