{"id":"https://openalex.org/W2607924737","doi":"https://doi.org/10.1109/latw.2017.7906772","title":"Analysis of single-event upsets in a Microsemi ProAsic3E FPGA","display_name":"Analysis of single-event upsets in a Microsemi ProAsic3E FPGA","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2607924737","doi":"https://doi.org/10.1109/latw.2017.7906772","mag":"2607924737"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2017.7906772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2017.7906772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060784013","display_name":"Paulo R. C. Villa","orcid":"https://orcid.org/0000-0003-0638-2639"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Paulo R. C. Villa","raw_affiliation_strings":["Universidade Federal de Santa Catarina, Florianopolis, SC, BR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal de Santa Catarina, Florianopolis, SC, BR","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016617717","display_name":"Roger Goerl","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]},{"id":"https://openalex.org/I98466806","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica de S\u00e3o Paulo","ror":"https://ror.org/00sfmx060","country_code":"BR","type":"education","lineage":["https://openalex.org/I98466806"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Roger C. Goerl","raw_affiliation_strings":["Electrical Engineering Department, Catholic University - PUCRS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University - PUCRS, Brazil","institution_ids":["https://openalex.org/I45643870","https://openalex.org/I98466806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]},{"id":"https://openalex.org/I98466806","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica de S\u00e3o Paulo","ror":"https://ror.org/00sfmx060","country_code":"BR","type":"education","lineage":["https://openalex.org/I98466806"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fabian Vargas","raw_affiliation_strings":["Electrical Engineering Department, Catholic University - PUCRS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University - PUCRS, Brazil","institution_ids":["https://openalex.org/I45643870","https://openalex.org/I98466806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002455574","display_name":"Let\u00edcia Bolzani Poehls","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]},{"id":"https://openalex.org/I98466806","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica de S\u00e3o Paulo","ror":"https://ror.org/00sfmx060","country_code":"BR","type":"education","lineage":["https://openalex.org/I98466806"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Leticia B. Poehls","raw_affiliation_strings":["Electrical Engineering Department, Catholic University - PUCRS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University - PUCRS, Brazil","institution_ids":["https://openalex.org/I45643870","https://openalex.org/I98466806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014016978","display_name":"N. H. Medina","orcid":"https://orcid.org/0000-0003-0650-6507"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nilberto H. Medina","raw_affiliation_strings":["Instituto de F\u00edsica Sao, Paulo University - USP, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica Sao, Paulo University - USP, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020082310","display_name":"N. Added","orcid":"https://orcid.org/0000-0001-9611-8721"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nemitala Added","raw_affiliation_strings":["Instituto de F\u00edsica Sao, Paulo University - USP, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica Sao, Paulo University - USP, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033616442","display_name":"Vitor A. P. Aguiar","orcid":"https://orcid.org/0000-0001-6199-0800"},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Vitor A. P. de Aguiar","raw_affiliation_strings":["Instituto de F\u00edsica, Sao Paulo University - USP, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica, Sao Paulo University - USP, Brazil","institution_ids":["https://openalex.org/I17974374"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009457381","display_name":"Eduardo Luiz Augusto Macchione","orcid":"https://orcid.org/0000-0002-9496-9300"},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Eduardo L. A. Macchione","raw_affiliation_strings":["Instituto de F\u00edsica, Sao Paulo University - USP, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica, Sao Paulo University - USP, Brazil","institution_ids":["https://openalex.org/I17974374"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038898074","display_name":"Fernando Aguirre","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fernando Aguirre","raw_affiliation_strings":["Instituto de F\u00edsica Sao, Paulo University - USP, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica Sao, Paulo University - USP, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087144885","display_name":"M. Guazzelli","orcid":"https://orcid.org/0000-0001-7110-7241"},"institutions":[{"id":"https://openalex.org/I139221136","display_name":"Centro Universit\u00e1rio FEI","ror":"https://ror.org/007kf5222","country_code":"BR","type":"education","lineage":["https://openalex.org/I139221136"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Marcilei A. G. da Silveira","raw_affiliation_strings":["Depto. de F\u00edsica, Centro Universit\u00e1rio - FEI, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. de F\u00edsica, Centro Universit\u00e1rio - FEI, Brazil","institution_ids":["https://openalex.org/I139221136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002595177","display_name":"Eduardo Augusto