{"id":"https://openalex.org/W2154413363","doi":"https://doi.org/10.1109/latw.2011.5985888","title":"Testing for faults, looking for defects","display_name":"Testing for faults, looking for defects","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2154413363","doi":"https://doi.org/10.1109/latw.2011.5985888","mag":"2154413363"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2011.5985888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2011.5985888","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["Aubum University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aubum University, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5084081268"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.06939999759197235,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.06939999759197235,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.05420000106096268,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.538409948348999}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.538409948348999}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2011.5985888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2011.5985888","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th Latin American Test Workshop (LATW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"A":[4],"commonly":[5],"used":[6],"criterion":[7],"for":[8,11,78,93],"evaluating":[9],"tests":[10,122,151],"a":[12,79,83,142,163,185],"VLSI":[13],"chip":[14,81],"is":[15,24,26,218],"the":[16,42,47,75,100,108,148,154,173,179,189,200,216],"coverage":[17,23,44,102,150,182,203],"of":[18,67,74,86,156,172,188],"modeled":[19],"stuck-at":[20,180,201],"faults.":[21],"This":[22,61],"deterministic,":[25],"easy":[27],"to":[28,106,111,133,137,161,197],"measure":[29],"and":[30,118,135],"has":[31],"become":[32],"an":[33,37],"established":[34],"standard.":[35],"However,":[36],"often-asked":[38],"question":[39],"is:":[40],"can":[41],"fault":[43,95,101,181,202],"tell":[45],"us":[46],"defect":[48,84,109,190],"level?":[49],"Or,":[50],"do":[51],"we":[52,140,204],"know":[53],"how":[54,64,145],"many":[55],"defective":[56,88],"chips":[57,117],"will":[58],"escape":[59],"testing?":[60],"talk":[62],"explains":[63],"thirty":[65],"years":[66],"research":[68],"provides":[69],"some":[70],"answers.":[71],"An":[72],"analysis":[73,171],"test":[76,175],"data":[77,176],"Sematech":[80,174],"gives":[82],"level":[85,110],"1,000":[87],"parts":[89],"per":[90],"million":[91],"(DPM)":[92],"99%":[94],"coverage.":[96,191],"It":[97],"further":[98],"calculates":[99],"requirement":[103],"as":[104],"99.9%":[105],"lower":[107],"100":[112],"DPM.":[113],"For":[114],"today's":[115],"large":[116],"system-on-chip":[119],"(SOC)":[120],"devices":[121],"with":[123,212],"such":[124,159],"high":[125],"coverage,":[126],"if":[127],"at":[128,152],"all":[129],"possible,":[130],"are":[131,147],"expensive":[132,136],"derive":[134],"apply.":[138],"So,":[139],"pose":[141],"second":[143],"question:":[144],"good":[146],"stuck-fault":[149],"detecting":[153],"presence":[155],"\u201creal\u201d":[157],"defects,":[158],"as,":[160],"name":[162],"few,":[164],"bridges,":[165],"opens,":[166],"shorts,":[167],"or":[168],"delays?":[169],"Further":[170],"indicates":[177],"that":[178],"may":[183,205],"be":[184,206],"pessimistic":[186],"indicator":[187],"In":[192],"other":[193],"words,":[194],"in":[195],"trying":[196],"blindly":[198],"increase":[199],"chasing":[207],"wrong":[208],"targets.":[209],"We":[210],"summarize":[211],"thoughts":[213],"on":[214],"directions":[215],"industry":[217],"taking.":[219]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}