{"id":"https://openalex.org/W1599490147","doi":"https://doi.org/10.1109/latw.2015.7102511","title":"\"Safe\" built-in test and tuning of boost converters using feedback loop perturbations","display_name":"\"Safe\" built-in test and tuning of boost converters using feedback loop perturbations","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1599490147","doi":"https://doi.org/10.1109/latw.2015.7102511","mag":"1599490147"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2015.7102511","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102511","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110205796","display_name":"X. Wang","orcid":"https://orcid.org/0009-0002-3329-356X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"X. Wang","raw_affiliation_strings":["Georgia Institute of Technology","[Georgia Institute of Technology.]"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036928885","display_name":"K. Blanchard","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Blanchard","raw_affiliation_strings":["Texas Instruments"],"affiliations":[{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041553697","display_name":"S. Estella","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Estella","raw_affiliation_strings":["Texas Instruments"],"affiliations":[{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology","[Georgia Institute of Technology.]"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5110205796"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03386981,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"116","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7951422333717346},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6970060467720032},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.6262007355690002},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.605330228805542},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.5927670001983643},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5146013498306274},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49956560134887695},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.47235211730003357},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.46659210324287415},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.43632179498672485},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3889563977718353},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2174443006515503},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.1256716549396515}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7951422333717346},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6970060467720032},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.6262007355690002},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.605330228805542},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.5927670001983643},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5146013498306274},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49956560134887695},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.47235211730003357},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.46659210324287415},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.43632179498672485},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3889563977718353},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2174443006515503},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.1256716549396515},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2015.7102511","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102511","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1596717185","https://openalex.org/W1964067494","https://openalex.org/W2006298771","https://openalex.org/W2011272593","https://openalex.org/W2018073483","https://openalex.org/W2050413450","https://openalex.org/W2062985000","https://openalex.org/W2102201073","https://openalex.org/W2116080338","https://openalex.org/W2119919209","https://openalex.org/W2123647786","https://openalex.org/W2129905273","https://openalex.org/W2131584964","https://openalex.org/W2142653678","https://openalex.org/W2152117524","https://openalex.org/W2153430703","https://openalex.org/W2166843422","https://openalex.org/W2190063767","https://openalex.org/W4233014035"],"related_works":["https://openalex.org/W2376981645","https://openalex.org/W777979701","https://openalex.org/W2014796125","https://openalex.org/W2669128877","https://openalex.org/W1985471711","https://openalex.org/W2131408766","https://openalex.org/W2044698965","https://openalex.org/W1986137713","https://openalex.org/W4385326075","https://openalex.org/W2165600930"],"abstract_inverted_index":{"This":[0,70],"paper":[1],"proposes":[2],"a":[3,105,163],"low":[4],"cost":[5,80],"novel":[6],"alternative":[7,64],"testing":[8,176],"approach":[9],"to":[10,42,57,97,126,134,150,154,168],"predict":[11,135],"both":[12],"DC":[13,82],"and":[14,83,132,143,160,177],"transient":[15,84,144],"specifications":[16,136],"of":[17,35,95,107,118,123,172],"boost":[18],"converters.":[19],"Specifications":[20],"such":[21,137],"as":[22,76,78,138,147,149],"load/line":[23,139],"regulation":[24],"are":[25,112,166],"typically":[26],"not":[27],"measured":[28],"in":[29],"production":[30,61],"because":[31],"the":[32,36,39,48,58,89,93,98,101,115,119,124,127,152,170,173],"parasitic":[33],"inductances":[34],"socket":[37],"on":[38],"loadboard":[40],"lead":[41],"voltage":[43,142,145],"spikes":[44],"that":[45],"can":[46],"destroy":[47],"device":[49,153],"under":[50],"test":[51,66,71,74,79,103],"(DUT).":[52],"To":[53],"prevent":[54],"potential":[55],"damage":[56,96],"DUT":[59,125],"during":[60],"test,":[62],"an":[63],"built-in":[65],"configuration":[67,72],"is":[68,130],"proposed.":[69],"reduces":[73],"time":[75,91],"well":[77,148],"for":[81],"specification":[85],"measurements":[86,161],"while":[87],"at":[88],"same":[90],"minimizing":[92],"probability":[94],"DUT.":[99,120],"In":[100],"proposed":[102,174],"process,":[104],"sequence":[106],"carefully":[108],"crafted":[109],"circuit":[110],"perturbations":[111,129],"injected":[113,128],"into":[114],"feedback":[116],"loop":[117],"The":[121],"response":[122],"captured":[131],"used":[133,167],"regulation,":[140],"ripple":[141],"peak":[146],"tune":[151],"improve":[155],"manufacturing":[156],"yield.":[157],"Simulation":[158],"data":[159],"from":[162],"hardware":[164],"prototype":[165],"demonstrate":[169],"viability":[171],"\"safe\"":[175],"tuning":[178],"approach.":[179]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}