{"id":"https://openalex.org/W2062585163","doi":"https://doi.org/10.1109/latw.2012.6261252","title":"Retiming scan circuit to eliminate timing penalty","display_name":"Retiming scan circuit to eliminate timing penalty","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2062585163","doi":"https://doi.org/10.1109/latw.2012.6261252","mag":"2062585163"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2012.6261252","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261252","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":true,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Department of Computer Engineering, New York University Abu Dhabi, Abu Dhabi, UAE","New York University Abu Dhabi, Department of Computer Engineering, PO Box 129188, UAE#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, New York University Abu Dhabi, Abu Dhabi, UAE","institution_ids":["https://openalex.org/I120250893"]},{"raw_affiliation_string":"New York University Abu Dhabi, Department of Computer Engineering, PO Box 129188, UAE#TAB#","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","Auburn University, Department of Electrical and Computer Engineering, AL 36849, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Auburn University, Department of Electrical and Computer Engineering, AL 36849, USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059987567"],"corresponding_institution_ids":["https://openalex.org/I120250893"],"apc_list":null,"apc_paid":null,"fwci":0.5855,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67917873,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/retiming","display_name":"Retiming","score":0.9419170022010803},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6313650608062744},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.21578049659729004}],"concepts":[{"id":"https://openalex.org/C41112130","wikidata":"https://www.wikidata.org/wiki/Q2146175","display_name":"Retiming","level":2,"score":0.9419170022010803},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6313650608062744},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.21578049659729004}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/latw.2012.6261252","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261252","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.228.9771","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.228.9771","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eng.auburn.edu/%7Evagrawal/TALKS/LATW12/latw_pap.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.300.2920","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.300.2920","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eng.auburn.edu/~vagrawal/TALKS/LATW12/latw_pap.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W12081373","https://openalex.org/W1582800210","https://openalex.org/W1595368737","https://openalex.org/W2072671826","https://openalex.org/W2087656024","https://openalex.org/W2129183345","https://openalex.org/W2155487883","https://openalex.org/W2156766059","https://openalex.org/W2170018982"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2134549436","https://openalex.org/W233224440","https://openalex.org/W2160236198","https://openalex.org/W1951668625","https://openalex.org/W2903287280","https://openalex.org/W3140976369","https://openalex.org/W2132158474","https://openalex.org/W2161928569"],"abstract_inverted_index":{"Scan":[0],"design":[1],"has":[2],"a":[3,20,30,37,48,53,58,76,130,135,156],"performance":[4],"penalty":[5],"that":[6,60,133],"affects":[7],"the":[8,17,23,42,68,72,86,95,101,105,117,149,153,168,175,178],"critical":[9,77,125,157],"path":[10,78,158],"delay":[11,151,197],"by":[12,129,162],"an":[13],"added":[14],"fanout":[15,150],"at":[16,22,152],"origin":[18,154],"and":[19,180,205],"multiplexer":[21],"destination.":[24],"This":[25,84],"problem":[26],"is":[27,45,57,100],"outlined":[28],"in":[29,104,116],"recent":[31],"paper":[32],"[10],":[33],"which":[34],"also":[35],"proposes":[36],"solution.":[38,50],"The":[39,109,120,165,187],"purpose":[40],"of":[41,52,75,94,98,155,167,177],"present":[43],"work":[44],"to":[46,210],"provide":[47],"retiming":[49,171],"Retiming":[51],"synchronous":[54],"sequential":[55],"circuit":[56,179],"transformation":[59],"moves":[61],"flip-flops":[62,122],"through":[63,80],"combinational":[64],"logic":[65],"without":[66,184],"altering":[67],"function.":[69],"We":[70,145],"move":[71],"destination":[73],"flip-flop":[74,87,132],"backward":[79],"its":[81,181],"scan":[82,118,137,182],"multiplexer.":[83,96],"splits":[85],"into":[88],"three,":[89],"one":[90],"on":[91],"each":[92],"input":[93],"First":[97],"these":[99],"\u201coriginal":[102],"flip-flop\u201d":[103],"normal":[106],"data":[107],"path.":[108,119],"second,":[110],"called":[111],"\u201cshadow":[112],"flip-flop\u201d,":[113],"appears":[114],"only":[115],"third":[121],"from":[123],"all":[124,142],"paths":[126],"are":[127],"replaced":[128],"single":[131],"generates":[134],"delayed":[136],"enable":[138],"signal":[139],"for":[140],"controlling":[141],"retimed":[143,188],"multiplexers.":[144],"further":[146,202],"show":[147,201],"how":[148],"can":[159,191],"be":[160],"eliminated":[161],"additional":[163],"retiming.":[164],"use":[166],"formally":[169],"proven":[170],"transformations":[172],"preserve":[173],"both":[174],"function":[176],"operation":[183],"any":[185],"change.":[186],"scan,":[189],"therefore,":[190],"test":[192],"DC":[193],"as":[194,196],"well":[195],"faults.":[198],"Benchmark":[199],"results":[200,213],"timing":[203],"improvement":[204],"reduced":[206],"hardware":[207],"overhead":[208],"compared":[209],"previously":[211],"reported":[212],"[10].":[214]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}