{"id":"https://openalex.org/W2028413030","doi":"https://doi.org/10.1109/latw.2012.6261229","title":"Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test","display_name":"Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2028413030","doi":"https://doi.org/10.1109/latw.2012.6261229","mag":"2028413030"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2012.6261229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026437506","display_name":"Alejandro Cook","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Alejandro Cook","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I1323252656","display_name":"Information Technology University","ror":"https://ror.org/00ngv8j44","country_code":"PK","type":"education","lineage":["https://openalex.org/I1323252656"]},{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE","PK"],"is_corresponding":false,"raw_author_name":"Sybille Hellebrand","raw_affiliation_strings":["Institute of Electrical Engineering and Information Technology, University of Paderborn, Germany","Institute of Electrical Engineering and Information Technology, University of Paderborn, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering and Information Technology, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]},{"raw_affiliation_string":"Institute of Electrical Engineering and Information Technology, University of Paderborn, Germany#TAB#","institution_ids":["https://openalex.org/I1323252656"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052875025","display_name":"Michael E. Imhof","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael E. Imhof","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113633042","display_name":"Abdullah Mumtaz","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Abdullah Mumtaz","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany#TAB#","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5026437506"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.26907904,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56620002,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.8055558204650879},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6637870669364929},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6208867430686951},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5886039733886719},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5594369769096375},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.49968767166137695},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4768073260784149},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4696938991546631},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.388109028339386},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3347223997116089},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24179017543792725},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20639339089393616},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.19387224316596985},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16375678777694702}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.8055558204650879},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6637870669364929},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6208867430686951},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5886039733886719},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5594369769096375},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.49968767166137695},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4768073260784149},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4696938991546631},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.388109028339386},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3347223997116089},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24179017543792725},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20639339089393616},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.19387224316596985},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16375678777694702},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2012.6261229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2012.6261229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 13th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2014592888","https://openalex.org/W2043949919","https://openalex.org/W2049664543","https://openalex.org/W2078116354","https://openalex.org/W2089697104","https://openalex.org/W2110221285","https://openalex.org/W2114096484","https://openalex.org/W2122581382","https://openalex.org/W2134636371","https://openalex.org/W3141551298","https://openalex.org/W4233158255","https://openalex.org/W6653865395","https://openalex.org/W6676509375"],"related_works":["https://openalex.org/W2117563988","https://openalex.org/W1412895167","https://openalex.org/W2120257283","https://openalex.org/W2132684947","https://openalex.org/W4238986168","https://openalex.org/W2165817266","https://openalex.org/W1493811107","https://openalex.org/W2125459034","https://openalex.org/W4240466429","https://openalex.org/W2161696808"],"abstract_inverted_index":{"Pseudo-exhaustive":[0],"test":[1,28,37],"completely":[2],"verifies":[3],"all":[4],"output":[5,33],"functions":[6],"of":[7,16,50,74,78,105],"a":[8,13,47,85],"combinational":[9],"circuit,":[10],"which":[11,89],"provides":[12],"high":[14],"coverage":[15],"non-target":[17],"faults":[18,58],"and":[19,55],"allows":[20],"an":[21],"efficient":[22],"on-chip":[23],"implementation.":[24],"To":[25],"avoid":[26],"long":[27],"times":[29],"caused":[30],"by":[31],"large":[32,76],"cones,":[34],"partial":[35],"pseudo-exhaustive":[36],"(P-PET)":[38],"has":[39],"been":[40],"proposed":[41],"recently.":[42],"Here":[43],"only":[44,90],"cones":[45],"with":[46,61],"limited":[48],"number":[49],"inputs":[51],"are":[52,59],"tested":[53],"exhaustively,":[54],"the":[56,75,97,103],"remaining":[57],"targeted":[60],"deterministic":[62],"patterns.":[63],"Using":[64],"P-PET":[65],"patterns":[66],"for":[67],"built-in":[68,86],"diagnosis,":[69],"however,":[70],"is":[71],"challenging":[72],"because":[73],"amount":[77],"associated":[79],"response":[80,98],"data.":[81],"This":[82],"paper":[83],"presents":[84],"diagnosis":[87],"scheme":[88],"relies":[91],"on":[92],"sparsely":[93],"distributed":[94],"data":[95],"in":[96],"sequence,":[99],"but":[100],"still":[101],"preserves":[102],"benefits":[104],"P-PET.":[106]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}