{"id":"https://openalex.org/W2068418208","doi":"https://doi.org/10.1109/latw.2013.6562661","title":"Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs","display_name":"Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2068418208","doi":"https://doi.org/10.1109/latw.2013.6562661","mag":"2068418208"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2013.6562661","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562661","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035916982","display_name":"Arwa Ben Dhia","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Arwa Ben Dhia","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Naviner","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062676433","display_name":"Philippe Matherat","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Matherat","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, Telecom Paris Tech, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Institut TELECOM, TELECOM ParisTech LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4801,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70368661,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"12","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8145369291305542},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7474361658096313},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6186721920967102},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5950741767883301},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5888907313346863},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.57331383228302},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4848648011684418},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47486114501953125},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4378364086151123},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4095113277435303},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1976337432861328},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.14712899923324585},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13053688406944275},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.11428529024124146}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8145369291305542},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7474361658096313},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6186721920967102},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5950741767883301},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5888907313346863},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.57331383228302},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4848648011684418},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47486114501953125},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4378364086151123},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4095113277435303},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1976337432861328},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.14712899923324585},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13053688406944275},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.11428529024124146},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/latw.2013.6562661","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2013.6562661","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 14th Latin American Test Workshop - LATW","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01062112v1","is_oa":false,"landing_page_url":"https://imt.hal.science/hal-01062112","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W164184898","https://openalex.org/W2004688003","https://openalex.org/W2011254247","https://openalex.org/W2048125104","https://openalex.org/W2051640730","https://openalex.org/W2088559447","https://openalex.org/W2096692505","https://openalex.org/W2105376593","https://openalex.org/W2108494161","https://openalex.org/W2108967709","https://openalex.org/W2113645429","https://openalex.org/W2125067114","https://openalex.org/W2134048947","https://openalex.org/W2136310569","https://openalex.org/W2143137068","https://openalex.org/W2152246022","https://openalex.org/W2153915509","https://openalex.org/W2154614244","https://openalex.org/W2160451204","https://openalex.org/W2160707899","https://openalex.org/W2167950192","https://openalex.org/W2169213530","https://openalex.org/W6663633567"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W1862835629","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W2890506991"],"abstract_inverted_index":{"This":[0],"paper":[1],"first":[2],"introduces":[3],"three":[4],"new":[5],"architectures":[6,57,88],"of":[7,76,80],"a":[8,11,97],"voter":[9,27],"for":[10,32,38],"Butterfly":[12,34],"CLB":[13,55,87],"in":[14,44,58],"an":[15,25,74],"SRAM-based":[16],"FPGA.":[17],"Taking":[18],"into":[19],"account":[20],"area":[21,49],"and":[22,63,68,110,117],"delay":[23],"constraints,":[24],"optimized":[26],"architecture":[28],"is":[29,41],"picked":[30],"up":[31],"the":[33,39,48,77,81,86,92,100,103,107,111],"design.":[35],"Another":[36],"version":[37],"latter":[40],"also":[42],"proposed":[43],"order":[45],"to":[46,72,91],"reduce":[47],"overhead.":[50],"Afterward,":[51],"we":[52,84],"synthesize":[53],"different":[54],"fabless":[56],"STM":[59],"65nm":[60],"CMOS":[61],"technology":[62],"evaluate":[64],"their":[65],"fault":[66,104],"tolerance":[67,105],"reliability,":[69],"so":[70],"as":[71],"obtain":[73],"overview":[75],"current":[78],"state":[79],"art.":[82],"Finally,":[83],"compare":[85],"with":[89],"respect":[90],"conventional":[93],"one":[94],"by":[95],"defining":[96],"metric":[98],"expressing":[99],"tradeoff":[101],"between":[102],"gain,":[106],"performance":[108],"degradation":[109],"cost":[112],"penalties":[113],"including":[114],"area,":[115],"power":[116],"SRAM":[118],"memory.":[119]},"counts_by_year":[{"year":2013,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}