{"id":"https://openalex.org/W2407272580","doi":"https://doi.org/10.1109/latw.2016.7483327","title":"Accessing on-chip instruments through the life-time of systems","display_name":"Accessing on-chip instruments through the life-time of systems","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2407272580","doi":"https://doi.org/10.1109/latw.2016.7483327","mag":"2407272580"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2016.7483327","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2016.7483327","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 17th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005848285","display_name":"Erik Larsson","orcid":"https://orcid.org/0000-0001-6672-0279"},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Erik Larsson","raw_affiliation_strings":["Lund University, Lund, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043627157","display_name":"Farrokh Ghani Zadegan","orcid":"https://orcid.org/0000-0001-6728-5379"},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Farrokh Ghani Zadegan","raw_affiliation_strings":["Lund University, Lund, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I187531555"],"apc_list":null,"apc_paid":null,"fwci":0.6248,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66006384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"2","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.7771531939506531},{"id":"https://openalex.org/keywords/electronic-systems","display_name":"Electronic systems","score":0.6511421203613281},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6487343311309814},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6238301396369934},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5969460606575012},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5858860015869141},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5704656839370728},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5206048488616943},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49293041229248047},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4811595678329468},{"id":"https://openalex.org/keywords/electronic-product","display_name":"Electronic product","score":0.46243345737457275},{"id":"https://openalex.org/keywords/obstacle","display_name":"Obstacle","score":0.46128079295158386},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.4511208236217499},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.43065375089645386},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3118395209312439},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2858771085739136},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27530723810195923},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.1534748077392578},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1458803415298462}],"concepts":[{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.7771531939506531},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.6511421203613281},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6487343311309814},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6238301396369934},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5969460606575012},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5858860015869141},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5704656839370728},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5206048488616943},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49293041229248047},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4811595678329468},{"id":"https://openalex.org/C2986741362","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronic product","level":2,"score":0.46243345737457275},{"id":"https://openalex.org/C2776650193","wikidata":"https://www.wikidata.org/wiki/Q264661","display_name":"Obstacle","level":2,"score":0.46128079295158386},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.4511208236217499},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.43065375089645386},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3118395209312439},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2858771085739136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27530723810195923},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.1534748077392578},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1458803415298462},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/latw.2016.7483327","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2016.7483327","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 17th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},{"id":"pmh:oai:lup.lub.lu.se:20acf3d7-0280-47ec-bc50-194a77af51b3","is_oa":false,"landing_page_url":"https://lup.lub.lu.se/record/20acf3d7-0280-47ec-bc50-194a77af51b3","pdf_url":null,"source":{"id":"https://openalex.org/S4306400536","display_name":"Lund University Publications (Lund University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I187531555","host_organization_name":"Lund University","host_organization_lineage":["https://openalex.org/I187531555"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1492283300","https://openalex.org/W1587210165","https://openalex.org/W1965393465","https://openalex.org/W1969237463","https://openalex.org/W1984145458","https://openalex.org/W1995219977","https://openalex.org/W1997823608","https://openalex.org/W2004363858","https://openalex.org/W2004467081","https://openalex.org/W2028504835","https://openalex.org/W2040760679","https://openalex.org/W2046459679","https://openalex.org/W2047260165","https://openalex.org/W2049600047","https://openalex.org/W2055678210","https://openalex.org/W2071641951","https://openalex.org/W2075986680","https://openalex.org/W2085688425","https://openalex.org/W2089476686","https://openalex.org/W2091276370","https://openalex.org/W2096634353","https://openalex.org/W2109018779","https://openalex.org/W2117352826","https://openalex.org/W2120890300","https://openalex.org/W2128285650","https://openalex.org/W2143586611","https://openalex.org/W2153973228","https://openalex.org/W2181851804","https://openalex.org/W2218368839","https://openalex.org/W2418737130","https://openalex.org/W4243047118","https://openalex.org/W4249663069","https://openalex.org/W6662018891","https://openalex.org/W6669168390"],"related_works":["https://openalex.org/W2391860531","https://openalex.org/W2389309729","https://openalex.org/W2364791190","https://openalex.org/W4309995340","https://openalex.org/W2390873251","https://openalex.org/W2393895926","https://openalex.org/W2045581004","https://openalex.org/W3005810125","https://openalex.org/W251895019","https://openalex.org/W2407272580"],"abstract_inverted_index":{"The":[0],"electronic":[1,23,103,148,154],"systems":[2,24,155],"we":[3],"find":[4],"in":[5,60,133],"almost":[6],"every":[7],"product":[8],"today":[9],"are":[10,43,57,71,78,84,113],"implemented":[11],"using":[12,156],"integrated":[13],"circuits":[14],"(ICs)":[15],"mounted":[16,86],"on":[17,87,153],"printed":[18],"circuit":[19],"boards":[20],"(PCBs).":[21],"Developing":[22],"is":[25,93,105,122],"a":[26,48,108],"challenging":[27],"task":[28],"due":[29],"to":[30,63,97,107,126,140],"complexity":[31],"and":[32,65],"miniaturization.":[33],"A":[34],"single":[35],"IC":[36,74],"can":[37],"contain":[38],"billions":[39],"of":[40,147],"transistors,":[41],"which":[42],"smaller":[44],"than":[45],"ever.":[46],"As":[47],"result":[49],"more":[50],"Design-for-Test":[51],"(DfT)":[52],"features,":[53],"so":[54],"called":[55],"instruments,":[56],"embedded":[58],"on-chip":[59,128,141],"modern":[61],"ICs":[62,83],"handle":[64],"monitor":[66],"various":[67],"activities.":[68],"Many":[69],"defects":[70],"handled":[72],"at":[73],"manufacturing;":[75],"however,":[76],"there":[77],"many":[79,90],"problems":[80,112],"occurring":[81],"after":[82],"being":[85],"PCBs.":[88],"In":[89],"cases,":[91],"it":[92],"unfortunately":[94],"not":[95],"possible":[96],"reproduce":[98],"the":[99,102,123,127,145,157],"problem":[100],"when":[101],"system":[104],"taken":[106],"repair":[109],"shop.":[110],"These":[111],"known":[114],"as":[115],"No":[116],"Trouble":[117],"Found":[118],"(NTF).":[119],"One":[120],"obstacle":[121],"limited":[124],"access":[125,139],"DfT":[129,142],"instruments":[130,143],"that":[131],"exist":[132],"most":[134],"ICs.":[135],"We":[136,150],"will":[137,151],"discuss":[138],"through":[144],"life-time":[146],"systems.":[149],"focus":[152],"IEEE":[158],"1687":[159],"standard.":[160]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}