{"id":"https://openalex.org/W7154691090","doi":"https://doi.org/10.1109/lats70329.2026.11480385","title":"Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA Under Proton Irradiation","display_name":"Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA Under Proton Irradiation","publication_year":2026,"publication_date":"2026-03-17","ids":{"openalex":"https://openalex.org/W7154691090","doi":"https://doi.org/10.1109/lats70329.2026.11480385"},"language":null,"primary_location":{"id":"doi:10.1109/lats70329.2026.11480385","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats70329.2026.11480385","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016727541","display_name":"Wesley Grignani","orcid":"https://orcid.org/0000-0003-4865-9333"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Wesley Grignani","raw_affiliation_strings":["IES, University of Montpellier, CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IES, University of Montpellier, CNRS,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045486535","display_name":"Douglas A. Santos","orcid":"https://orcid.org/0000-0002-6502-4682"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Douglas A. Santos","raw_affiliation_strings":["IES, University of Montpellier, CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IES, University of Montpellier, CNRS,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5133896801","display_name":"Carolina Imianosky","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Carolina Imianosky","raw_affiliation_strings":["IES, University of Montpellier, CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IES, University of Montpellier, CNRS,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5133841563","display_name":"Douglas R. Melo","orcid":null},"institutions":[{"id":"https://openalex.org/I165476936","display_name":"Vale (Brazil)","ror":"https://ror.org/05a99n355","country_code":"BR","type":"company","lineage":["https://openalex.org/I165476936"]},{"id":"https://openalex.org/I4210144729","display_name":"Universidade do Vale do Itaja\u00ed","ror":"https://ror.org/041pjwa23","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210144729"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Douglas R. Melo","raw_affiliation_strings":["LEDS, University of Vale do Itajaí,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LEDS, University of Vale do Itajaí,Brazil","institution_ids":["https://openalex.org/I165476936","https://openalex.org/I4210144729"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032628049","display_name":"F. Wrobel","orcid":"https://orcid.org/0000-0002-2437-1223"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fr\u00e9d\u00e9ric Wrobel","raw_affiliation_strings":["IES, University of Montpellier, CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IES, University of Montpellier, CNRS,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5133850807","display_name":"Luigi Dilillo","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dilillo","raw_affiliation_strings":["IES, University of Montpellier, CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IES, University of Montpellier, CNRS,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33821102,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.5824000239372253},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5030999779701233},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.49630001187324524},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.43320000171661377},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.31049999594688416}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6136999726295471},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5824000239372253},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5030999779701233},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.49630001187324524},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49160000681877136},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.43320000171661377},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.31049999594688416},{"id":"https://openalex.org/C3017806408","wikidata":"https://www.wikidata.org/wiki/Q92772955","display_name":"Gamma irradiation","level":3,"score":0.24879999458789825},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.24220000207424164},{"id":"https://openalex.org/C2987992536","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation tolerance","level":3,"score":0.23999999463558197}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats70329.2026.11480385","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats70329.2026.11480385","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1700810043","display_name":null,"funder_award_id":"101008126","funder_id":"https://openalex.org/F3582641945","funder_display_name":"Universit\u00e9 Paul-Val\u00e9ry Montpellier 3"},{"id":"https://openalex.org/G3759997991","display_name":null,"funder_award_id":"2023TR000880,2024TR001897,2025TR001565","funder_id":"https://openalex.org/F4320323349","funder_display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa e Inova\u00e7\u00e3o do Estado de Santa Catarina"}],"funders":[{"id":"https://openalex.org/F3582641945","display_name":"Universit\u00e9 Paul-Val\u00e9ry Montpellier 3","ror":null},{"id":"https://openalex.org/F4320323349","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa e Inova\u00e7\u00e3o do Estado de Santa Catarina","ror":"https://ror.org/0503xdx77"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W220440441","https://openalex.org/W2332323252","https://openalex.org/W2742505427","https://openalex.org/W3023961462","https://openalex.org/W3026432130","https://openalex.org/W3129345300","https://openalex.org/W3146456515","https://openalex.org/W3209703278","https://openalex.org/W4379517792","https://openalex.org/W4381304562","https://openalex.org/W4388674540","https://openalex.org/W4391342310","https://openalex.org/W4402811376","https://openalex.org/W4416725252"],"related_works":[],"abstract_inverted_index":{"Radiation-induced":[0],"faults":[1],"pose":[2],"significant":[3],"challenges":[4],"for":[5,84,143],"safety-critical":[6],"systems":[7],"operating":[8],"in":[9,30],"harsh":[10],"environments":[11],"such":[12,54],"as":[13,55],"space":[14],"and":[15,27,37,60,103,130,145],"avionics.":[16],"Among":[17],"these":[18],"effects,":[19],"Single-Event":[20],"Upsets":[21],"(SEUs)":[22],"can":[23],"affect":[24],"both":[25,99],"logic":[26],"configuration":[28,106],"memories":[29],"SRAM-based":[31,140],"FPGAs,":[32],"potentially":[33],"compromising":[34],"system":[35,72],"functionality":[36],"reliability.":[38],"The":[39,111],"Hardened":[40],"RISC-V":[41],"System-on-Chip":[42],"(HARV-SoC)":[43],"incorporates":[44],"a":[45,79],"fault-tolerant":[46],"soft-core":[47],"processor":[48,101],"designed":[49],"with":[50,66],"in-circuit":[51],"hardening":[52],"techniques":[53],"Triple":[56],"Modular":[57],"Redundancy":[58],"(TMR)":[59],"Hamming":[61],"Error-Correcting":[62],"Code":[63],"(ECC),":[64],"combined":[65],"structured":[67],"fault-observability":[68],"mechanisms":[69],"to":[70,94,108,121],"enhance":[71],"resilience":[73],"under":[74],"radiation.":[75],"This":[76],"work":[77],"presents":[78],"characterization":[80],"of":[81,98,125,139],"proton":[82,116],"irradiation":[83],"the":[85,96,100,104,123,137],"HARV-SoC":[86],"implemented":[87],"on":[88,127],"an":[89],"Xilinx":[90],"Artix-7":[91],"FPGA,":[92],"aiming":[93],"investigate":[95],"susceptibility":[97],"architecture":[102],"FPGA":[105,141],"memory":[107],"radiation-induced":[109],"faults.":[110],"experiments":[112],"were":[113],"conducted":[114],"using":[115],"beams":[117],"at":[118],"different":[119],"energies":[120],"assess":[122],"impact":[124],"radiation":[126],"functional":[128],"correctness":[129],"recovery":[131],"behavior,":[132],"thereby":[133],"providing":[134],"insights":[135],"into":[136],"reliability":[138],"platforms":[142],"space-grade":[144],"mission-critical":[146],"applications.":[147]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-04-18T00:00:00"}