{"id":"https://openalex.org/W2140913882","doi":"https://doi.org/10.1109/latw.2014.6841907","title":"SEU fault-injection at system level: Method, tools and preliminary results","display_name":"SEU fault-injection at system level: Method, tools and preliminary results","publication_year":2014,"publication_date":"2014-03-01","ids":{"openalex":"https://openalex.org/W2140913882","doi":"https://doi.org/10.1109/latw.2014.6841907","mag":"2140913882"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2014.6841907","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2014.6841907","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 15th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045909227","display_name":"Wassim Mansour","orcid":"https://orcid.org/0000-0002-1550-360X"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Wassim Mansour","raw_affiliation_strings":["INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101655395","display_name":"Pablo Ramos","orcid":"https://orcid.org/0000-0002-8841-0498"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pablo Ramos","raw_affiliation_strings":["INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104858009","display_name":"Rafic Ayoubi","orcid":"https://orcid.org/0009-0009-1463-5297"},"institutions":[{"id":"https://openalex.org/I168913471","display_name":"University of Balamand","ror":"https://ror.org/01xvwxv41","country_code":"LB","type":"education","lineage":["https://openalex.org/I168913471"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Rafic Ayoubi","raw_affiliation_strings":["Faculty of Engineering, University of Balamand, Tripoli, Lebanon","[Fac. of Eng., Univ. of Balamand, Tripoli, Lebanon]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, University of Balamand, Tripoli, Lebanon","institution_ids":["https://openalex.org/I168913471"]},{"raw_affiliation_string":"[Fac. of Eng., Univ. of Balamand, Tripoli, Lebanon]","institution_ids":["https://openalex.org/I168913471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018591544","display_name":"Raoul Velazco","orcid":"https://orcid.org/0000-0002-0902-0783"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Raoul Velazco","raw_affiliation_strings":["INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INPG, University of Grenoble-Alpes TIMA Labs, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5045909227"],"corresponding_institution_ids":["https://openalex.org/I4210087012","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.1398436,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8123990297317505},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.628320574760437},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6265047192573547},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6244621872901917},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6149968504905701},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5505929589271545},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.511989414691925},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49922609329223633},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.47124892473220825},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.46258968114852905},{"id":"https://openalex.org/keywords/multiplication","display_name":"Multiplication (music)","score":0.4458007216453552},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4316789507865906},{"id":"https://openalex.org/keywords/matrix-multiplication","display_name":"Matrix multiplication","score":0.4142935872077942},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2265607714653015},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.17398184537887573},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.15080061554908752},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09639576077461243},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07467904686927795},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06473588943481445}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8123990297317505},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.628320574760437},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6265047192573547},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6244621872901917},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6149968504905701},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5505929589271545},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.511989414691925},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49922609329223633},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.47124892473220825},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.46258968114852905},{"id":"https://openalex.org/C2780595030","wikidata":"https://www.wikidata.org/wiki/Q3860309","display_name":"Multiplication (music)","level":2,"score":0.4458007216453552},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4316789507865906},{"id":"https://openalex.org/C17349429","wikidata":"https://www.wikidata.org/wiki/Q1049914","display_name":"Matrix multiplication","level":3,"score":0.4142935872077942},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2265607714653015},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.17398184537887573},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15080061554908752},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09639576077461243},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07467904686927795},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06473588943481445},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C84114770","wikidata":"https://www.wikidata.org/wiki/Q46344","display_name":"Quantum","level":2,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/latw.2014.6841907","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2014.6841907","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 15th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.1023.9654","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1023.9654","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.feng.pucrs.br/%7Esisc/LATW2014/presentations/s3_1.pdf","raw_type":"text"},{"id":"pmh:oai:HAL:hal-01061310v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01061310","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W1540206583","https://openalex.org/W2004979398","https://openalex.org/W2007452759","https://openalex.org/W2031411490","https://openalex.org/W2080123749","https://openalex.org/W2083613288","https://openalex.org/W2114758227","https://openalex.org/W2120185818","https://openalex.org/W2145560636","https://openalex.org/W2149394641","https://openalex.org/W2152652532","https://openalex.org/W2153254331","https://openalex.org/W2167002145","https://openalex.org/W6682335116"],"related_works":["https://openalex.org/W627911969","https://openalex.org/W2171823768","https://openalex.org/W2607474334","https://openalex.org/W2895000685","https://openalex.org/W2082366402","https://openalex.org/W2083209667","https://openalex.org/W2120242933","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":{"An":[0],"approach":[1],"to":[2,50,71],"study":[3],"the":[4,37,64],"effects":[5],"of":[6,29,46],"single":[7],"event":[8],"upsets":[9],"(SEU)":[10],"by":[11,22],"fault":[12,40,52],"injection":[13],"performed":[14],"at":[15,56],"system-level":[16],"is":[17,20,49],"presented.":[18],"It":[19],"illustrated":[21],"results":[23],"obtained":[24],"on":[25],"two":[26],"different":[27],"versions":[28],"a":[30,61],"matrix":[31],"multiplication":[32],"algorithm,":[33],"one":[34],"standard":[35],"and":[36,59],"second":[38],"with":[39],"tolerance":[41,53],"capabilities.":[42],"The":[43],"final":[44],"goal":[45],"this":[47],"work":[48],"validate":[51],"techniques":[54],"implemented":[55],"software":[57],"level":[58],"provide":[60],"feedback":[62],"about":[63],"weakest":[65],"variables,":[66],"improving":[67],"thus":[68],"their":[69],"capabilities":[70],"tolerate":[72],"faults.":[73]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-03T08:25:01.440150","created_date":"2025-10-10T00:00:00"}