{"id":"https://openalex.org/W3204625459","doi":"https://doi.org/10.1109/lca.2021.3117150","title":"HBM3 RAS: Enhancing Resilience at Scale","display_name":"HBM3 RAS: Enhancing Resilience at Scale","publication_year":2021,"publication_date":"2021-07-01","ids":{"openalex":"https://openalex.org/W3204625459","doi":"https://doi.org/10.1109/lca.2021.3117150","mag":"3204625459"},"language":"en","primary_location":{"id":"doi:10.1109/lca.2021.3117150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lca.2021.3117150","pdf_url":null,"source":{"id":"https://openalex.org/S17643076","display_name":"IEEE Computer Architecture Letters","issn_l":"1556-6056","issn":["1556-6056","1556-6064","2473-2575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Computer Architecture Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078748445","display_name":"Sudhanva Gurumurthi","orcid":"https://orcid.org/0000-0002-1740-7304"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sudhanva Gurumurthi","raw_affiliation_strings":["Advanced Micro Devices Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022357313","display_name":"Ki-Jun Lee","orcid":"https://orcid.org/0000-0002-6607-7540"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kijun Lee","raw_affiliation_strings":["Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042105205","display_name":"Munseon Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Munseon Jang","raw_affiliation_strings":["S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea"],"affiliations":[{"raw_affiliation_string":"S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061044305","display_name":"Vilas Sridharan","orcid":"https://orcid.org/0000-0002-2944-2799"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vilas Sridharan","raw_affiliation_strings":["Advanced Micro Devices Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059504191","display_name":"Aaron Nygren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aaron Nygren","raw_affiliation_strings":["Advanced Micro Devices Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047352904","display_name":"Yesin Ryu","orcid":"https://orcid.org/0000-0002-2678-7396"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yesin Ryu","raw_affiliation_strings":["Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050861404","display_name":"Kyomin Sohn","orcid":"https://orcid.org/0000-0002-8094-9843"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyomin Sohn","raw_affiliation_strings":["Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Corporation, Suwon-si, Gyeonggi-do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653784","display_name":"Tae\u2010Kyun Kim","orcid":"https://orcid.org/0000-0002-7587-6053"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taekyun Kim","raw_affiliation_strings":["S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea"],"affiliations":[{"raw_affiliation_string":"S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063135009","display_name":"Hoeju Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoeju Chung","raw_affiliation_strings":["S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea"],"affiliations":[{"raw_affiliation_string":"S K Hynix, Inc., Icheon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I134353371"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5078748445"],"corresponding_institution_ids":["https://openalex.org/I4210137977"],"apc_list":null,"apc_paid":null,"fwci":1.7046,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.84411868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"20","issue":"2","first_page":"158","last_page":"161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7390725612640381},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.6317400932312012},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5028802752494812},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.49334827065467834},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4523618221282959},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4226102828979492},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3809809386730194},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.26975953578948975},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19754016399383545},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11326578259468079}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7390725612640381},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.6317400932312012},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5028802752494812},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.49334827065467834},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4523618221282959},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4226102828979492},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3809809386730194},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.26975953578948975},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19754016399383545},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11326578259468079},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lca.2021.3117150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lca.2021.3117150","pdf_url":null,"source":{"id":"https://openalex.org/S17643076","display_name":"IEEE Computer Architecture Letters","issn_l":"1556-6056","issn":["1556-6056","1556-6064","2473-2575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Computer Architecture Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1978082708","https://openalex.org/W2512214806","https://openalex.org/W2612114356","https://openalex.org/W2795308992","https://openalex.org/W2998208529","https://openalex.org/W3137509183"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"HBM3":[0,14,65,83,91,120],"is":[1,15,50,78],"the":[2,6,61,82,96],"next-generation":[3],"technology":[4],"in":[5,21,39,106,132],"JEDEC":[7],"High":[8],"Bandwidth":[9],"Memory\u2122":[10],"die-stacked":[11],"DRAM":[12,112],"standard.":[13,84],"expected":[16],"to":[17,24,53,104,125],"be":[18],"widely":[19],"used":[20],"future":[22,107],"SoCs":[23],"accelerate":[25],"data":[26],"center":[27],"and":[28,33,45,66,115],"automotive":[29],"workloads.":[30],"Reliability,":[31],"Availability,":[32],"Serviceability":[34],"(RAS)":[35],"are":[36,69],"key":[37,52],"requirements":[38],"most":[40],"of":[41,81],"these":[42],"computing":[43],"domains":[44],"use":[46],"cases.":[47],"Memory":[48],"reliability":[49],"especially":[51],"attaining":[54],"resilience":[55],"at":[56],"scale.":[57],"This":[58],"paper":[59,86],"presents":[60],"RAS":[62,75,92,128],"challenges":[63],"facing":[64],"how":[67,88],"they":[68],"addressed":[70],"by":[71,101],"a":[72],"novel":[73,90],"memory":[74,98,133],"architecture":[76,93],"that":[77],"now":[79],"part":[80],"The":[85],"shows":[87],"this":[89],"can":[94],"reduce":[95],"uncorrected":[97],"error":[99],"rate":[100],"7X":[102],"compared":[103],"HBM2":[105],"large-scale":[108],"systems":[109],"for":[110],"assumed":[111],"fault":[113],"rates":[114],"modes":[116],"<italic":[117],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[118],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">.</i>":[119],"also":[121],"provides":[122],"architected":[123],"metadata":[124],"further":[126],"enhance":[127],"or":[129],"enable":[130],"innovations":[131],"system":[134],"design.":[135]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}