{"id":"https://openalex.org/W2798461574","doi":"https://doi.org/10.1109/latw.2018.8349685","title":"Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs","display_name":"Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2798461574","doi":"https://doi.org/10.1109/latw.2018.8349685","mag":"2798461574"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2018.8349685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2018.8349685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329067","display_name":"Wendong Wang","orcid":"https://orcid.org/0000-0002-6418-8087"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wendong Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104362993","display_name":"Adit D. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adit Singh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079601863","display_name":"Ujjwal Guin","orcid":"https://orcid.org/0000-0002-4819-8728"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ujjwal Guin","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA","School of Electrical and Computer Engineering Georgia Institute of Technology Atlanta, GA 30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering Georgia Institute of Technology Atlanta, GA 30332","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5249,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.9378795,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9124289751052856},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5708556771278381},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5672856569290161},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5413633584976196},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5381060838699341},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5333388447761536},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46622633934020996},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3367893099784851},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29299044609069824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27305012941360474},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06911435723304749},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06770652532577515}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9124289751052856},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5708556771278381},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5672856569290161},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5413633584976196},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5381060838699341},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5333388447761536},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46622633934020996},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3367893099784851},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29299044609069824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27305012941360474},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06911435723304749},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06770652532577515},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2018.8349685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2018.8349685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","score":0.4099999964237213,"display_name":"Life in Land"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W42545666","https://openalex.org/W1532483809","https://openalex.org/W1562669673","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2003763828","https://openalex.org/W2052828598","https://openalex.org/W2088455835","https://openalex.org/W2088630761","https://openalex.org/W2116374153","https://openalex.org/W2124874986","https://openalex.org/W2128111793","https://openalex.org/W2129830285","https://openalex.org/W2134047447","https://openalex.org/W2144418895","https://openalex.org/W2168174386","https://openalex.org/W2172255798","https://openalex.org/W2346824758","https://openalex.org/W2567543349","https://openalex.org/W2743953760","https://openalex.org/W3145722221","https://openalex.org/W4230927117","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W2967161359","https://openalex.org/W4308090481","https://openalex.org/W3211992815"],"abstract_inverted_index":{"SRAM":[0,18,49,108,123],"arrays":[1],"are":[2,141,170],"particularly":[3],"attractive":[4],"for":[5,209,222],"use":[6,210],"as":[7,61,63],"physically":[8],"unclonable":[9],"functions":[10],"(PUFs)":[11],"because":[12],"each":[13,167],"manufactured":[14],"copy":[15],"of":[16,56,81,176,229],"an":[17,86],"array":[19],"displays":[20],"a":[21,72,79,100,226],"different":[22,138,144,153],"memory":[23,39],"pattern":[24],"when":[25],"initially":[26],"powered-on.":[27],"This":[28],"is":[29,71,109,126,184],"due":[30],"to":[31,98,186,199,218],"random":[32],"differences":[33],"in":[34,37,47,85,105,116,166,207,211],"device":[35,234],"parameters":[36],"individual":[38,168],"cells":[40,84,206,214],"from":[41],"manufacturing":[42],"process":[43],"variations.":[44],"However,":[45,102],"instability":[46],"the":[48,53,83,88,103,107,122,130,149,174,177,202],"PUF":[50],"response":[51],"over":[52,69],"expected":[54,217],"range":[55,228],"operating":[57,230],"voltages":[58],"and":[59,66,94,135,156,172,233],"temperature,":[60],"well":[62],"environmental":[64],"noise":[65,232],"aging":[67],"degradation":[68],"time,":[70],"challenge.":[73],"Recent":[74],"proposals":[75],"aim":[76],"at":[77],"identifying":[78],"subset":[80],"all":[82],"SRAM,":[87],"most":[89,203],"robust":[90,204],"or":[91],"strong":[92,205],"cells,":[93],"using":[95],"only":[96],"these":[97],"construct":[99],"PUF.":[101],"manner":[104],"which":[106,163],"powered":[110],"up":[111],"has":[112],"been":[113],"largely":[114],"ignored":[115],"earlier":[117],"work.":[118],"We":[119],"show":[120,192],"that":[121],"power-up":[124,139,150],"state":[125],"strongly":[127],"dependent":[128],"on":[129],"power":[131],"supply":[132],"ramp":[133,154],"rate":[134],"direction;":[136],"very":[137],"states":[140,151],"obtained":[142],"under":[143,152],"power-on":[145,188],"scenarios.":[146],"Furthermore,":[147],"analyzing":[148],"rates":[155],"directions":[157],"can":[158,196,215],"provide":[159],"considerable":[160],"insight":[161],"into":[162],"transistor":[164],"pairs":[165],"cell":[169,187],"mismatched,":[171],"even":[173],"extent":[175],"mismatch.":[178],"Since":[179],"such":[180,194],"threshold":[181],"voltage":[182],"mismatch":[183],"key":[185],"bias,":[189],"we":[190],"finally":[191],"how":[193],"experiments":[195],"be":[197,216],"exploited":[198],"reliably":[200],"identify":[201],"SRAMs":[208],"PUFs.":[212],"These":[213],"generating":[219],"reliable":[220],"keys":[221],"cryptographic":[223],"operations":[224],"across":[225],"wide":[227],"conditions,":[231],"degradation.":[235]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}