{"id":"https://openalex.org/W2077930059","doi":"https://doi.org/10.1109/latw.2013.6562671","title":"Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias","display_name":"Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2077930059","doi":"https://doi.org/10.1109/latw.2013.6562671","mag":"2077930059"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2013.6562671","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562671","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006378839","display_name":"Hector Villacorta","orcid":"https://orcid.org/0000-0003-4405-4935"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","MX"],"is_corresponding":false,"raw_author_name":"Hector Villacorta","raw_affiliation_strings":["GSE-UIB, University of Balearic Islands, Mallorca, Spain","Optics and Electronics-INAOE, National Institute for Astrophysics, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GSE-UIB, University of Balearic Islands, Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"Optics and Electronics-INAOE, National Institute for Astrophysics, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009135795","display_name":"Jos\u00e9 L. Garc\u00eda-Gervacio","orcid":null},"institutions":[{"id":"https://openalex.org/I147280213","display_name":"Universidad Veracruzana","ror":"https://ror.org/03efxn362","country_code":"MX","type":"education","lineage":["https://openalex.org/I147280213"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jose Garcia-Gervacio","raw_affiliation_strings":["MICRONA, Universidad Veracruzana, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MICRONA, Universidad Veracruzana, Mexico","institution_ids":["https://openalex.org/I147280213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["Optics and Electronics-INAOE, National Institute for Astrophysics, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optics and Electronics-INAOE, National Institute for Astrophysics, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028591446","display_name":"S.A. Bota","orcid":"https://orcid.org/0000-0002-7653-0740"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Sebastia Bota","raw_affiliation_strings":["GSE-UIB, University of Balearic Islands, Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GSE-UIB, University of Balearic Islands, Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112802063","display_name":"Jaime Martinez","orcid":null},"institutions":[{"id":"https://openalex.org/I147280213","display_name":"Universidad Veracruzana","ror":"https://ror.org/03efxn362","country_code":"MX","type":"education","lineage":["https://openalex.org/I147280213"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jaime Martinez","raw_affiliation_strings":["MICRONA, Universidad Veracruzana, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MICRONA, Universidad Veracruzana, Mexico","institution_ids":["https://openalex.org/I147280213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jaume Segura","raw_affiliation_strings":["GSE-UIB, University of Balearic Islands, Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GSE-UIB, University of Balearic Islands, Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3172,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62323458,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7232059836387634},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7154220342636108},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6289430260658264},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.49002018570899963},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48331356048583984},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4574825167655945},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3060808777809143},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2807440757751465}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7232059836387634},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7154220342636108},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6289430260658264},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.49002018570899963},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48331356048583984},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4574825167655945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3060808777809143},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2807440757751465},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2013.6562671","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562671","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1598416803","https://openalex.org/W1967835630","https://openalex.org/W1971783651","https://openalex.org/W1990503402","https://openalex.org/W2021069367","https://openalex.org/W2039331993","https://openalex.org/W2039689952","https://openalex.org/W2052534891","https://openalex.org/W2052920761","https://openalex.org/W2055367395","https://openalex.org/W2070686041","https://openalex.org/W2087773252","https://openalex.org/W2111665637","https://openalex.org/W2115404539","https://openalex.org/W2117139377","https://openalex.org/W2119836271","https://openalex.org/W2123021960","https://openalex.org/W2124692568","https://openalex.org/W2129212061","https://openalex.org/W2156661581","https://openalex.org/W2297738524","https://openalex.org/W4240732800","https://openalex.org/W4285719527","https://openalex.org/W6672556086","https://openalex.org/W6677337090"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2130974462","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2109445684","https://openalex.org/W4241196849"],"abstract_inverted_index":{"Bridge":[0],"defects":[1,64,75,162],"are":[2,41],"an":[3],"important":[4,24],"manufacturing":[5],"defect":[6,141],"that":[7,17,173],"may":[8],"escape":[9],"test.":[10,146],"Even":[11],"more,":[12],"it":[13],"has":[14],"been":[15],"shown":[16],"in":[18,33,55,65,81,122,197],"nanometer":[19,39,67,82],"regime,":[20],"process":[21,93],"variations":[22],"pose":[23],"challenges":[25],"for":[26],"traditional":[27],"delay":[28,57,78,144],"test":[29,34,59,80],"methods.":[30],"Therefore,":[31],"advances":[32],"methodologies":[35],"to":[36,60,116,133,191],"deal":[37],"with":[38],"issues":[40],"required.":[42],"In":[43],"this":[44,123],"work":[45,124],"the":[46,92,103,112,135,160,169,180,185,206,209],"feasibility":[47,207],"of":[48,73,91,102,108,120,137,139,152,159,163,179,182,184,208],"using":[49,76,142],"Low":[50],"VDD":[51,153],"and":[52,99,110,154],"body":[53,155],"bias":[54],"a":[56,77,125,143,164,175,198],"based":[58,79,145],"detect":[61],"resistive":[62],"bridge":[63,74,140,161],"CMOS":[66,200],"circuits":[68,83,195],"is":[69,84,131,166,189],"analyzed.":[70],"The":[71,147,157,202],"detection":[72,138,158,183],"strongly":[85],"influenced":[86],"by:":[87],"(1)":[88],"spatial":[89],"correlation":[90,114],"parameters":[94],"such":[95],"as":[96],"length,":[97],"width":[98],"oxide":[100],"thickness":[101],"transistor,":[104],"(2)":[105],"random":[106],"placement":[107],"dopants,":[109],"(3)":[111],"signal":[113],"due":[115],"reconvergent":[117],"paths.":[118],"Because":[119],"this,":[121],"Statistical":[126,170],"Timing":[127],"Analysis":[128],"Framework":[129],"(STAF)":[130],"used":[132],"analyze":[134],"possibilities":[136],"STAF":[148],"considers":[149],"different":[150],"values":[151],"bias.":[156],"circuit":[165],"computed":[167],"by":[168],"Fault":[171],"Coverage":[172],"gives":[174],"more":[176],"realistic":[177],"measure":[178],"degree":[181],"defect.":[186],"This":[187],"methodology":[188],"applied":[190],"some":[192],"ISCAS":[193],"benchmark":[194],"implemented":[196],"65nm":[199],"technology.":[201],"obtained":[203],"results":[204],"show":[205],"proposed":[210],"methodology.":[211]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}