{"id":"https://openalex.org/W4399146718","doi":"https://doi.org/10.1109/lats62223.2024.10534625","title":"Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor","display_name":"Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor","publication_year":2024,"publication_date":"2024-04-09","ids":{"openalex":"https://openalex.org/W4399146718","doi":"https://doi.org/10.1109/lats62223.2024.10534625"},"language":"en","primary_location":{"id":"doi:10.1109/lats62223.2024.10534625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009959094","display_name":"Rizwan Tariq Syed","orcid":"https://orcid.org/0000-0001-9232-734X"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Rizwan Tariq Syed","raw_affiliation_strings":["IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Fabian Luis Vargas","raw_affiliation_strings":["IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039322577","display_name":"Marko Andjelkovi\u0107","orcid":"https://orcid.org/0000-0001-6419-2062"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marko Andjelkovic","raw_affiliation_strings":["IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063940342","display_name":"Markus Ulbricht","orcid":"https://orcid.org/0000-0001-9230-640X"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Markus Ulbricht","raw_affiliation_strings":["IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5009959094"],"corresponding_institution_ids":["https://openalex.org/I96578850"],"apc_list":null,"apc_paid":null,"fwci":0.5757,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65411801,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.7765198349952698},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6661834120750427},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.6056213974952698},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5936976075172424},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5728373527526855},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.49313491582870483},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3613128066062927},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2873229682445526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2064281404018402},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1299227476119995},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.0991363525390625}],"concepts":[{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.7765198349952698},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6661834120750427},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.6056213974952698},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5936976075172424},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5728373527526855},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.49313491582870483},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3613128066062927},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2873229682445526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2064281404018402},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1299227476119995},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0991363525390625},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats62223.2024.10534625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.5199999809265137}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321408","display_name":"Ministry of Education","ror":"https://ror.org/01p262204"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W2011977288","https://openalex.org/W2027252492","https://openalex.org/W2053346678","https://openalex.org/W2078871390","https://openalex.org/W2094981849","https://openalex.org/W2146743319","https://openalex.org/W2170058139","https://openalex.org/W2342824154","https://openalex.org/W2389387540","https://openalex.org/W2568357488","https://openalex.org/W2607924737","https://openalex.org/W2789876780","https://openalex.org/W2789894957","https://openalex.org/W2975936067","https://openalex.org/W2981805386","https://openalex.org/W2982352387","https://openalex.org/W3043608965","https://openalex.org/W3047722408","https://openalex.org/W3095711704","https://openalex.org/W3128389908","https://openalex.org/W3206889882","https://openalex.org/W3209192379","https://openalex.org/W4211116224","https://openalex.org/W4283703485","https://openalex.org/W4285038348","https://openalex.org/W4319865680","https://openalex.org/W4381612599","https://openalex.org/W6781356020","https://openalex.org/W6839213371"],"related_works":["https://openalex.org/W1906576859","https://openalex.org/W2065289416","https://openalex.org/W2502691491","https://openalex.org/W2017236304","https://openalex.org/W3142211975","https://openalex.org/W2136854845","https://openalex.org/W1879443270","https://openalex.org/W2018912978","https://openalex.org/W2130914040","https://openalex.org/W2119122672"],"abstract_inverted_index":{"Convolutional":[0],"Neural":[1],"Networks":[2],"(CNNs)":[3],"have":[4],"found":[5],"a":[6,47,73,95,129,160,173,194],"wide":[7],"range":[8],"of":[9,46,52,84,94,168,178,199],"applications":[10],"beyond":[11],"conventional":[12],"image":[13],"processing,":[14],"penetrating":[15],"safety-critical":[16],"domains":[17],"such":[18],"as":[19],"automotive,":[20],"medical,":[21],"and":[22,55,112,147,186],"space":[23],"applications.":[24],"This":[25,116,189],"indicates":[26],"that":[27,165],"the":[28,44,65,70,82,85,92,126,150,166,169,179,197],"demand":[29],"for":[30,196],"adaptable/reconfigurable":[31],"hardware":[32,87],"combined":[33],"with":[34,149],"reliable":[35],"operation":[36],"becomes":[37],"imperative.":[38],"In":[39,67],"this":[40,68],"paper,":[41],"we":[42,90],"propose":[43],"use":[45],"multipurpose":[48],"on-chip":[49,170],"sensor":[50,71,127,144,171],"capable":[51],"detecting":[53],"aging":[54],"soft":[56],"errors":[57],"in":[58,107,128,176],"order":[59],"to":[60,124,135,138,192],"enable":[61],"CNN":[62,86,97,131,151,180],"reconfigurability":[63],"during":[64],"runtime.":[66],"scenario,":[69],"plays":[72],"pivotal":[74],"role":[75],"by":[76],"providing":[77],"in-field":[78],"real-time":[79],"intelligence":[80],"on":[81,100,159],"health":[83],"accelerator.":[88],"Moreover,":[89],"introduce":[91],"concept":[93],"reconfigurable":[96,130,201],"accelerator":[98,152],"based":[99,158],"shared":[101],"layers":[102],"methodology,":[103],"which":[104],"can":[105],"operate":[106],"fault-tolerant":[108],"(FT),":[109],"high-performance":[110],"(HP),":[111],"de-stress":[113],"(DS)":[114],"modes.":[115],"study":[117,190],"further":[118],"delves":[119],"into":[120],"an":[121],"architectural":[122],"modification":[123],"integrate":[125],"accelerator,":[132],"enabling":[133],"it":[134],"adjust":[136],"dynamically":[137],"changing":[139],"AI":[140,202],"workload":[141],"needs.":[142],"The":[143],"working":[145],"principle":[146],"integration":[148,167],"architecture":[153],"are":[154],"discussed.":[155],"Experimental":[156],"results":[157],"commercial":[161],"FPGA":[162],"implementation":[163],"demonstrate":[164],"yields":[172],"negligible":[174],"penalty":[175],"terms":[177],"accelerator\u2019s":[181],"area":[182],"overhead,":[183],"power":[184],"consumption,":[185],"response":[187],"latency.":[188],"aims":[191],"establish":[193],"foundation":[195],"development":[198],"fully":[200],"processing":[203],"systems.":[204]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-05-21T09:19:25.381259","created_date":"2025-10-10T00:00:00"}