{"id":"https://openalex.org/W2608337224","doi":"https://doi.org/10.1109/latw.2017.7906744","title":"An effective strategy for selective hardening of software","display_name":"An effective strategy for selective hardening of software","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2608337224","doi":"https://doi.org/10.1109/latw.2017.7906744","mag":"2608337224"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2017.7906744","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2017.7906744","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014729135","display_name":"Felipe Restrepo\u2010Calle","orcid":"https://orcid.org/0000-0003-4226-1324"},"institutions":[{"id":"https://openalex.org/I36243813","display_name":"Universidad Nacional de Colombia","ror":"https://ror.org/059yx9a68","country_code":"CO","type":"education","lineage":["https://openalex.org/I36243813"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Felipe Restrepo-Calle","raw_affiliation_strings":["Department of Systems and Industrial Eng, Universidad Nacional de Colombia, Bogot\u00e1, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Systems and Industrial Eng, Universidad Nacional de Colombia, Bogot\u00e1, Colombia","institution_ids":["https://openalex.org/I36243813"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021296662","display_name":"Sergio Cuenca-Asensi","orcid":"https://orcid.org/0000-0002-5830-6104"},"institutions":[{"id":"https://openalex.org/I130194489","display_name":"University of Alicante","ror":"https://ror.org/05t8bcz72","country_code":"ES","type":"education","lineage":["https://openalex.org/I130194489"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Sergio Cuenca-Asensi","raw_affiliation_strings":["Department of Computer Technology, University of Alicante, Alicante, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Technology, University of Alicante, Alicante, Spain","institution_ids":["https://openalex.org/I130194489"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060002265","display_name":"Antonio Mart\u00ednez-\u00c1lvarez","orcid":"https://orcid.org/0000-0002-1500-857X"},"institutions":[{"id":"https://openalex.org/I130194489","display_name":"University of Alicante","ror":"https://ror.org/05t8bcz72","country_code":"ES","type":"education","lineage":["https://openalex.org/I130194489"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Antonio Martinez-Alvarez","raw_affiliation_strings":["Department of Computer Technology, University of Alicante, Alicante, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Technology, University of Alicante, Alicante, Spain","institution_ids":["https://openalex.org/I130194489"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1462,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49140862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"41","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.7369668483734131},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7178735136985779},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.579822838306427},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5585724711418152},{"id":"https://openalex.org/keywords/failure-mode-effects-and-criticality-analysis","display_name":"Failure mode, effects, and criticality analysis","score":0.5233518481254578},{"id":"https://openalex.org/keywords/design-space-exploration","display_name":"Design space exploration","score":0.5085910558700562},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3600439429283142},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29729318618774414},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14209392666816711},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12241923809051514}],"concepts":[{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.7369668483734131},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7178735136985779},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.579822838306427},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5585724711418152},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.5233518481254578},{"id":"https://openalex.org/C2776221188","wikidata":"https://www.wikidata.org/wiki/Q21072556","display_name":"Design space exploration","level":2,"score":0.5085910558700562},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3600439429283142},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29729318618774414},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14209392666816711},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12241923809051514},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2017.7906744","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2017.7906744","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th IEEE Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321837","display_name":"Ministerio de Econom\u00eda y Competitividad","ror":"https://ror.org/034900433"},{"id":"https://openalex.org/F4320335322","display_name":"European Regional Development Fund","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W201950868","https://openalex.org/W611078108","https://openalex.org/W1517305904","https://openalex.org/W2031559749","https://openalex.org/W2041969038","https://openalex.org/W2057994922","https://openalex.org/W2125369517","https://openalex.org/W2170927522","https://openalex.org/W2234891566","https://openalex.org/W2270806459","https://openalex.org/W4205920213","https://openalex.org/W4249144718","https://openalex.org/W4296210593"],"related_works":["https://openalex.org/W2361355225","https://openalex.org/W2030439800","https://openalex.org/W1582034041","https://openalex.org/W2094868523","https://openalex.org/W2352957805","https://openalex.org/W125625301","https://openalex.org/W2384212105","https://openalex.org/W1979768108","https://openalex.org/W4239638359","https://openalex.org/W2797885086"],"abstract_inverted_index":{"This":[0,52],"paper":[1],"presents":[2],"an":[3,41,58],"effective":[4],"design":[5,24],"space":[6,25],"exploration":[7,26],"strategy":[8,37],"for":[9],"the":[10,45,87],"development":[11],"of":[12,23,44,71],"dependable":[13],"systems":[14],"using":[15],"selective":[16],"hardening":[17],"techniques":[18],"based":[19,28,67,83],"on":[20,29,64,68,84],"software.":[21],"Instead":[22],"approaches":[27,82],"brute-force":[30,85],"or":[31,86],"time-consuming":[32],"fault":[33],"injection":[34],"experiments,":[35],"this":[36],"is":[38,54],"grounded":[39],"in":[40,49],"early":[42],"estimation":[43,53],"register":[46],"file":[47],"criticality":[48,60,90],"microprocessor-based":[50],"systems.":[51],"possible":[55],"thanks":[56],"to":[57,81],"application-based":[59],"metric":[61],"which":[62],"relies":[63],"different":[65],"criteria":[66],"common":[69],"features":[70],"executed":[72],"applications.":[73],"Experiments":[74],"show":[75],"a":[76],"significant":[77],"improvement":[78],"with":[79],"respect":[80],"traditional":[88],"AVF":[89],"metric.":[91]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}