{"id":"https://openalex.org/W2055295790","doi":"https://doi.org/10.1109/latw.2013.6562680","title":"Fast fault injection techniques using FPGAs","display_name":"Fast fault injection techniques using FPGAs","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2055295790","doi":"https://doi.org/10.1109/latw.2013.6562680","mag":"2055295790"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2013.6562680","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562680","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022411878","display_name":"Luis Entrena","orcid":"https://orcid.org/0000-0001-6021-165X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Luis Entrena","raw_affiliation_strings":["Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","Electronic Technology Department/Universidad Carlos III de Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]},{"raw_affiliation_string":"Electronic Technology Department/Universidad Carlos III de Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5022411878"],"corresponding_institution_ids":["https://openalex.org/I50357001"],"apc_list":null,"apc_paid":null,"fwci":0.48,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.69987662,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9699000120162964,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.882361650466919},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6731362342834473},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6514495015144348},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6403732299804688},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5647600889205933},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5450901389122009},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5412378907203674},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.5367053747177124},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45780065655708313},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4421655237674713},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3840319812297821},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3361095190048218},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33251145482063293},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2643435001373291},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1520651876926422},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14274275302886963},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.13036483526229858}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.882361650466919},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6731362342834473},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6514495015144348},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6403732299804688},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5647600889205933},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5450901389122009},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5412378907203674},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.5367053747177124},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45780065655708313},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4421655237674713},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3840319812297821},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3361095190048218},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33251145482063293},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2643435001373291},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1520651876926422},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14274275302886963},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.13036483526229858},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2013.6562680","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562680","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2278517150","https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2185394135","https://openalex.org/W2742111403","https://openalex.org/W2082366402"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"As":[4,326],"manufacturing":[5],"technology":[6],"progresses":[7],"by":[8],"reducing":[9],"feature":[10],"size,":[11],"providing":[12],"more":[13,24,179],"integration":[14],"density":[15],"and":[16,23,76,110,138,248,282,291,307],"increasing":[17],"device":[18],"functionality":[19],"with":[20,98,264,370],"lower":[21],"voltages":[22],"aggressive":[25],"clock":[26],"frequencies,":[27],"the":[28,48,55,94,112,117,122,162,170,197,224,244,250,274,284,319],"susceptibility":[29,165],"to":[30,35,46,60,72,83,100,136,157,191,207,214,222,242,300,317],"soft":[31,51,163,311,340],"errors":[32,341],"has":[33],"grown":[34],"an":[36,327,374],"unacceptable":[37],"level":[38],"in":[39,58,116,131,141,189,196,212,235,260,273,304,373],"several":[40,90],"application":[41],"domains.":[42],"Thus,":[43],"designers":[44],"need":[45],"assess":[47,193],"needs":[49],"for":[50,346],"error":[52,108,164,312,323],"mitigation":[53,63,324],"during":[54],"design":[56,95,143,175],"cycle":[57],"order":[59,190,213,221,275],"adopt":[61],"appropriate":[62],"strategies.":[64,325],"Fault":[65,79],"injection":[66,80,128,148,187,202,226,230,252,263,332],"is":[67,81,149,176],"a":[68,125,133,142,167,174,177,216,337,343,347],"widely":[69],"used":[70,156],"method":[71],"evaluate":[73],"fault":[74,77,87,127,147,186,201,218,225,229,251,262,331],"effects":[75,88,295,313],"tolerance.":[78],"intended":[82],"provide":[84,268],"information":[85],"about":[86],"covering":[89],"main":[91],"goals:":[92],"validate":[93,208],"under":[96,246],"test":[97,247],"respect":[99],"reliability":[101],"requirements;":[102],"detect":[103],"weak":[104],"areas":[105],"that":[106,182,266],"require":[107],"mitigation;":[109],"forecast":[111],"expected":[113],"circuit":[114,245],"behaviour":[115],"occurrence":[118],"of":[119,161,166,173,271,276,278,286,310,321,336],"faults.":[120],"In":[121,220],"first":[123],"case,":[124],"typical":[126],"approach":[129],"consists":[130],"using":[132],"simulation":[134],"tool":[135],"inject":[137],"propagate":[139],"faults":[140,279],"model.":[144],"However,":[145],"simulation-based":[146],"quite":[150],"slow.":[151],"While":[152],"it":[153],"can":[154,267,314,365],"be":[155,315,367],"obtain":[158],"statistical":[159],"estimations":[160],"circuit,":[168],"identifying":[169],"critical":[171],"components":[172],"much":[178],"complex":[180,297],"task":[181],"generally":[183],"requires":[184],"huge":[185,200],"campaigns":[188,203],"individually":[192],"every":[194],"component":[195],"circuit.":[198],"Similarly,":[199],"are":[204],"also":[205,366],"required":[206],"highly":[209],"protected":[210],"designs":[211],"ensure":[215],"high":[217],"coverage.":[219],"accelerate":[223],"process,":[227],"emulation-based":[228,261,330],"methods":[231,239,372],"have":[232],"been":[233],"developed":[234],"recent":[236,258],"years.":[237],"These":[238],"use":[240],"FPGAs":[241,265],"prototype":[243],"support":[249,283,318],"mechanisms.":[253],"This":[254],"talk":[255],"will":[256],"describe":[257],"advances":[259],"unprecedented":[269],"levels":[270],"performance,":[272,305],"millions":[277],"per":[280],"second,":[281],"analysis":[285],"Single":[287,354,360],"Event":[288,355,361],"Upset":[289,357],"(SEU)":[290],"Single-Event":[292],"Transient":[293,363],"(SET)":[294],"on":[296,342],"circuits.":[298],"Thanks":[299],"this":[301],"dramatic":[302],"boost":[303],"detailed":[306],"accurate":[308],"evaluations":[309],"obtained":[316],"adoption":[320],"optimal":[322],"illustrative":[328],"example,":[329],"enables":[333],"full":[334],"characterization":[335],"microprocessor":[338],"against":[339],"gate/FF":[344],"basis":[345],"given":[348],"workload.":[349],"Multiple":[350,356,362],"faults,":[351],"such":[352],"as":[353],"(SEMU)":[358],"or":[359],"(SEMT),":[364],"successfully":[368],"covered":[369],"these":[371],"efficient":[375],"manner.":[376]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}