{"id":"https://openalex.org/W4399108499","doi":"https://doi.org/10.1109/lats62223.2024.10534595","title":"A Micro Architectural Events Aware Real-Time Embedded System Fault Injector","display_name":"A Micro Architectural Events Aware Real-Time Embedded System Fault Injector","publication_year":2024,"publication_date":"2024-04-09","ids":{"openalex":"https://openalex.org/W4399108499","doi":"https://doi.org/10.1109/lats62223.2024.10534595"},"language":"en","primary_location":{"id":"doi:10.1109/lats62223.2024.10534595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006409698","display_name":"Enrico Magliano","orcid":"https://orcid.org/0009-0007-4089-1142"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Enrico Magliano","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018833380","display_name":"Alessio Carpegna","orcid":"https://orcid.org/0000-0003-2233-4485"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessio Carpegna","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102605947","display_name":"Alessadro Savino","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessadro Savino","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026593274","display_name":"Stefano Di Carlo","orcid":"https://orcid.org/0000-0002-7512-5356"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Di Carlo","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering(DAUIN),Turin,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering(DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006409698"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.6659,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6793651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8064906597137451},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.721237063407898},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6538408398628235},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5519044399261475},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5321109890937805},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5097543597221375},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4365652799606323},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.4141181707382202},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37348031997680664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35091865062713623},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3205071985721588},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2325422465801239},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.17124179005622864}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8064906597137451},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.721237063407898},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6538408398628235},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5519044399261475},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5321109890937805},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5097543597221375},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4365652799606323},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.4141181707382202},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37348031997680664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35091865062713623},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3205071985721588},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2325422465801239},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.17124179005622864},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats62223.2024.10534595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1570817582","https://openalex.org/W1600258832","https://openalex.org/W2062132293","https://openalex.org/W2068092644","https://openalex.org/W2079267582","https://openalex.org/W2098473740","https://openalex.org/W2118033476","https://openalex.org/W2134640591","https://openalex.org/W2135254996","https://openalex.org/W2137526832","https://openalex.org/W2158287342","https://openalex.org/W2166097230","https://openalex.org/W2904417098","https://openalex.org/W2967526496","https://openalex.org/W3106556803","https://openalex.org/W3171478113","https://openalex.org/W3183835343","https://openalex.org/W3214360577","https://openalex.org/W4226179515","https://openalex.org/W4232751114","https://openalex.org/W4244652158","https://openalex.org/W4287849810","https://openalex.org/W4384009478","https://openalex.org/W6601285945","https://openalex.org/W6634358307"],"related_works":["https://openalex.org/W1589297475","https://openalex.org/W2330706584","https://openalex.org/W2903497870","https://openalex.org/W4398196867","https://openalex.org/W4389401673","https://openalex.org/W1987259072","https://openalex.org/W347335328","https://openalex.org/W2164976164","https://openalex.org/W2351307308","https://openalex.org/W2368944417"],"abstract_inverted_index":{"In":[0],"contemporary":[1],"times,":[2],"the":[3,7,13,19,28,81,114,118,131,138,145,157,176,182],"increasing":[4],"complexity":[5],"of":[6,18,61,68,123,147,167,175,178],"system":[8,76,82],"poses":[9],"significant":[10],"challenges":[11],"to":[12,30,75,105,116],"reliability,":[14],"trustworthiness,":[15],"and":[16,41,58,121,137,163,185],"security":[17],"Safety-Critical":[20],"Real-Time":[21],"Embedded":[22],"Systems":[23],"(SACRES).":[24],"Key":[25],"issues":[26],"include":[27],"susceptibility":[29],"phenomena":[31],"such":[32,96],"as":[33],"instantaneous":[34],"voltage":[35],"spikes,":[36],"electromagnetic":[37],"interference,":[38],"neutron":[39],"strikes,":[40],"out-of-range":[42],"temperatures.":[43],"These":[44],"factors":[45],"can":[46,79,98],"induce":[47],"switch":[48],"state":[49],"changes":[50],"in":[51,54,64,71,88,181],"transistors,":[52],"resulting":[53],"bit-flipping,":[55],"soft":[56,69,179],"errors,":[57,70],"transient":[59],"corruption":[60],"stored":[62],"data":[63],"memory.":[65],"The":[66,150,165],"occurrence":[67],"turn,":[72],"may":[73],"lead":[74],"faults":[77],"that":[78],"propel":[80],"into":[83],"a":[84,109,172],"hazardous":[85],"state.":[86],"Particularly":[87],"critical":[89],"sectors":[90],"like":[91],"automotive,":[92],"avionics,":[93],"or":[94],"aerospace,":[95],"malfunctions":[97],"have":[99],"real-world":[100],"implications,":[101],"potentially":[102],"causing":[103],"harm":[104],"individuals.This":[106],"paper":[107],"introduces":[108],"fault":[110,148,151,169],"injector":[111],"designed":[112],"with":[113],"novelty":[115],"facilitate":[117],"monitoring,":[119],"aggregation,":[120],"examination":[122],"micro-architectural":[124],"events.":[125],"This":[126],"is":[127],"achieved":[128],"by":[129,189],"harnessing":[130],"microprocessor\u2019s":[132],"Performance":[133],"Monitoring":[134],"Unit":[135],"(PMU)":[136],"debugging":[139],"interface,":[140],"explicitly":[141],"focusing":[142],"on":[143],"ensuring":[144],"repeatability":[146],"injections.":[149],"injection":[152],"methodology":[153],"targets":[154],"bit-flipping":[155],"within":[156],"memory":[158],"system,":[159],"affecting":[160],"CPU":[161],"registers":[162],"RAM.":[164],"outcomes":[166],"these":[168],"injections":[170],"enable":[171],"thorough":[173],"analysis":[174],"impact":[177],"errors":[180],"final":[183],"output":[184],"timing":[186],"predictability":[187],"demanded":[188],"SACRES.":[190]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2024-05-29T00:00:00"}