{"id":"https://openalex.org/W1974131569","doi":"https://doi.org/10.1109/latw.2013.6562681","title":"Effect of aging on power integrity of digital integrated circuits","display_name":"Effect of aging on power integrity of digital integrated circuits","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1974131569","doi":"https://doi.org/10.1109/latw.2013.6562681","mag":"1974131569"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2013.6562681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013092794","display_name":"Alexandre Boyer","orcid":"https://orcid.org/0000-0003-4955-5915"},"institutions":[{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I134560555","https://openalex.org/I190497903","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210159245","https://openalex.org/I4387153255","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I17866349","display_name":"Universit\u00e9 F\u00e9d\u00e9rale de Toulouse Midi-Pyr\u00e9n\u00e9es","ror":"https://ror.org/004raaa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I17866349"]},{"id":"https://openalex.org/I134560555","display_name":"Universit\u00e9 Toulouse III - Paul Sabatier","ror":"https://ror.org/02v6kpv12","country_code":"FR","type":"education","lineage":["https://openalex.org/I134560555","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"A. Boyer","raw_affiliation_strings":["LAAS-CNRS, UPS, INSA, INP, ISAE ; UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","LAAS-CNRS, UPS, INSA, INP, ISAE"],"affiliations":[{"raw_affiliation_string":"LAAS-CNRS, UPS, INSA, INP, ISAE ; UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","institution_ids":["https://openalex.org/I134560555","https://openalex.org/I17866349","https://openalex.org/I1294671590","https://openalex.org/I190497903"]},{"raw_affiliation_string":"UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","institution_ids":["https://openalex.org/I17866349","https://openalex.org/I190497903"]},{"raw_affiliation_string":"LAAS-CNRS, UPS, INSA, INP, ISAE","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114089479","display_name":"Sonia Ben Dhia","orcid":null},"institutions":[{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I134560555","https://openalex.org/I190497903","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210159245","https://openalex.org/I4387153255","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I134560555","display_name":"Universit\u00e9 Toulouse III - Paul Sabatier","ror":"https://ror.org/02v6kpv12","country_code":"FR","type":"education","lineage":["https://openalex.org/I134560555","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I17866349","display_name":"Universit\u00e9 F\u00e9d\u00e9rale de Toulouse Midi-Pyr\u00e9n\u00e9es","ror":"https://ror.org/004raaa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I17866349"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Ben Dhia","raw_affiliation_strings":["LAAS-CNRS, UPS, INSA, INP, ISAE ; UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","LAAS-CNRS, UPS, INSA, INP, ISAE"],"affiliations":[{"raw_affiliation_string":"LAAS-CNRS, UPS, INSA, INP, ISAE ; UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","institution_ids":["https://openalex.org/I134560555","https://openalex.org/I17866349","https://openalex.org/I1294671590","https://openalex.org/I190497903"]},{"raw_affiliation_string":"UT l, UTM, LAAS, Universit\u00e9 de Toulouse, Toulouse, France","institution_ids":["https://openalex.org/I17866349","https://openalex.org/I190497903"]},{"raw_affiliation_string":"LAAS-CNRS, UPS, INSA, INP, ISAE","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5013092794"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I134560555","https://openalex.org/I17866349","https://openalex.org/I190497903"],"apc_list":null,"apc_paid":null,"fwci":1.1822,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.80366877,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.8265167474746704},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.535521388053894},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5322931408882141},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5284367203712463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5036084055900574},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49840211868286133},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.4848445653915405},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.48027515411376953},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44051650166511536},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43384677171707153},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.4226375222206116},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3689730763435364},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36262840032577515},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31069889664649963},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.19354894757270813},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.1643138825893402},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08958041667938232}],"concepts":[{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.8265167474746704},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.535521388053894},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5322931408882141},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5284367203712463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5036084055900574},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49840211868286133},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.4848445653915405},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.48027515411376953},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44051650166511536},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43384677171707153},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.4226375222206116},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3689730763435364},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36262840032577515},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31069889664649963},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.19354894757270813},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.1643138825893402},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08958041667938232},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2013.6562681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1995470043","https://openalex.org/W2055172002","https://openalex.org/W2061319888","https://openalex.org/W2084379018","https://openalex.org/W2103921738","https://openalex.org/W2104086123","https://openalex.org/W2134687432","https://openalex.org/W2151657413","https://openalex.org/W2152320677","https://openalex.org/W4250936563"],"related_works":["https://openalex.org/W2965410099","https://openalex.org/W4235454973","https://openalex.org/W4386105410","https://openalex.org/W2250058922","https://openalex.org/W2148913576","https://openalex.org/W3097351224","https://openalex.org/W2533759086","https://openalex.org/W2385649681","https://openalex.org/W2164938154","https://openalex.org/W1987899475"],"abstract_inverted_index":{"Recent":[0],"studies":[1],"have":[2],"shown":[3],"that":[4],"integrated":[5,28],"circuit":[6,80],"aging":[7,21,59,81],"modifies":[8],"electromagnetic":[9],"emission":[10],"significantly.":[11],"The":[12],"proposed":[13,83],"paper":[14],"aims":[15],"at":[16],"evaluating":[17],"the":[18,23,56,79,86,89],"impact":[19],"of":[20,26,36,58,88],"on":[22,60,65],"power":[24,37,61,90],"integrity":[25,91],"digital":[27],"circuits":[29],"and":[30],"clarifying":[31],"its":[32],"origin.":[33],"On-chip":[34],"measurements":[35],"supply":[38],"voltage":[39],"bounces":[40],"in":[41,73],"a":[42],"CMOS":[43],"90":[44],"nm":[45],"technology":[46],"test":[47],"chip":[48],"are":[49],"combined":[50],"with":[51],"electric":[52],"stress":[53],"to":[54,75,84],"characterize":[55],"influence":[57],"integrity.":[62],"Simulation":[63],"based":[64],"ICEM":[66],"modeling":[67],"modified":[68],"by":[69,93],"an":[70],"empirical":[71],"coefficient":[72],"order":[74],"take":[76],"into":[77],"account":[78],"is":[82],"model":[85],"evolution":[87],"induced":[92],"device":[94],"aging.":[95]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}