{"id":"https://openalex.org/W1990792275","doi":"https://doi.org/10.1109/les.2012.2213235","title":"An Abstract Fault Model for NAND Flash Memory","display_name":"An Abstract Fault Model for NAND Flash Memory","publication_year":2012,"publication_date":"2012-08-14","ids":{"openalex":"https://openalex.org/W1990792275","doi":"https://doi.org/10.1109/les.2012.2213235","mag":"1990792275"},"language":"en","primary_location":{"id":"doi:10.1109/les.2012.2213235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2012.2213235","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003332491","display_name":"Ji Hyuck Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ji Hyuck Yun","raw_affiliation_strings":["School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072704001","display_name":"Jin Hyuk Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Hyuk Yoon","raw_affiliation_strings":["School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111885265","display_name":"Eyee Hyun Nam","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eyee Hyun Nam","raw_affiliation_strings":["School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113892530","display_name":"Sang Lyul Min","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Lyul Min","raw_affiliation_strings":["School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.11078451,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":"4","first_page":"86","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11614","display_name":"Cloud Data Security Solutions","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8432838916778564},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.6567132472991943},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6176518201828003},{"id":"https://openalex.org/keywords/flash-memory-emulator","display_name":"Flash memory emulator","score":0.6150973439216614},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.5837938785552979},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5611497163772583},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5503836274147034},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.5214130878448486},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4557369351387024},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.43140825629234314},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4273395538330078},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4026980996131897},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.35823795199394226},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.23939692974090576},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2254025936126709},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.1434108018875122},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.13239917159080505},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.08109390735626221}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8432838916778564},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.6567132472991943},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6176518201828003},{"id":"https://openalex.org/C96535780","wikidata":"https://www.wikidata.org/wiki/Q5457561","display_name":"Flash memory emulator","level":5,"score":0.6150973439216614},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.5837938785552979},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5611497163772583},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5503836274147034},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.5214130878448486},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4557369351387024},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.43140825629234314},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4273395538330078},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4026980996131897},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.35823795199394226},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.23939692974090576},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2254025936126709},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.1434108018875122},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.13239917159080505},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.08109390735626221},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/les.2012.2213235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2012.2213235","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2065122026","https://openalex.org/W2099753358","https://openalex.org/W2135188155","https://openalex.org/W2150220388","https://openalex.org/W2179360174"],"related_works":["https://openalex.org/W164278522","https://openalex.org/W1937038249","https://openalex.org/W2085734125","https://openalex.org/W2391055460","https://openalex.org/W2082353818","https://openalex.org/W1691732600","https://openalex.org/W2355887979","https://openalex.org/W2291767606","https://openalex.org/W1994190181","https://openalex.org/W2378293894"],"abstract_inverted_index":{"We":[0,50],"present":[1],"an":[2],"abstract":[3,23],"fault":[4],"model":[5,24],"for":[6],"NAND":[7],"flash":[8,20,39,46,65],"memory":[9,40,66],"that":[10],"describes":[11],"precisely":[12],"the":[13,53],"effects":[14],"of":[15,35,38,55,63],"various":[16],"faults":[17],"during":[18],"a":[19,45],"operation.":[21],"The":[22],"is":[25],"intended":[26],"to":[27,30,57,70,75],"be":[28],"used":[29],"reason":[31],"about":[32,60],"fault-related":[33,61],"correctness":[34],"key":[36],"modules":[37],"management":[41,67],"software":[42,68],"such":[43],"as":[44],"translation":[47],"layer":[48],"(FTL).":[49],"also":[51],"introduce":[52],"concept":[54],"\u201cSAO-compliance\u201d":[56],"raise":[58],"awareness":[59],"vulnerabilities":[62],"current":[64],"and":[69],"promote":[71],"much":[72],"needed":[73],"research":[74],"fix":[76],"them.":[77]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}