{"id":"https://openalex.org/W2075302328","doi":"https://doi.org/10.1109/latw.2010.5550366","title":"Reliability analysis of small delay defects in vias located in signal paths","display_name":"Reliability analysis of small delay defects in vias located in signal paths","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2075302328","doi":"https://doi.org/10.1109/latw.2010.5550366","mag":"2075302328"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2010.5550366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2010.5550366","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th Latin American Test Workshop","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006378839","display_name":"Hector Villacorta","orcid":"https://orcid.org/0000-0003-4405-4935"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Hector Villacorta","raw_affiliation_strings":["Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112856494","display_name":"Chuck Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX","US"],"is_corresponding":false,"raw_author_name":"Chuck Hawkins","raw_affiliation_strings":["Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","ECE Department, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"ECE Department, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","MX"],"is_corresponding":false,"raw_author_name":"Jaume Segura","raw_affiliation_strings":["Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","University of Balearic Islands, Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Optics and Electronics-INAOE, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"University of Balearic Islands, Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8828,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77754082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"57","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9623444676399231},{"id":"https://openalex.org/keywords/void","display_name":"Void (composites)","score":0.7634449005126953},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7401328682899475},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6978380084037781},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5192127823829651},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.48667222261428833},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4222147464752197},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41894158720970154},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.362492173910141},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2781566381454468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22211217880249023},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1118970513343811},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08569863438606262},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.06650117039680481}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9623444676399231},{"id":"https://openalex.org/C2779772531","wikidata":"https://www.wikidata.org/wiki/Q19689164","display_name":"Void (composites)","level":2,"score":0.7634449005126953},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7401328682899475},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6978380084037781},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5192127823829651},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48667222261428833},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4222147464752197},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41894158720970154},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.362492173910141},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2781566381454468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22211217880249023},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1118970513343811},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08569863438606262},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.06650117039680481},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2010.5550366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2010.5550366","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th Latin American Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W164528542","https://openalex.org/W1953858171","https://openalex.org/W1958909498","https://openalex.org/W1967835630","https://openalex.org/W1990215011","https://openalex.org/W2001376457","https://openalex.org/W2058477461","https://openalex.org/W2080274421","https://openalex.org/W2085775690","https://openalex.org/W2093071028","https://openalex.org/W2096240822","https://openalex.org/W2098171066","https://openalex.org/W2119474679","https://openalex.org/W2129212061","https://openalex.org/W2132643932","https://openalex.org/W2139653724","https://openalex.org/W2149424544","https://openalex.org/W2160744864","https://openalex.org/W2168578526","https://openalex.org/W2169294720","https://openalex.org/W3111786897","https://openalex.org/W4234217119","https://openalex.org/W6640984452","https://openalex.org/W6674337955","https://openalex.org/W6681986525"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2048644706","https://openalex.org/W2536001652","https://openalex.org/W2261565770","https://openalex.org/W1990187088","https://openalex.org/W2049675513","https://openalex.org/W1980919623","https://openalex.org/W2014531290"],"abstract_inverted_index":{"Vias-open":[0],"defects":[1],"are":[2],"one":[3],"of":[4,49],"the":[5,21,50,58],"dominant":[6],"failures":[7],"in":[8,34,37],"modern":[9],"nanometer":[10],"technologies":[11],"and":[12,66],"may":[13],"pose":[14],"a":[15,54],"reliability":[16,22],"issue.":[17],"In":[18],"this":[19],"paper,":[20],"electromigration":[23,65],"risk":[24],"posed":[25],"by":[26],"undetected":[27],"small":[28],"delays":[29],"due":[30],"to":[31,45],"resistive":[32],"opens":[33],"vias":[35,76],"located":[36],"signal":[38],"paths":[39],"is":[40,61,77],"quantified.":[41],"The":[42],"Mean":[43],"Time":[44],"Failure":[46],"as":[47],"function":[48],"void":[51],"size,":[52],"using":[53],"cylinder":[55],"model":[56],"for":[57],"defective":[59],"via,":[60],"estimated.":[62],"Both":[63],"effects,":[64],"self":[67],"heating,":[68],"have":[69],"been":[70],"considered.":[71],"Reliability":[72],"analysis":[73],"considering":[74],"redundant":[75],"also":[78],"presented.":[79]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}