{"id":"https://openalex.org/W2146762895","doi":"https://doi.org/10.1109/latw.2012.6261230","title":"Simulation of SET faults in a voltage controlled oscillator","display_name":"Simulation of SET faults in a voltage controlled oscillator","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2146762895","doi":"https://doi.org/10.1109/latw.2012.6261230","mag":"2146762895"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2012.6261230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061601200","display_name":"Walter Calienes Bartra","orcid":"https://orcid.org/0000-0001-8355-1841"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Walter E. Calienes Bartra","raw_affiliation_strings":["PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda L. Kastensmidt","raw_affiliation_strings":["PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"PGMicro / PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"PGMicro/PPGC - Universidade Federal do Rio Grande do Sul Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5061601200"],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.16084722,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8036046028137207},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6675319075584412},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6081036925315857},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5683701634407043},{"id":"https://openalex.org/keywords/transient-voltage-suppressor","display_name":"Transient voltage suppressor","score":0.5584934949874878},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5496882796287537},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5160498023033142},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5020759105682373},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48147454857826233},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4724579155445099},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.45465776324272156},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4200500547885895},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.34612613916397095},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33073627948760986},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2568132281303406},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24662867188453674},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08950850367546082}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8036046028137207},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6675319075584412},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6081036925315857},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5683701634407043},{"id":"https://openalex.org/C14915586","wikidata":"https://www.wikidata.org/wiki/Q1653998","display_name":"Transient voltage suppressor","level":3,"score":0.5584934949874878},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5496882796287537},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5160498023033142},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5020759105682373},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48147454857826233},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4724579155445099},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.45465776324272156},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4200500547885895},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.34612613916397095},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33073627948760986},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2568132281303406},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24662867188453674},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08950850367546082},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2012.6261230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W145782794","https://openalex.org/W178863363","https://openalex.org/W335201183","https://openalex.org/W567306703","https://openalex.org/W1777937475","https://openalex.org/W2030501553","https://openalex.org/W2033742819","https://openalex.org/W2067084784","https://openalex.org/W2114750951","https://openalex.org/W3103339143","https://openalex.org/W4210712848"],"related_works":["https://openalex.org/W10879606","https://openalex.org/W2142519941","https://openalex.org/W4246237793","https://openalex.org/W1910267371","https://openalex.org/W1589760944","https://openalex.org/W2074526596","https://openalex.org/W4242010157","https://openalex.org/W2140824755","https://openalex.org/W1828805207","https://openalex.org/W2810653529"],"abstract_inverted_index":{"In":[0,14],"Integrated":[1],"Circuits":[2],"(ICs),":[3],"the":[4,15,37,42,70,81,89,95,107,115,135,169],"faults":[5,29,109],"can":[6,30,124],"lead":[7,31],"to":[8,79,88,112,133],"permanent,":[9],"transient":[10,18,50],"or":[11,39],"intermittent":[12],"errors.":[13],"case":[16],"of":[17,49,69,72,86,91,160],"faults,":[19],"they":[20],"take":[21],"place":[22],"for":[23],"a":[24,73,131,140,147],"very":[25],"short":[26],"time.":[27],"These":[28],"from":[32],"small":[33],"unexpected":[34],"changes":[35],"in":[36,41,60,102,146,168,176],"results":[38,159,166],"even":[40],"circuit":[43,74],"complete":[44],"and":[45,63,84,127],"permanent":[46],"failure.":[47],"One":[48],"fault":[51,76,92,96],"is":[52,77,98,110,117,144],"known":[53],"as":[54],"Single-Event":[55],"Transient":[56],"(SET),":[57],"which":[58],"occur":[59],"combinational":[61],"logic":[62],"analog":[64],"circuits":[65],"typically.":[66],"The":[67,158],"study":[68],"behavior":[71],"under":[75],"important":[78,100],"choose":[80],"protection":[82],"techniques":[83],"measurement":[85],"susceptibility":[87],"type":[90],"inserted.":[93],"Nowadays,":[94],"simulation":[97,121],"an":[99],"step":[101],"any":[103],"IC":[104],"design.":[105],"Predicting":[106],"behavioral":[108],"essential":[111],"ensure":[113],"that":[114,137],"design":[116],"well":[118],"implemented.":[119],"During":[120],"various":[122],"problems":[123],"be":[125],"detected":[126],"corrected.":[128],"We":[129],"present":[130],"toolkit":[132],"simulate":[134],"effect":[136],"occurs":[138],"when":[139],"SET":[141],"failure":[142],"source":[143],"inserted":[145],"250nm":[148],"CMOS":[149],"Voltage":[150],"Controlled":[151],"Oscillator":[152],"(VCO)":[153],"using":[154],"National":[155],"Instruments":[156],"LabVIEW.":[157],"these":[161],"simulations":[162],"were":[163],"compared":[164],"with":[165],"obtained":[167],"laboratory":[170],"by":[171],"W.":[172],"Chen":[173],"et":[174],"al.":[175],"2003.":[177]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}