{"id":"https://openalex.org/W1581643205","doi":"https://doi.org/10.1109/latw.2015.7102402","title":"Ringing error prevention techniques in Lucy-Richardson deconvolution process for SRAM space-time margin variation effect screening designs","display_name":"Ringing error prevention techniques in Lucy-Richardson deconvolution process for SRAM space-time margin variation effect screening designs","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1581643205","doi":"https://doi.org/10.1109/latw.2015.7102402","mag":"1581643205"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2015.7102402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102402","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043110110","display_name":"H. Yamauchi","orcid":"https://orcid.org/0000-0003-4033-8893"},"institutions":[{"id":"https://openalex.org/I100722782","display_name":"Fukuoka Institute of Technology","ror":"https://ror.org/00bmxak18","country_code":"JP","type":"education","lineage":["https://openalex.org/I100722782"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Yamauchi","raw_affiliation_strings":["Fukuoka Institute of Technology, Information Intelligent System, Higashi-ku, Fukuoka, Japan","Fukuoka Institute of Technology Fukuoka Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fukuoka Institute of Technology, Information Intelligent System, Higashi-ku, Fukuoka, Japan","institution_ids":["https://openalex.org/I100722782"]},{"raw_affiliation_string":"Fukuoka Institute of Technology Fukuoka Japan","institution_ids":["https://openalex.org/I100722782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037764040","display_name":"Worawit Somha","orcid":"https://orcid.org/0000-0001-5748-5350"},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Worawit Somha","raw_affiliation_strings":["Faculty of Industrial Education, King Mongkut's Institute of Technology Ladkrabang, Ladkrabang, Bangkok, Thailand","King Mongkut's Institute of Technology Ladkrabang, Bangkok Thailand#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Industrial Education, King Mongkut's Institute of Technology Ladkrabang, Ladkrabang, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]},{"raw_affiliation_string":"King Mongkut's Institute of Technology Ladkrabang, Bangkok Thailand#TAB#","institution_ids":["https://openalex.org/I91538806"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.647,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.80852993,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"16","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/deconvolution","display_name":"Deconvolution","score":0.8553868532180786},{"id":"https://openalex.org/keywords/ringing","display_name":"Ringing","score":0.8354915380477905},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.617406964302063},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.4355655312538147},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.42559802532196045},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.41831931471824646},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.41600173711776733},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3960152566432953},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3803381323814392},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1549493968486786},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15176734328269958},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14728513360023499},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.12375617027282715},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0866553783416748}],"concepts":[{"id":"https://openalex.org/C174576160","wikidata":"https://www.wikidata.org/wiki/Q1183700","display_name":"Deconvolution","level":2,"score":0.8553868532180786},{"id":"https://openalex.org/C30684385","wikidata":"https://www.wikidata.org/wiki/Q176509","display_name":"Ringing","level":3,"score":0.8354915380477905},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.617406964302063},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.4355655312538147},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.42559802532196045},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.41831931471824646},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.41600173711776733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3960152566432953},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3803381323814392},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1549493968486786},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15176734328269958},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14728513360023499},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.12375617027282715},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0866553783416748},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2015.7102402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2015.7102402","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 16th Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3336685525","display_name":"A Reduction Technique for Temporal-Spatial Vth Variations and Leakage in a Coordinated Manner for SRAM-ReRAM Stacked Memories","funder_award_id":"26420326","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W393544460","https://openalex.org/W1995013400","https://openalex.org/W2020582996","https://openalex.org/W2025695811","https://openalex.org/W2043236320","https://openalex.org/W2044091232","https://openalex.org/W2059639161","https://openalex.org/W2147024395","https://openalex.org/W2159045154","https://openalex.org/W2304484311","https://openalex.org/W2312683870","https://openalex.org/W2544409925","https://openalex.org/W6681431297"],"related_works":["https://openalex.org/W2369061952","https://openalex.org/W2367122702","https://openalex.org/W1601492201","https://openalex.org/W2132989621","https://openalex.org/W2383495548","https://openalex.org/W2370645350","https://openalex.org/W2015447694","https://openalex.org/W1969590113","https://openalex.org/W2022203191","https://openalex.org/W2188307838"],"abstract_inverted_index":{"This":[0,55,66,123],"paper":[1],"proposes":[2],"a":[3,75,93],"ringing":[4,31,37],"error":[5,38,64],"avoidance":[6],"technique":[7,33,107],"in":[8,51,62],"Lucy-Richardson-deconvolution":[9],"(L-R-Dcnv)":[10],"process,":[11],"which":[12],"is":[13],"used":[14],"for":[15,79],"inversely":[16],"analyzing":[17],"the":[18,36,41,45,80,83,86,105,113,120,130,135,141,144,147,166],"Random":[19,148],"Telegraph":[20],"Noise":[21],"(RTN)":[22],"effects":[23,81],"on":[24,85,134],"overall":[25,87],"SRAM":[26,88],"margin":[27,89],"variations.":[28],"The":[29],"proposed":[30,106],"prevention":[32],"successfully":[34],"circumvents":[35],"by":[39,116,152,162],"reducing":[40],"phase":[42],"difference":[43],"between":[44],"feedback-gain":[46],"and":[47],"deconvolution":[48,115],"target":[49],"distributions":[50],"L-R-Dcnv":[52,77,98],"iteration":[53],"cycles.":[54],"avoids":[56],"any":[57],"unwanted":[58],"positive":[59],"feedbacks,":[60],"resulting":[61],"no":[63],"amplification.":[65],"effectiveness":[67],"has":[68,101],"been":[69,102],"demonstrated":[70],"with":[71,119,146],"applying":[72],"it":[73],"to":[74,125],"real":[76],"analysis":[78],"of":[82,97,112,129,140,143,155,165],"RTN":[84,114,145],"variations,":[90],"while":[91,157],"exploiting":[92],"quicker":[94],"convergence":[95,160],"benefit":[96],"algorithm.":[99],"It":[100],"shown":[103],"that":[104],"reduces":[108],"its":[109,159],"relative":[110],"errors":[111],"102~103times":[117],"compared":[118],"conventional":[121,167],"L-R-Dcnv.":[122],"enables":[124],"increase":[126],"an":[127],"accuracy":[128],"fail-bit-count":[131],"prediction":[132],"based":[133],"cumulative":[136],"density":[137],"function":[138],"(cdf)":[139],"convolution":[142],"Dopant":[149],"Fluctuation":[150],"(RDF)":[151],"over":[153],"2-orders":[154],"magnitude":[156],"accelerating":[158],"speed":[161],"7~30":[163],"times":[164],"one.":[168]},"counts_by_year":[{"year":2015,"cited_by_count":4}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}