Bezerra","orcid":"https://orcid.org/0000-0002-2191-6064"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Eduardo A. Bezerra","raw_affiliation_strings":["Federal University of Santa Catarina - UFSC, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina - UFSC, Brazil","institution_ids":["https://openalex.org/I4104125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1695,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.79870475,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8375083804130554},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7173343300819397},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6306602358818054},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5758845806121826},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5620438456535339},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5575554966926575},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4909248650074005},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.46489304304122925},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4648731052875519},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.46020573377609253},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.444699227809906},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4149321913719177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2893270254135132},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2712786793708801},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15405330061912537},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1036578118801117},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08673298358917236},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.08193942904472351}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8375083804130554},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7173343300819397},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6306602358818054},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5758845806121826},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5620438456535339},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5575554966926575},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4909248650074005},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.46489304304122925},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4648731052875519},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.46020573377609253},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.444699227809906},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4149321913719177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2893270254135132},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2712786793708801},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15405330061912537},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1036578118801117},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08673298358917236},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.08193942904472351},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2017.7906772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2017.7906772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1967193889","https://openalex.org/W1968746244","https://openalex.org/W1985826699","https://openalex.org/W1998709248","https://openalex.org/W2033518995","https://openalex.org/W2071632823","https://openalex.org/W2329387282"],"related_works":["https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W3006277082","https://openalex.org/W3003557214","https://openalex.org/W1493283943","https://openalex.org/W4381549462","https://openalex.org/W3156329500","https://openalex.org/W2387824216","https://openalex.org/W19802766","https://openalex.org/W2610634993"],"abstract_inverted_index":{"The":[0],"desirable":[1],"use":[2,115,151],"of":[3,57,92,101,119],"Field-Programmable":[4],"Gate":[5],"Arrays":[6],"(FPGAs)":[7],"in":[8,28,116],"aerospace":[9],"&":[10],"defense":[11],"field":[12],"has":[13],"become":[14],"a":[15,65,142],"general":[16],"consensus":[17],"among":[18],"IC":[19],"and":[20,35,38,49,130,162],"embedded":[21],"system":[22],"designers.":[23],"Radiation-hardened":[24],"(rad-hard)":[25],"electronics":[26],"used":[27],"this":[29,85,87,139],"domain":[30],"is":[31,110,152],"regulated":[32],"under":[33,111],"severe":[34],"complex":[36],"political":[37,48],"commercial":[39,50],"treaties.":[40],"In":[41,84],"order":[42],"to":[43,68,79,137,145],"refrain":[44],"from":[45],"these":[46],"undesired":[47],"barriers":[51],"COTS":[52,106],"FPGAs":[53,74],"(despite":[54],"the":[55,96,102,120],"fact":[56],"their":[58],"low":[59],"reliability)":[60],"have":[61],"been":[62],"considered":[63],"as":[64,141],"promising":[66],"alternative":[67],"replace":[69,146],"rad-hard":[70,147],"ICs.":[71],"Moreover,":[72],"SRAM-based":[73],"are":[75,126],"pretermitted":[76],"with":[77,154],"respect":[78],"flash":[80],"or":[81],"anti-fuse":[82],"devices.":[83],"scenario,":[86],"paper":[88],"analyses,":[89],"by":[90],"means":[91],"heavy-ion":[93],"accelerator":[94],"experiments,":[95],"Single-Event":[97],"Upset":[98],"(SEU)":[99],"tolerance":[100],"Microsemi":[103],"ProAsic3E":[104],"A3PE1500":[105],"FPGA.":[107],"This":[108],"component":[109,140],"pre-qualification":[112],"process":[113],"for":[114,159],"some":[117],"satellites":[118],"Brazilian":[121],"Space":[122],"Program.":[123],"Preliminary":[124],"results":[125,134],"herein":[127],"briefly":[128],"presented":[129],"discussed.":[131],"These":[132],"experimental":[133],"allow":[135],"us":[136],"consider":[138],"strong":[143],"candidate":[144],"FPGAs,":[148],"if":[149],"its":[150],"combined":[153],"strict":[155],"system-level":[156],"fault-tolerant":[157],"strategies":[158],"error":[160],"detection":[161],"correction.":[163]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}