{"id":"https://openalex.org/W1555230726","doi":"https://doi.org/10.1109/latw.2015.7102494","title":"Multiple fault injection platform for SRAM-based FPGA based on ground-level radiation experiments","display_name":"Multiple fault injection platform for SRAM-based FPGA based on ground-level radiation experiments","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1555230726","doi":"https://doi.org/10.1109/latw.2015.7102494","mag":"1555230726"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2015.7102494","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102494","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075052157","display_name":"Jimmy Tarrillo","orcid":"https://orcid.org/0000-0001-5140-7984"},"institutions":[{"id":"https://openalex.org/I4210144718","display_name":"Universidad de Ingenier\u00eda y Tecnolog\u00eda","ror":"https://ror.org/040gykh71","country_code":"PE","type":"education","lineage":["https://openalex.org/I4210144718"]}],"countries":["PE"],"is_corresponding":false,"raw_author_name":"Jimmy Tarrillo","raw_affiliation_strings":["Department of Electrical Engineering, Universidad de Ingenieria y Tecnologia - UTEC, Lima, Peru","Universidad de Ingenieria y Tecnologia - UTEC Lima, Peru"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad de Ingenieria y Tecnologia - UTEC, Lima, Peru","institution_ids":["https://openalex.org/I4210144718"]},{"raw_affiliation_string":"Universidad de Ingenieria y Tecnologia - UTEC Lima, Peru","institution_ids":["https://openalex.org/I4210144718"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011126986","display_name":"Jorge Tonfat","orcid":"https://orcid.org/0000-0001-9346-3079"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jorge Tonfat","raw_affiliation_strings":["Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]},{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072145606","display_name":"Lucas Antunes Tambara","orcid":"https://orcid.org/0000-0001-7456-4368"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Lucas Tambara","raw_affiliation_strings":["Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]},{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda Lima Kastensmidt","raw_affiliation_strings":["Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]},{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informatica - PPGC - PGMICRO, Universidade Federal do Rio Grande do SuI - UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]},{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil#TAB#","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.0125,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.91637762,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8977383375167847},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8468787670135498},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7077933549880981},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.618217408657074},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5325243473052979},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4944877624511719},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4573875963687897},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.29634928703308105},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16570806503295898},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12258166074752808},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10247084498405457},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07722964882850647},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.0691925585269928}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8977383375167847},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8468787670135498},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7077933549880981},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.618217408657074},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5325243473052979},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4944877624511719},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4573875963687897},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.29634928703308105},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16570806503295898},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12258166074752808},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10247084498405457},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07722964882850647},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0691925585269928},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/latw.2015.7102494","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102494","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},{"id":"pmh:oai:purl.org/net/epubs:work/25034117","is_oa":false,"landing_page_url":"http://purl.org/net/epubs/work/25034117","pdf_url":null,"source":{"id":"https://openalex.org/S4306400334","display_name":"Science and Technology Facilities Council","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5099999904632568,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1972002693","https://openalex.org/W1979951430","https://openalex.org/W1991588008","https://openalex.org/W2061929317","https://openalex.org/W2063834361","https://openalex.org/W2083171102","https://openalex.org/W2113191061","https://openalex.org/W2123424800","https://openalex.org/W2124188577","https://openalex.org/W2153922221","https://openalex.org/W2313171319","https://openalex.org/W4229525459","https://openalex.org/W6666618311"],"related_works":["https://openalex.org/W2102690581","https://openalex.org/W1491404489","https://openalex.org/W2767179952","https://openalex.org/W3006277082","https://openalex.org/W2146311933","https://openalex.org/W2164363068","https://openalex.org/W2093752973","https://openalex.org/W2122512228","https://openalex.org/W3006560771","https://openalex.org/W2077143820"],"abstract_inverted_index":{"SRAM-based":[0,112],"FPGAs":[1,113],"are":[2,68],"attractive":[3],"to":[4,13,21,25,77,102,134],"many":[5],"high":[6,15,23],"reliable":[7],"applications":[8],"at":[9],"ground":[10],"level":[11],"due":[12,20],"its":[14,22],"density":[16],"and":[17,38],"configurability.":[18],"However,":[19],"sensitivity":[24],"neutron-induced":[26],"soft":[27,141],"errors,":[28],"the":[29,60,107,125,140,148],"FPGA":[30,98],"configuration":[31,108],"memory":[32,109],"bits":[33,110],"may":[34,42],"suffer":[35],"unexpected":[36],"bit-flips":[37,105],"consequently":[39],"critical":[40],"errors":[41],"occur.":[43],"To":[44],"cope":[45],"with":[46],"this":[47,87],"problem,":[48],"authors":[49],"have":[50],"proposed":[51,129],"several":[52],"mitigation":[53,79],"techniques,":[54],"which":[55],"must":[56],"be":[57],"verified":[58],"under":[59,147],"presence":[61],"of":[62,84,111,127,144,150],"faults.":[63,152],"Since":[64],"ground-level":[65],"radiation":[66,121,135],"experiments":[67],"very":[69],"costly,":[70],"fault":[71,92,117,130],"injection":[72,131],"is":[73],"a":[74,91,97,116],"suitable":[75],"method":[76],"verify":[78],"techniques":[80],"in":[81,96,106],"early":[82],"stages":[83],"development.":[85],"In":[86],"work,":[88],"we":[89],"present":[90],"injector":[93],"platform":[94],"implemented":[95],"commercial":[99],"board":[100],"able":[101],"inject":[103],"multiple":[104,151],"based":[114],"on":[115,120],"database":[118],"collected":[119],"experiments.":[122],"We":[123,138],"show":[124],"accuracy":[126],"our":[128],"campaign":[132],"compared":[133],"test":[136],"results.":[137],"compare":[139],"error":[142],"rate":[143],"three":[145],"designs":[146],"accumulation":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}