{"id":"https://openalex.org/W2044022468","doi":"https://doi.org/10.1109/latw.2012.6261254","title":"SITARe: A simulation tool for analysis and diagnosis of radiation effects","display_name":"SITARe: A simulation tool for analysis and diagnosis of radiation effects","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2044022468","doi":"https://doi.org/10.1109/latw.2012.6261254","mag":"2044022468"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2012.6261254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050844629","display_name":"G. Micolau","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"G. Micolau","raw_affiliation_strings":["IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France"],"affiliations":[{"raw_affiliation_string":"IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","institution_ids":["https://openalex.org/I4210112016","https://openalex.org/I21491767","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057138659","display_name":"K. Castellani-Couli\u00e9","orcid":null},"institutions":[{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"K. Castellani-Coulie","raw_affiliation_strings":["IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France"],"affiliations":[{"raw_affiliation_string":"IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","institution_ids":["https://openalex.org/I4210112016","https://openalex.org/I21491767","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076568215","display_name":"H. Aziza","orcid":"https://orcid.org/0000-0002-8278-7462"},"institutions":[{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"H. Aziza","raw_affiliation_strings":["IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France"],"affiliations":[{"raw_affiliation_string":"IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","institution_ids":["https://openalex.org/I4210112016","https://openalex.org/I21491767","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109133750","display_name":"J-M. Portal","orcid":null},"institutions":[{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J-M. Portal","raw_affiliation_strings":["IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France"],"affiliations":[{"raw_affiliation_string":"IM2NP-UMR CNRS 7334, IM2NP, Aix-Marseille University, Marseilles, France","institution_ids":["https://openalex.org/I4210112016","https://openalex.org/I21491767","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinop\u00f4le de Ch\u00e2teau - Gombert, 13451 Cedex 20, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5050844629"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210112016"],"apc_list":null,"apc_paid":null,"fwci":0.4993,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69080402,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"54","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7511595487594604},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6679018139839172},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.61353600025177},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5465852618217468},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5224239230155945},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5190380215644836},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48897063732147217},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4845806360244751},{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.4326946437358856},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4277683198451996},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33323320746421814},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2718733251094818},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22056400775909424},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.12718415260314941},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.12425726652145386},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.09377959370613098}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7511595487594604},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6679018139839172},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.61353600025177},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5465852618217468},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5224239230155945},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5190380215644836},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48897063732147217},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4845806360244751},{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.4326946437358856},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4277683198451996},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33323320746421814},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2718733251094818},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22056400775909424},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.12718415260314941},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.12425726652145386},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.09377959370613098},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/latw.2012.6261254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-02030884v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02030884","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2012 13th Latin American Test Workshop - LATW","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6000000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1966383058","https://openalex.org/W1971561700","https://openalex.org/W2009557890","https://openalex.org/W2030107488","https://openalex.org/W2098270069","https://openalex.org/W2100478218","https://openalex.org/W2103106719","https://openalex.org/W2105439969","https://openalex.org/W2107610972","https://openalex.org/W2109185314","https://openalex.org/W2116914742","https://openalex.org/W2117806643","https://openalex.org/W2133151798","https://openalex.org/W2153866173","https://openalex.org/W2156257426","https://openalex.org/W2159774327","https://openalex.org/W2166965937","https://openalex.org/W3150684247","https://openalex.org/W4235784232","https://openalex.org/W6684292352"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W764628369","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096"],"abstract_inverted_index":{"This":[0],"work":[1],"provides":[2],"reliability":[3,78],"criteria":[4],"to":[5,28,75],"detect":[6],"and":[7,57,70],"diagnose":[8],"multi-events":[9],"upset":[10],"by":[11,53],"the":[12,30,37,48,54,66],"use":[13],"of":[14,32,40],"a":[15,23,41,63,77],"SER":[16],"tool.":[17],"The":[18,44],"study":[19],"is":[20,73],"based":[21],"on":[22],"charge":[24],"generation":[25],"model":[26,56],"used":[27],"simulate":[29],"impact":[31],"an":[33],"ionizing":[34],"particle":[35],"striking":[36],"sensitive":[38,49],"nodes":[39,50],"SRAM":[42],"cell.":[43],"currents,":[45],"collected":[46],"at":[47,59],"are":[51],"generated":[52],"physical":[55],"injected":[58,71],"circuit":[60,67],"level.":[61],"Thus,":[62],"correlation":[64],"between":[65],"electrical":[68],"behavior":[69],"currents":[72],"established":[74],"provide":[76],"criterion.":[79]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}