{"id":"https://openalex.org/W1970801464","doi":"https://doi.org/10.1109/les.2012.2193553","title":"Characterizing Vulnerability of Network Interfaces in Embedded Chip Multiprocessors","display_name":"Characterizing Vulnerability of Network Interfaces in Embedded Chip Multiprocessors","publication_year":2012,"publication_date":"2012-04-04","ids":{"openalex":"https://openalex.org/W1970801464","doi":"https://doi.org/10.1109/les.2012.2193553","mag":"1970801464"},"language":"en","primary_location":{"id":"doi:10.1109/les.2012.2193553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2012.2193553","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109930597","display_name":"Yong Zhi Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yong Zou","raw_affiliation_strings":["Electrical Engineering, Colorado State University, Fort Collins, CO, USA","Electr. Eng., Colorado State Univ., Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Colorado State University, Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]},{"raw_affiliation_string":"Electr. Eng., Colorado State Univ., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020482330","display_name":"Yi Xiang","orcid":"https://orcid.org/0000-0002-5633-6625"},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yi Xiang","raw_affiliation_strings":["Electrical Engineering, Colorado State University, Fort Collins, CO, USA","Electr. Eng., Colorado State Univ., Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Colorado State University, Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]},{"raw_affiliation_string":"Electr. Eng., Colorado State Univ., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018382547","display_name":"Sudeep Pasricha","orcid":"https://orcid.org/0000-0002-0846-0066"},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Pasricha","raw_affiliation_strings":["Electrical Engineering, Colorado State University, Fort Collins, CO, USA","Electr. Eng., Colorado State Univ., Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Colorado State University, Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]},{"raw_affiliation_string":"Electr. Eng., Colorado State Univ., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I92446798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I92446798"],"apc_list":null,"apc_paid":null,"fwci":0.9821,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77041301,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"4","issue":"2","first_page":"41","last_page":"44"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.880989670753479},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.6728535890579224},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.599056601524353},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5264790058135986},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48378607630729675},{"id":"https://openalex.org/keywords/hotspot","display_name":"Hotspot (geology)","score":0.46017351746559143},{"id":"https://openalex.org/keywords/vulnerability-assessment","display_name":"Vulnerability assessment","score":0.4516942501068115},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.445661723613739},{"id":"https://openalex.org/keywords/network-on-a-chip","display_name":"Network on a chip","score":0.43340104818344116},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.38716569542884827},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3370389938354492},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.13299670815467834},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.09015512466430664}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.880989670753479},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.6728535890579224},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.599056601524353},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5264790058135986},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48378607630729675},{"id":"https://openalex.org/C146481406","wikidata":"https://www.wikidata.org/wiki/Q105131","display_name":"Hotspot (geology)","level":2,"score":0.46017351746559143},{"id":"https://openalex.org/C167063184","wikidata":"https://www.wikidata.org/wiki/Q1400839","display_name":"Vulnerability assessment","level":3,"score":0.4516942501068115},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.445661723613739},{"id":"https://openalex.org/C128519102","wikidata":"https://www.wikidata.org/wiki/Q339554","display_name":"Network on a chip","level":2,"score":0.43340104818344116},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.38716569542884827},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3370389938354492},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.13299670815467834},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.09015512466430664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C137176749","wikidata":"https://www.wikidata.org/wiki/Q4105337","display_name":"Psychological resilience","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C8058405","wikidata":"https://www.wikidata.org/wiki/Q46255","display_name":"Geophysics","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/les.2012.2193553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/les.2012.2193553","pdf_url":null,"source":{"id":"https://openalex.org/S22443479","display_name":"IEEE Embedded Systems Letters","issn_l":"1943-0663","issn":["1943-0663","1943-0671"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Embedded Systems Letters","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.725.2710","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.725.2710","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.engr.colostate.edu/%7Esudeep/pubs/publications/2012-jun-esl-pasricha-yong.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1652659619","https://openalex.org/W1991961466","https://openalex.org/W2075628886","https://openalex.org/W2098469205","https://openalex.org/W2144512449","https://openalex.org/W2153654807","https://openalex.org/W2154614244","https://openalex.org/W2158148381","https://openalex.org/W4249144718","https://openalex.org/W6636970849","https://openalex.org/W6674899364","https://openalex.org/W6683543397"],"related_works":["https://openalex.org/W2135981148","https://openalex.org/W2388672758","https://openalex.org/W2065289416","https://openalex.org/W2144357574","https://openalex.org/W2754086592","https://openalex.org/W4230458348","https://openalex.org/W3117657225","https://openalex.org/W3198758847","https://openalex.org/W1966325333","https://openalex.org/W2108200233"],"abstract_inverted_index":{"In":[0,18],"Networks-on-Chip":[1],"(NoC),":[2],"with":[3],"ever-increasing":[4],"design":[5,16],"complexity":[6],"and":[7,34,89],"technology":[8],"scaling,":[9],"soft":[10,50],"errors":[11],"have":[12,93],"become":[13],"a":[14,36,56,64],"key":[15],"challenge.":[17],"this":[19],"work,":[20],"we":[21],"extend":[22],"the":[23,31,43,53,84,103,111],"concept":[24],"of":[25,45,59,86,105],"architectural":[26],"vulnerability":[27,38,60],"factor":[28,39],"(AVF)":[29],"from":[30],"microprocessor":[32],"domain":[33],"propose":[35],"network":[37],"(NVF)":[40],"to":[41,49,97],"characterize":[42],"susceptibility":[44],"Network":[46],"Interfaces":[47],"(NIs)":[48],"errors.":[51],"For":[52],"first":[54],"time,":[55],"detailed":[57],"characterization":[58],"is":[61],"performed":[62],"on":[63,110],"state-of-the-art":[65],"AXI-based":[66],"NI":[67,78],"architecture":[68],"using":[69],"full":[70],"system":[71],"simulation.":[72],"Our":[73,99],"studies":[74],"reveal":[75],"that":[76],"different":[77,94],"buffers":[79],"behave":[80],"quite":[81],"differently":[82],"in":[83],"presence":[85],"transient":[87],"faults":[88],"each":[90],"buffer":[91],"can":[92],"inherent":[95],"tolerance":[96],"faults.":[98],"analysis":[100],"also":[101],"considers":[102],"impact":[104],"thermal":[106],"hotspot":[107],"mitigation":[108],"techniques":[109],"NVF":[112],"estimation.":[113]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}