{"id":"https://openalex.org/W7154708019","doi":"https://doi.org/10.1109/lats70329.2026.11480326","title":"Enhancing Fault Tolerance in Microblaze V Soft-Core Processors: Performance and Reliability Assessment with ESA Benchmark Applications","display_name":"Enhancing Fault Tolerance in Microblaze V Soft-Core Processors: Performance and Reliability Assessment with ESA Benchmark Applications","publication_year":2026,"publication_date":"2026-03-17","ids":{"openalex":"https://openalex.org/W7154708019","doi":"https://doi.org/10.1109/lats70329.2026.11480326"},"language":null,"primary_location":{"id":"doi:10.1109/lats70329.2026.11480326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats70329.2026.11480326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000352680","display_name":"Gabriel Camargo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gabriel Camargo","raw_affiliation_strings":["State University of Rio Grande do Sul (UERGS),Gua&#x00ED;ba,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State University of Rio Grande do Sul (UERGS),Gua&#x00ED;ba,Brazil","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069385208","display_name":"F\u00e1bio Benevenuti","orcid":"https://orcid.org/0000-0002-0996-9470"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fabio Benevenuti","raw_affiliation_strings":["Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046167370","display_name":"Jos\u00e9 Rodrigo Azambuja","orcid":"https://orcid.org/0000-0002-2627-5075"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jos\u00e9 Rodrigo Azambuja","raw_affiliation_strings":["Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5133847760","display_name":"Antonio Carlos Beck","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Antonio Carlos Beck","raw_affiliation_strings":["Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5125523733","display_name":"Fernanda Kastensmidt","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda Kastensmidt","raw_affiliation_strings":["Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul (UFRGS) - Institute of Informatics - PGMICRO - PPGC,Porto Alegre,Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.53081752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.21940000355243683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.21940000355243683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.15530000627040863,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.09350000321865082,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6735000014305115},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5910999774932861},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5268999934196472},{"id":"https://openalex.org/keywords/microblaze","display_name":"MicroBlaze","score":0.3662000000476837},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.30640000104904175},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.2996000051498413}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6735000014305115},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6223999857902527},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5910999774932861},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.536899983882904},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5268999934196472},{"id":"https://openalex.org/C2777575374","wikidata":"https://www.wikidata.org/wiki/Q1644704","display_name":"MicroBlaze","level":3,"score":0.3662000000476837},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32899999618530273},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.30640000104904175},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.2996000051498413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2937999963760376},{"id":"https://openalex.org/C2780080018","wikidata":"https://www.wikidata.org/wiki/Q2439233","display_name":"Tolerance analysis","level":2,"score":0.28780001401901245},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.27570000290870667},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.266400009393692},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.25540000200271606},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.2508000135421753}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats70329.2026.11480326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats70329.2026.11480326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1108991687","display_name":null,"funder_award_id":"N629092212014","funder_id":"https://openalex.org/F4320338298","funder_display_name":"Office of Naval Research Global"}],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"},{"id":"https://openalex.org/F4320322502","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado do Rio Grande do Sul","ror":"https://ror.org/05k49za97"},{"id":"https://openalex.org/F4320338298","display_name":"Office of Naval Research Global","ror":"https://ror.org/00rk2pe57"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2126240789","https://openalex.org/W2943396510","https://openalex.org/W3026432130","https://openalex.org/W3155846967","https://openalex.org/W4302577616","https://openalex.org/W4407449451","https://openalex.org/W4415250807"],"related_works":[],"abstract_inverted_index":{"RISC-V":[0,166],"processors":[1,168],"are":[2],"increasingly":[3],"considered":[4],"for":[5,16,164,169],"space":[6],"applications":[7,84],"due":[8],"to":[9,69,87],"their":[10,24],"open-source":[11],"nature,":[12],"configurability,":[13],"and":[14,35,148,160],"suitability":[15],"implementing":[17],"custom":[18],"fault-tolerant":[19],"designs.":[20],"To":[21],"better":[22],"characterize":[23],"behavior":[25],"in":[26,76,79,89],"space-relevant":[27],"scenarios,":[28],"this":[29],"paper":[30],"evaluates":[31],"both":[32],"the":[33,44,62,71,101,128,132,152],"performance":[34,147],"reliability":[36,99],"of":[37,56,73,103],"multiple":[38],"MicroBlaze":[39],"V":[40],"soft-core":[41,167],"configurations":[42,57],"using":[43,61],"European":[45],"Space":[46],"Agency's":[47],"OnBoard":[48],"Processing":[49],"Benchmark":[50],"(OBPMark)":[51],"applications.":[52],"A":[53],"selected":[54],"subset":[55],"was":[58,106],"additionally":[59],"hardened":[60],"Xilinx":[63],"Triple":[64],"Modular":[65],"Redundancy":[66],"(TMR)":[67],"IP":[68],"assess":[70],"effectiveness":[72],"architectural":[74],"redundancy":[75],"mitigating":[77],"faults":[78],"SRAM-based":[80],"FPGAs.":[81],"All":[82],"OBPMark":[83],"were":[85,124],"adapted":[86],"run":[88],"bare-metal":[90],"mode,":[91],"with":[92,135],"results":[93,150],"collected":[94],"via":[95],"serial":[96],"telemetry.":[97],"For":[98],"assessment,":[100],"workload":[102],"each":[104,110],"application":[105],"adjusted":[107],"so":[108],"that":[109],"execution":[111,143,155],"cycle":[112],"lasted":[113],"approximately":[114],"<tex":[115],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\mathbf{1":[117],"0":[118,119],"~":[120],"m":[121],"s}$</tex>.":[122],"Faults":[123],"then":[125],"injected":[126,141],"into":[127],"configuration":[129],"memory":[130],"through":[131],"ICAP":[133],"interface,":[134],"no":[136],"more":[137],"than":[138],"one":[139],"fault":[140],"per":[142],"cycle.":[144],"The":[145],"combined":[146],"fault-injection":[149],"highlight":[151],"trade-offs":[153],"between":[154],"speed,":[156],"FPGA":[157,171],"resource":[158],"usage,":[159],"robustness,":[161],"offering":[162],"guidance":[163],"designing":[165],"space-grade":[170],"platforms.":[172]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-04-18T00:00:00"}