{"id":"https://openalex.org/W1974553454","doi":"https://doi.org/10.1109/latw.2011.5985901","title":"Reliability enhancement via Sleep Transistors","display_name":"Reliability enhancement via Sleep Transistors","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W1974553454","doi":"https://doi.org/10.1109/latw.2011.5985901","mag":"1974553454"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2011.5985901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2011.5985901","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056538809","display_name":"Frank Sill Torres","orcid":"https://orcid.org/0000-0002-4028-455X"},"institutions":[{"id":"https://openalex.org/I110200422","display_name":"Universidade Federal de Minas Gerais","ror":"https://ror.org/0176yjw32","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Frank Sill Torres","raw_affiliation_strings":["Department of Electronic Engineering, Federal University of Minas Gerais, Belo Horizonte, Brazil"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Federal University of Minas Gerais, Belo Horizonte, Brazil","institution_ids":["https://openalex.org/I110200422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073158292","display_name":"Claas Cornelius","orcid":null},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Claas Cornelius","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103173327","display_name":"Dirk Timmermann","orcid":"https://orcid.org/0000-0001-9267-9695"},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dirk Timmermann","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5056538809"],"corresponding_institution_ids":["https://openalex.org/I110200422"],"apc_list":null,"apc_paid":null,"fwci":0.2702,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59159855,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"37","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7178943753242493},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.6187374591827393},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6148051023483276},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6084952354431152},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5595955848693848},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5528271198272705},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5429543852806091},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.47205787897109985},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.41288843750953674},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4058246612548828},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31101861596107483},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.29164183139801025},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2683858275413513},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11646640300750732}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7178943753242493},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.6187374591827393},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6148051023483276},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6084952354431152},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5595955848693848},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5528271198272705},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5429543852806091},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.47205787897109985},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.41288843750953674},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4058246612548828},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31101861596107483},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.29164183139801025},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2683858275413513},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11646640300750732},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/latw.2011.5985901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2011.5985901","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.379.954","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.379.954","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cpdee.ufmg.br/~frank/paper/sill,cornelius-LATW-2011.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.638.2115","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.638.2115","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.imd.uni-rostock.de/veroeff/2011_05985901.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W48128203","https://openalex.org/W141121412","https://openalex.org/W1973039798","https://openalex.org/W1982663454","https://openalex.org/W1989965062","https://openalex.org/W1994024702","https://openalex.org/W2006055505","https://openalex.org/W2007719944","https://openalex.org/W2032069904","https://openalex.org/W2069345435","https://openalex.org/W2093553477","https://openalex.org/W2100704220","https://openalex.org/W2104086123","https://openalex.org/W2109161070","https://openalex.org/W2112173236","https://openalex.org/W2112488383","https://openalex.org/W2114599766","https://openalex.org/W2116344741","https://openalex.org/W2122757690","https://openalex.org/W2126357937","https://openalex.org/W2127039903","https://openalex.org/W2150526221","https://openalex.org/W2162465831","https://openalex.org/W2543260924","https://openalex.org/W4232132130","https://openalex.org/W4235106764","https://openalex.org/W4242819225","https://openalex.org/W4248723628","https://openalex.org/W4251708180","https://openalex.org/W6605853022","https://openalex.org/W6648973609","https://openalex.org/W6677325608","https://openalex.org/W6678093491","https://openalex.org/W6681979597"],"related_works":["https://openalex.org/W2348807422","https://openalex.org/W2361025757","https://openalex.org/W2050837474","https://openalex.org/W4241592276","https://openalex.org/W2926730772","https://openalex.org/W1532462972","https://openalex.org/W2049043962","https://openalex.org/W1933211537","https://openalex.org/W2501578203","https://openalex.org/W2113108952"],"abstract_inverted_index":{"CMOS":[0],"is":[1,35,53,73,98,121],"still":[2],"the":[3,14,23,28,42,49,74,103,114,124,144,149],"predominating":[4],"technology":[5],"for":[6,134],"digital":[7],"designs":[8],"with":[9,37,46,82,123],"no":[10],"identifiable":[11],"concurrence":[12],"in":[13],"near":[15],"future.":[16],"Driving":[17],"forces":[18],"of":[19,30,44,57,65,77,86,95,126],"this":[20,96],"leadership":[21],"are":[22],"high":[24],"miniaturization":[25],"capability":[26],"and":[27,63,110],"reliability":[29,62,105,135,151],"CMOS.":[31],"The":[32,51,92],"latter,":[33],"though,":[34],"decreasing":[36],"an":[38,99,131],"alarming":[39],"pace":[40],"against":[41],"background":[43],"technologies":[45],"sizes":[47],"at":[48,106],"nanoscale.":[50],"consequence":[52],"a":[54,70],"rising":[55],"demand":[56],"solutions":[58],"to":[59,158],"improve":[60],"lifetime":[61,104,150],"yield":[64],"today's":[66],"integrated":[67,87],"systems.":[68],"Thereby,":[69],"common":[71],"solution":[72],"redundant":[75],"implementation":[76],"components.":[78],"However,":[79],"redundancy":[80],"collides":[81],"another":[83],"major":[84],"issue":[85],"circuits":[88],"-":[89],"power":[90,111],"dissipation.":[91],"main":[93],"contribution":[94],"work":[97],"approach":[100,146],"that":[101,143],"increases":[102],"only":[107],"low":[108],"delay":[109],"penalty.":[112],"Therefore,":[113],"well-known":[115],"standby-leakage":[116],"reduction":[117],"technique":[118],"\u201cSleep":[119],"Transistors\u201d":[120],"combined":[122],"idea":[125],"redundancy.":[127],"Additional,":[128],"we":[129],"propose":[130],"extended":[132],"flow":[133],"verification":[136],"on":[137],"transistor":[138],"level.":[139],"Simulation":[140],"results":[141],"indicate":[142],"new":[145],"can":[147],"increase":[148],"by":[152],"more":[153],"than":[154],"factor":[155],"2":[156],"compared":[157],"initial":[159],"designs.":[160]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}