{"id":"https://openalex.org/W2168265936","doi":"https://doi.org/10.1109/latw.2010.5550342","title":"BICS-based March test for resistive-open defect detection in SRAMs","display_name":"BICS-based March test for resistive-open defect detection in SRAMs","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2168265936","doi":"https://doi.org/10.1109/latw.2010.5550342","mag":"2168265936"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2010.5550342","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2010.5550342","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th Latin American Test Workshop","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043724751","display_name":"Raul Chipana","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"R. Chipana","raw_affiliation_strings":["Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008111838","display_name":"L. Bolzani","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"L. Bolzani","raw_affiliation_strings":["Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F. Vargas","raw_affiliation_strings":["Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I45643870"],"apc_list":null,"apc_paid":null,"fwci":0.4451,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63621901,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6393163204193115},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6225883960723877},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5681696534156799},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5405510663986206},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5070257186889648},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5005543231964111},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4851975739002228},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4797850251197815},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.472533255815506},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.4681572914123535},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4660336375236511},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44639572501182556},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.43172410130500793},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3635272979736328},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3403156101703644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2772957980632782},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2631418704986572},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2079392969608307},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19386222958564758},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14950311183929443}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6393163204193115},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6225883960723877},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5681696534156799},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5405510663986206},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5070257186889648},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5005543231964111},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4851975739002228},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4797850251197815},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.472533255815506},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.4681572914123535},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4660336375236511},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44639572501182556},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.43172410130500793},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3635272979736328},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3403156101703644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2772957980632782},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2631418704986572},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2079392969608307},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19386222958564758},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14950311183929443},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2010.5550342","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2010.5550342","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th Latin American Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1604482631","https://openalex.org/W1637395447","https://openalex.org/W1902843222","https://openalex.org/W1958909498","https://openalex.org/W2042615416","https://openalex.org/W2059638984","https://openalex.org/W2106201402","https://openalex.org/W2115729533","https://openalex.org/W2121938580","https://openalex.org/W2133690084","https://openalex.org/W2144688177","https://openalex.org/W2160101449","https://openalex.org/W2163493261","https://openalex.org/W2464905271"],"related_works":["https://openalex.org/W1909296377","https://openalex.org/W2089002058","https://openalex.org/W3185029353","https://openalex.org/W2969498307","https://openalex.org/W3116379964","https://openalex.org/W2915176329","https://openalex.org/W2793465010","https://openalex.org/W2208608937","https://openalex.org/W2120018824","https://openalex.org/W2766443086"],"abstract_inverted_index":{"Nowadays,":[0],"embedded":[1],"Static":[2],"Random":[3],"Memories":[4],"(SRAMs)":[5],"can":[6],"occupy":[7],"a":[8],"significant":[9],"portion":[10],"of":[11,18,20],"the":[12,40,48,56,86],"chip":[13],"area":[14],"and":[15,92],"contain":[16],"hundreds":[17],"millions":[19],"transistors.":[21],"Due":[22],"to":[23,37,58,71,76],"technology":[24],"scaling,":[25],"functional":[26],"fault":[27],"models":[28],"traditionally":[29],"applied":[30],"in":[31,64],"SRAMs'":[32],"testing":[33],"have":[34],"become":[35],"insufficient":[36],"correctly":[38],"reproduce":[39],"effects":[41],"caused":[42],"by":[43],"some":[44],"defects":[45],"generated":[46],"during":[47],"manufacturing":[49],"process.":[50],"In":[51],"this":[52],"paper,":[53],"we":[54],"investigate":[55],"possibility":[57],"use":[59],"Built-In":[60],"Current":[61],"Sensors":[62],"(BICSs)":[63],"combination":[65],"with":[66],"an":[67],"optimized":[68],"March":[69],"algorithm":[70],"detect":[72],"static":[73],"faults":[74],"associated":[75],"resistive-open":[77],"defects.":[78],"Experimental":[79],"results":[80],"obtained":[81],"throughout":[82],"electrical":[83],"simulations":[84],"validate":[85],"proposed":[87],"technique":[88],"demonstrating":[89],"its":[90],"viability":[91],"effectiveness.":[93]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}