{"id":"https://openalex.org/W1512381736","doi":"https://doi.org/10.1109/latw.2015.7102498","title":"Design dependent SRAM PUF robustness analysis","display_name":"Design dependent SRAM PUF robustness analysis","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1512381736","doi":"https://doi.org/10.1109/latw.2015.7102498","mag":"1512381736"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2015.7102498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102498","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006007359","display_name":"Mafalda Cortez","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Mafalda Cortez","raw_affiliation_strings":["Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, CD, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, CD, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073553085","display_name":"Ryoichi Ishihara","orcid":"https://orcid.org/0000-0002-2114-4236"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ryoichi Ishihara","raw_affiliation_strings":["Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), Delft, GB, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), Delft, GB, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5006007359"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":1.2919,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.78678922,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8769484758377075},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8340793251991272},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.567686915397644},{"id":"https://openalex.org/keywords/uniqueness","display_name":"Uniqueness","score":0.49484771490097046},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46184486150741577},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4265112280845642},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35365816950798035},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3450931906700134},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28630369901657104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27865976095199585},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11436250805854797}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8769484758377075},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8340793251991272},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.567686915397644},{"id":"https://openalex.org/C2777021972","wikidata":"https://www.wikidata.org/wiki/Q22976830","display_name":"Uniqueness","level":2,"score":0.49484771490097046},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46184486150741577},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4265112280845642},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35365816950798035},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3450931906700134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28630369901657104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27865976095199585},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11436250805854797},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2015.7102498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102498","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.47999998927116394,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W65483511","https://openalex.org/W124944822","https://openalex.org/W164711155","https://openalex.org/W1505206383","https://openalex.org/W1562669673","https://openalex.org/W1606443045","https://openalex.org/W1971584660","https://openalex.org/W2002734120","https://openalex.org/W2017827600","https://openalex.org/W2036471313","https://openalex.org/W2069345435","https://openalex.org/W2113322447","https://openalex.org/W2115255494","https://openalex.org/W2124874986","https://openalex.org/W2130351941","https://openalex.org/W2144418895","https://openalex.org/W2146813141","https://openalex.org/W2169212403","https://openalex.org/W2570008916","https://openalex.org/W4240085364","https://openalex.org/W6643287747"],"related_works":["https://openalex.org/W571281153","https://openalex.org/W2949403936","https://openalex.org/W3023806604","https://openalex.org/W2952139525","https://openalex.org/W4301247218","https://openalex.org/W2129818458","https://openalex.org/W4243074410","https://openalex.org/W4289551052","https://openalex.org/W4390756076","https://openalex.org/W2969742028"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"evaluate":[4],"and":[5,11,21,30,46,50],"compare":[6],"the":[7,61,88],"robustness":[8],"(i.e.,":[9],"repeatablilty":[10,78],"uniqueness)":[12],"of":[13,26],"two":[14,42],"SRAM":[15],"PUF":[16],"designs,":[17],"General":[18],"putpose":[19],"(GP)":[20],"Low-Power":[22],"(LP),":[23],"by":[24],"means":[25],"both":[27,38],"circuit":[28],"simulatios":[29],"industrial":[31,70],"measurements.":[32],"Circuit":[33],"simulations":[34],"are":[35,57],"performed":[36],"on":[37],"designs":[39],"while":[40,87],"considering":[41],"technology":[43],"nodes":[44],"(45nm":[45],"32nm),":[47],"three":[48,51],"temperatures":[49],"voltage":[52],"ramp-up":[53],"times.":[54],"Industrial":[55],"measurements":[56,71],"preformed":[58],"to":[59,84],"validate":[60],"simulation":[62],"results.":[63],"The":[64],"silulation":[65],"results":[66],"as":[67,69],"well":[68],"demonstrate":[72],"that":[73],"GP":[74],"devices":[75],"provide":[76],"better":[77],"for":[79],"all":[80],"investigated":[81],"cases":[82],"(up":[83],"4.5X":[85],"better)":[86],"uniquenesss":[89],"is":[90],"design":[91],"independent.":[92]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}