{"id":"https://openalex.org/W1606066840","doi":"https://doi.org/10.1109/latw.2015.7102523","title":"Fault-tolerance in FPGA focusing power reduction or performance enhancement","display_name":"Fault-tolerance in FPGA focusing power reduction or performance enhancement","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1606066840","doi":"https://doi.org/10.1109/latw.2015.7102523","mag":"1606066840"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2015.7102523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102523","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112805367","display_name":"C. Leong","orcid":"https://orcid.org/0000-0001-6132-3741"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"C. Leong","raw_affiliation_strings":["INESC-ID Lisboa, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018531470","display_name":"J. Semi\u00e3o","orcid":"https://orcid.org/0000-0002-7667-7910"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I71503853","display_name":"University of Algarve","ror":"https://ror.org/014g34x36","country_code":"PT","type":"education","lineage":["https://openalex.org/I71503853"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"J. Semiao","raw_affiliation_strings":["INESC-ID Lisboa, Lisboa, Portugal","Univ. of Algarve, Faro, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"Univ. of Algarve, Faro, Portugal","institution_ids":["https://openalex.org/I71503853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047445549","display_name":"Marcelino Santos","orcid":"https://orcid.org/0000-0002-2091-1165"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"M.B. Santos","raw_affiliation_strings":["INESC-ID Lisboa, Lisboa, Portugal","IST - Technical Univ. of Lisbon, Lisboa, Portugal","Silicongate, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"IST - Technical Univ. of Lisbon, Lisboa, Portugal","institution_ids":["https://openalex.org/I141596103"]},{"raw_affiliation_string":"Silicongate, Lisboa, Portugal","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039557784","display_name":"I.C. Teixeira","orcid":"https://orcid.org/0000-0002-2642-5619"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"I.C. Teixeira","raw_affiliation_strings":["INESC-ID Lisboa, Lisboa, Portugal","IST - Technical Univ. of Lisbon, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"IST - Technical Univ. of Lisbon, Lisboa, Portugal","institution_ids":["https://openalex.org/I141596103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058862498","display_name":"J.P. Teixeira","orcid":"https://orcid.org/0000-0002-0379-6257"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"J.P. Teixeira","raw_affiliation_strings":["INESC-ID Lisboa, Lisboa, Portugal","IST - Technical Univ. of Lisbon, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"IST - Technical Univ. of Lisbon, Lisboa, Portugal","institution_ids":["https://openalex.org/I141596103"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7941883206367493},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6732631921768188},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6656554937362671},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5210789442062378},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49898409843444824},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.490652471780777},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46059951186180115},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.42063888907432556},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37752386927604675},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22152495384216309},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21519061923027039}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7941883206367493},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6732631921768188},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6656554937362671},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5210789442062378},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49898409843444824},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.490652471780777},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46059951186180115},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.42063888907432556},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37752386927604675},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22152495384216309},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21519061923027039},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2015.7102523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102523","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1979009294","https://openalex.org/W1988295147","https://openalex.org/W1993237560","https://openalex.org/W1996785854","https://openalex.org/W2017807298","https://openalex.org/W2098762322","https://openalex.org/W2132942351","https://openalex.org/W2141565132","https://openalex.org/W2149866574","https://openalex.org/W2150629048","https://openalex.org/W3145424647"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W4200391368","https://openalex.org/W2355315220","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W2373535795","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"The":[0,23,60,79,100,123,143],"purpose":[1],"of":[2],"this":[3,190],"paper":[4],"is":[5,25,64,126],"to":[6,44,51,70,90,139],"present":[7],"a":[8,28],"Fault-Tolerance":[9],"methodology":[10,24],"for":[11,141],"FPGA-based":[12],"designs,":[13],"focusing":[14],"power":[15,55],"reduction":[16,56],"or":[17,47,57],"performance":[18,30,58,104,161,182],"enhancement":[19],"during":[20,110],"on-field":[21],"operation.":[22,99,157],"based":[26],"on":[27],"new":[29],"sensor":[31],"which":[32],"predictively":[33],"detects":[34],"errors":[35],"in":[36,75,106],"critical":[37,108],"paths,":[38],"either":[39],"allowing":[40],"power-supply":[41],"voltage":[42],"(VDD)":[43],"be":[45,52,163,187],"reduced,":[46],"clock":[48],"frequency":[49],"(fclk)":[50],"raised,":[53],"driving":[54],"increase.":[59],"HDL":[61],"sensor's":[62],"functionality":[63],"defined":[65,134],"by":[66,118,129,135],"the":[67,71,76,131,159],"designer,":[68],"according":[69],"target":[72],"circuit":[73,111],"configuration":[74],"FPGA":[77],"structure.":[78],"adaptive":[80],"scheme":[81],"uses":[82],"an":[83,150],"Automatic":[84],"Voltage":[85],"and":[86,113,169,175],"Frequency":[87],"Controller":[88],"(AVFC)":[89],"modify":[91],"fclk":[92,124],"and/or":[93,121],"VDD,":[94],"while":[95],"still":[96],"guaranteeing":[97],"safe":[98,156],"built-in":[101],"sensors":[102,144],"identify":[103],"deviations":[105],"pre-identified":[107],"paths":[109],"operation":[112],"along":[114],"product":[115],"lifetime,":[116],"caused":[117],"parametric":[119],"variations":[120],"aging.":[122],"increase":[125],"made":[127],"possible":[128],"reducing":[130],"pessimistic":[132],"safety-margins":[133],"standard":[136],"simulation":[137],"tools":[138],"account":[140],"variability.":[142],"delay":[145,152],"margins":[146],"are":[147],"programmable,":[148],"so":[149],"adequate":[151],"margin":[153],"can":[154,162,186],"guarantee":[155],"Conversely,":[158],"same":[160],"achieved":[164,188],"with":[165,172,189],"lower":[166],"VDD.":[167],"Simulation":[168],"experimental":[170],"results":[171],"Virtex":[173],"5":[174],"Spartan":[176],"6":[177],"FPGAs":[178],"show":[179],"that":[180],"significant":[181],"improvements":[183],"(typically,":[184],"30%)":[185],"methodology.":[191]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}