{"id":"https://openalex.org/W2943416059","doi":"https://doi.org/10.1109/latw.2019.8704612","title":"A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells","display_name":"A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2943416059","doi":"https://doi.org/10.1109/latw.2019.8704612","mag":"2943416059"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2019.8704612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2019.8704612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035827251","display_name":"Freddy Forero","orcid":"https://orcid.org/0000-0001-9939-0974"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Freddy Forero","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109071973","display_name":"Jean-Marc Galli\u00e8re","orcid":null},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jean-Marc Galliere","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Michel Renovell","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics INAOE), Puebla, M\u00e9xico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.03001325,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.5256862640380859},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.522871732711792},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45574310421943665},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44709932804107666},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4382580518722534},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43750593066215515},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3512117564678192},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32185599207878113},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24789994955062866},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18459519743919373},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1064891517162323}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.5256862640380859},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.522871732711792},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45574310421943665},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44709932804107666},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4382580518722534},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43750593066215515},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3512117564678192},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32185599207878113},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24789994955062866},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18459519743919373},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1064891517162323}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2019.8704612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2019.8704612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5299999713897705}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321739","display_name":"Consejo Nacional de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/059ex5q34"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1625402502","https://openalex.org/W1637395447","https://openalex.org/W1966797259","https://openalex.org/W1988932225","https://openalex.org/W2008534549","https://openalex.org/W2008990681","https://openalex.org/W2041508134","https://openalex.org/W2094255929","https://openalex.org/W2103657905","https://openalex.org/W2129212061","https://openalex.org/W2141664222","https://openalex.org/W2150665550","https://openalex.org/W2153049419","https://openalex.org/W2163484184","https://openalex.org/W2169294720","https://openalex.org/W2296069189","https://openalex.org/W2480217323","https://openalex.org/W2568918782","https://openalex.org/W3149844465"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2155019192","https://openalex.org/W2014709025","https://openalex.org/W4249035840","https://openalex.org/W2766970861","https://openalex.org/W3125341812","https://openalex.org/W1668171714","https://openalex.org/W4380607112","https://openalex.org/W2218294330","https://openalex.org/W1997278405"],"abstract_inverted_index":{"Since":[0],"22":[1],"nm":[2],"technology":[3,6,71],"node,":[4],"FinFET":[5,25,42,70,94,130],"is":[7,17,72,97,102],"an":[8],"attractive":[9],"candidate":[10],"for":[11,89],"high-performance":[12],"and":[13,46,133],"power-efficient":[14],"applications.":[15],"This":[16],"achieved":[18],"due":[19],"to":[20,104,121,134],"better":[21],"channel":[22],"control":[23],"in":[24,41,58,69,93],"devices":[26],"obtained":[27],"by":[28,75],"wrapping":[29],"a":[30,34,86],"metal":[31],"gate":[32],"around":[33],"thin":[35],"fin.":[36],"The":[37,99,115],"new":[38,49],"structures":[39],"used":[40,120],"technology,":[43],"as":[44],"multi-fin":[45],"multi-finger,":[47],"cause":[48],"types":[50],"of":[51,65,78,111,127],"defects":[52,68,92],"topologies":[53],"different":[54],"from":[55],"those":[56],"present":[57],"conventional":[59],"CMOS":[60],"planar":[61],"technology.":[62],"Defect":[63],"behavior":[64,110,126],"interconnect":[66,90],"open":[67,91],"strongly":[73],"influenced":[74],"the":[76,108,112,125,128],"presence":[77],"alternative":[79],"conducting":[80],"current":[81],"paths.":[82],"In":[83],"this":[84],"paper,":[85],"semi-analytical":[87],"model":[88,101,117],"logic":[95,113,131],"cells":[96,132],"presented.":[98],"proposed":[100,116],"able":[103],"predict":[105],"with":[106],"accuracy":[107],"electrical":[109],"cell.":[114],"may":[118],"be":[119],"gain":[122],"insight":[123],"into":[124],"defective":[129],"speed-up":[135],"fault":[136],"simulation.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}