{"id":"https://openalex.org/W4409536482","doi":"https://doi.org/10.1109/lats65346.2025.10963937","title":"Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage","display_name":"Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage","publication_year":2025,"publication_date":"2025-03-11","ids":{"openalex":"https://openalex.org/W4409536482","doi":"https://doi.org/10.1109/lats65346.2025.10963937"},"language":"en","primary_location":{"id":"doi:10.1109/lats65346.2025.10963937","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats65346.2025.10963937","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 26th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003101843","display_name":"Hanieh Jafarzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hanieh Jafarzadeh","raw_affiliation_strings":["University of Stuttgart,Stuttgart,Germany,70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Stuttgart,Germany,70569","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["University of Stuttgart,Stuttgart,Germany,70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Stuttgart,Germany,70569","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hussam Amrouch","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["University of Stuttgart,Stuttgart,Germany,70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Stuttgart,Germany,70569","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sybille Hellebrand","raw_affiliation_strings":["Paderborn University,Paderborn,Germany,33098"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paderborn University,Paderborn,Germany,33098","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["University of Stuttgart,Stuttgart,Germany,70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Stuttgart,Germany,70569","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.5452,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.938593,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5686600208282471},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5427917838096619},{"id":"https://openalex.org/keywords/zero","display_name":"Zero (linguistics)","score":0.4537036120891571},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.44294309616088867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34981751441955566},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28432774543762207},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14338251948356628},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14238914847373962},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.1188763678073883},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.10987809300422668}],"concepts":[{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5686600208282471},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5427917838096619},{"id":"https://openalex.org/C2780813799","wikidata":"https://www.wikidata.org/wiki/Q3274237","display_name":"Zero (linguistics)","level":2,"score":0.4537036120891571},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.44294309616088867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34981751441955566},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28432774543762207},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14338251948356628},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14238914847373962},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1188763678073883},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.10987809300422668},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats65346.2025.10963937","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats65346.2025.10963937","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 26th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1902443706","https://openalex.org/W1966797259","https://openalex.org/W2011433929","https://openalex.org/W2016652708","https://openalex.org/W2067701383","https://openalex.org/W2069493778","https://openalex.org/W2100827158","https://openalex.org/W2103239558","https://openalex.org/W2115908547","https://openalex.org/W2153126169","https://openalex.org/W2153171864","https://openalex.org/W2164374928","https://openalex.org/W2511040012","https://openalex.org/W2587047169","https://openalex.org/W2800676352","https://openalex.org/W2945263848","https://openalex.org/W3024722044","https://openalex.org/W3128050662","https://openalex.org/W3184463132","https://openalex.org/W4206779653","https://openalex.org/W4230343699","https://openalex.org/W4294719507","https://openalex.org/W4319663023","https://openalex.org/W4379116133","https://openalex.org/W4390098696","https://openalex.org/W4399146721","https://openalex.org/W4400034076","https://openalex.org/W4404848977","https://openalex.org/W6607990715"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Safety-critical":[0],"automotive":[1,29],"systems":[2],"require":[3],"on-chip":[4],"testing":[5],"methods":[6],"to":[7,24],"ensure":[8],"high":[9],"fault":[10,154],"coverage":[11,155],"and":[12,44,48,73,130,133],"reliable":[13],"operation.":[14,142],"Periodic":[15],"Deterministic":[16],"Logic":[17],"Built-In":[18],"Self-Test":[19],"(DL-BIST)":[20],"is":[21,115],"often":[22],"used":[23],"meet":[25],"these":[26,53],"demands.":[27],"For":[28],"applications,":[30],"DLBIST":[31,67,122,174],"must":[32],"operate":[33],"reliably":[34],"despite":[35],"temperature":[36,54,86],"variations,":[37],"including":[38],"those":[39],"caused":[40],"by":[41],"ambient":[42],"changes":[43],"self-heating":[45],"in":[46,140],"FinFET":[47,72],"Gate-All-Around":[49],"(GAA)":[50],"transistors.":[51],"Managing":[52],"effects":[55],"typically":[56],"requires":[57],"a":[58,102,120,175],"large":[59],"volume":[60],"of":[61],"test":[62],"patterns,":[63],"which":[64,124],"can":[65],"make":[66],"impractical.":[68],"Advanced":[69],"transistors":[70],"like":[71],"GAA":[74],"exhibit":[75],"Temperature":[76,109],"Effect":[77],"Inversion":[78],"(TEI),":[79],"where":[80],"the":[81,107,134,149,163],"circuit":[82],"speed":[83],"increases":[84],"with":[85],"at":[87,94,101,148,168],"certain":[88],"supply":[89],"voltages,":[90],"although":[91],"TEI":[92],"disappears":[93],"higher":[95,153],"voltages.":[96],"Research":[97],"has":[98],"shown":[99],"that":[100,145],"specific":[103],"optimal":[104,135],"voltage,":[105,112],"called":[106],"Zero":[108],"Coefficient":[110],"(ZTC)":[111],"temperature-induced":[113],"variability":[114],"minimized.":[116],"This":[117,171],"paper":[118],"proposes":[119],"robust":[121],"scheme":[123],"applies":[125],"multiple":[126],"voltages":[127],"during":[128,137],"power-on":[129],"power-off":[131],"tests":[132,139,147],"voltage":[136,151],"periodic":[138,173],"system":[141],"Simulations":[143],"show":[144],"generating":[146],"ZTC":[150],"achieves":[152],"for":[156,178],"Small":[157],"Delay":[158],"Faults":[159],"while":[160],"significantly":[161],"reducing":[162],"Test":[164],"Application":[165],"Time":[166],"(TAT)":[167],"this":[169],"voltage.":[170],"makes":[172],"feasible":[176],"solution":[177],"in-field":[179],"self-testing.":[180]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}