{"id":"https://openalex.org/W2145903110","doi":"https://doi.org/10.1109/latw.2009.4813818","title":"A modern look at the CMOS stuck-open fault","display_name":"A modern look at the CMOS stuck-open fault","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2145903110","doi":"https://doi.org/10.1109/latw.2009.4813818","mag":"2145903110"},"language":"en","primary_location":{"id":"doi:10.1109/latw.2009.4813818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2009.4813818","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th Latin American Test Workshop","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091448624","display_name":"Roberto G\u00f2mez-Espina","orcid":"https://orcid.org/0000-0002-5577-1692"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Roberto Gomez","raw_affiliation_strings":["Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112856494","display_name":"Chuck Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX","US"],"is_corresponding":false,"raw_author_name":"Chuck Hawkins","raw_affiliation_strings":["Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","ECE Department, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"ECE Department, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","MX"],"is_corresponding":false,"raw_author_name":"Jaume Segura","raw_affiliation_strings":["Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","University of Balearic Islands, Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Electronic Engineering, National Institute for Astrophysics Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"University of Balearic Islands, Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"24","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8255265951156616},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5738292932510376},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5527575612068176},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.49798107147216797},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.485491544008255},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4570664167404175},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45586562156677246},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4304133951663971},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.43020862340927124},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.4192991554737091},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3523105978965759},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3444240689277649},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3298977315425873},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05908980965614319}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8255265951156616},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5738292932510376},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5527575612068176},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.49798107147216797},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.485491544008255},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4570664167404175},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45586562156677246},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4304133951663971},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.43020862340927124},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.4192991554737091},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3523105978965759},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3444240689277649},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3298977315425873},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05908980965614319},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latw.2009.4813818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latw.2009.4813818","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th Latin American Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W270615609","https://openalex.org/W1637395447","https://openalex.org/W1661368752","https://openalex.org/W1913711070","https://openalex.org/W2022955917","https://openalex.org/W2046817879","https://openalex.org/W2069410692","https://openalex.org/W2131862714","https://openalex.org/W2135107374","https://openalex.org/W2138536155","https://openalex.org/W2139164696","https://openalex.org/W2143643276","https://openalex.org/W2154941994","https://openalex.org/W2157058323","https://openalex.org/W2159301721","https://openalex.org/W6656250223","https://openalex.org/W6679839938"],"related_works":["https://openalex.org/W295681459","https://openalex.org/W2183492790","https://openalex.org/W2538904067","https://openalex.org/W2169757786","https://openalex.org/W2164489324","https://openalex.org/W4285494435","https://openalex.org/W855434851","https://openalex.org/W2105559143","https://openalex.org/W1602401178","https://openalex.org/W2102147100"],"abstract_inverted_index":{"The":[0],"stuck-open":[1],"fault":[2],"(SOF)":[3],"is":[4,55],"a":[5,18,42],"difficult,":[6],"hard":[7],"failure":[8,53],"mechanism":[9,54],"unique":[10],"to":[11,58],"CMOS":[12],"technology":[13],"[1-3].":[14],"Its":[15],"detection":[16],"requires":[17],"specific":[19],"2-vector":[20],"pair":[21],"that":[22,49],"examines":[23],"each":[24],"transistor":[25],"in":[26,34,63],"the":[27,68],"logic":[28],"gate":[29],"for":[30],"an":[31],"open":[32],"defect":[33,40],"its":[35],"drain":[36],"and/or":[37],"source.":[38],"This":[39],"defies":[41],"guaranteed":[43],"100%":[44],"detection.":[45],"We":[46],"will":[47],"show":[48],"this":[50,71],"mostly":[51],"discarded":[52],"very":[56],"relevant":[57],"modern":[59],"ICs.":[60],"Current":[61],"leakage":[62],"nanoscale":[64],"technologies":[65],"influence":[66],"significantly":[67],"behavior":[69],"of":[70],"fault.":[72]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}