{"id":"https://openalex.org/W4399146130","doi":"https://doi.org/10.1109/lats62223.2024.10534591","title":"Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA","display_name":"Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA","publication_year":2024,"publication_date":"2024-04-09","ids":{"openalex":"https://openalex.org/W4399146130","doi":"https://doi.org/10.1109/lats62223.2024.10534591"},"language":"en","primary_location":{"id":"doi:10.1109/lats62223.2024.10534591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534591","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081464172","display_name":"Victor O. Costa","orcid":"https://orcid.org/0000-0003-1345-2463"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Victor O. Costa","raw_affiliation_strings":["Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069385208","display_name":"F\u00e1bio Benevenuti","orcid":"https://orcid.org/0000-0002-0996-9470"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fabio Benevenuti","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brasil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014902958","display_name":"R. Julian Menezes","orcid":"https://orcid.org/0000-0001-8075-7027"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Renan Menezes","raw_affiliation_strings":["Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014326662","display_name":"Lidia Shibuya Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Lidia Shibuya Sato","raw_affiliation_strings":["Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004021544","display_name":"Luis Loures","orcid":null},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Luis Loures","raw_affiliation_strings":["Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnológico de Aeronáutica (ITA),São José dos Campos,Brasil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda L. Kastensmidt","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brasil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020082310","display_name":"N. Added","orcid":"https://orcid.org/0000-0001-9611-8721"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nemitala Added","raw_affiliation_strings":["Universidade de São Paulo (USP),São Paulo,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade de São Paulo (USP),São Paulo,Brasil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086377934","display_name":"Saulo G. Alberton","orcid":"https://orcid.org/0000-0002-7390-3660"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Saulo Alberton","raw_affiliation_strings":["Universidade de São Paulo (USP),São Paulo,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade de São Paulo (USP),São Paulo,Brasil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033616442","display_name":"Vitor A. P. Aguiar","orcid":"https://orcid.org/0000-0001-6199-0800"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vitor A. P. Aguiar","raw_affiliation_strings":["Universidade de São Paulo (USP),São Paulo,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade de São Paulo (USP),São Paulo,Brasil","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014016978","display_name":"N. H. Medina","orcid":"https://orcid.org/0000-0003-0650-6507"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nilberto H. Medina","raw_affiliation_strings":["Universidade de São Paulo (USP),São Paulo,Brasil"],"affiliations":[{"raw_affiliation_string":"Universidade de São Paulo (USP),São Paulo,Brasil","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5081464172"],"corresponding_institution_ids":["https://openalex.org/I107428990"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05333344,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/universal-asynchronous-receiver/transmitter","display_name":"Universal asynchronous receiver/transmitter","score":0.8692514896392822},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7527974843978882},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6740155220031738},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.593359649181366},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5842959880828857},{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.5816314816474915},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3181379437446594},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.13725465536117554},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.10828393697738647},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08186814188957214},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.05205196142196655}],"concepts":[{"id":"https://openalex.org/C161911788","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Universal asynchronous receiver/transmitter","level":3,"score":0.8692514896392822},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7527974843978882},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6740155220031738},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.593359649181366},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5842959880828857},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.5816314816474915},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3181379437446594},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.13725465536117554},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.10828393697738647},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08186814188957214},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.05205196142196655},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats62223.2024.10534591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats62223.2024.10534591","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 25th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1899511602","https://openalex.org/W2010287392","https://openalex.org/W2134917170","https://openalex.org/W2332395097","https://openalex.org/W2498844334","https://openalex.org/W2736666843","https://openalex.org/W3023500426","https://openalex.org/W3045774393","https://openalex.org/W3094988718","https://openalex.org/W3115723483","https://openalex.org/W3123585592","https://openalex.org/W4285789185","https://openalex.org/W6602137191","https://openalex.org/W6774197170","https://openalex.org/W7000297363"],"related_works":["https://openalex.org/W2373009277","https://openalex.org/W2359676351","https://openalex.org/W4361186892","https://openalex.org/W2355107020","https://openalex.org/W4223965863","https://openalex.org/W2971427270","https://openalex.org/W2048928752","https://openalex.org/W2362123793","https://openalex.org/W2357625763","https://openalex.org/W2351603220"],"abstract_inverted_index":{"This":[0],"study":[1],"explores":[2],"the":[3,33,49,72],"dependability":[4],"of":[5,8,74],"three":[6],"versions":[7],"a":[9,46,57],"UART":[10],"controller":[11],"integrated":[12],"into":[13,41],"an":[14],"SRAM-based":[15],"FPGA":[16,50],"developed":[17],"by":[18],"NanoXplore,":[19],"focusing":[20],"on":[21],"their":[22],"performance":[23],"under":[24],"single":[25],"event":[26],"effects.":[27],"The":[28,60],"objective":[29],"is":[30],"to":[31],"identify":[32],"most":[34],"robust":[35],"design":[36],"options":[37],"suitable":[38],"for":[39],"incorporation":[40],"small":[42],"satellite":[43],"projects.":[44],"Employing":[45],"dedicated":[47],"methodology,":[48],"underwent":[51],"irradiation":[52],"with":[53],"silicon":[54],"ions":[55],"at":[56],"particle":[58],"accelerator.":[59],"findings":[61],"indicate":[62],"that":[63],"designs":[64],"featuring":[65],"internal":[66],"queues":[67,81],"exhibit":[68],"lower":[69],"reliability":[70],"in":[71],"presence":[73],"radiation-induced":[75],"faults,":[76],"while":[77],"those":[78],"incorporating":[79],"EDAC-protected":[80],"mitigate":[82],"this":[83],"issue.":[84]},"counts_by_year":[],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-10-10T00:00:00"}