{"id":"https://openalex.org/W4381746676","doi":"https://doi.org/10.1109/lats58125.2023.10154490","title":"A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates","display_name":"A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates","publication_year":2023,"publication_date":"2023-03-21","ids":{"openalex":"https://openalex.org/W4381746676","doi":"https://doi.org/10.1109/lats58125.2023.10154490"},"language":"en","primary_location":{"id":"doi:10.1109/lats58125.2023.10154490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats58125.2023.10154490","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 24th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Victor Champac","raw_affiliation_strings":["National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035827251","display_name":"Freddy Forero","orcid":"https://orcid.org/0000-0001-9939-0974"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Freddy Forero","raw_affiliation_strings":["National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michel Renovell","raw_affiliation_strings":["Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM),France","Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM), France"],"affiliations":[{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM),France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM), France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017274715","display_name":"Leonardo Miceli","orcid":null},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Leonardo Miceli","raw_affiliation_strings":["National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics,Optics and Electronics (INAOE),Puebla,Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Optics and Electronics (INAOE), National Institute for Astrophysics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5038219219"],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":null,"apc_paid":null,"fwci":0.2674,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52418344,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.729751706123352},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.6170068383216858},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5631107091903687},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5319374203681946},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4550103545188904},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.45354902744293213},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.439873069524765},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4259076416492462},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38946807384490967},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34385019540786743},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29911237955093384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1718815565109253},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10502159595489502}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.729751706123352},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.6170068383216858},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5631107091903687},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5319374203681946},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4550103545188904},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.45354902744293213},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.439873069524765},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4259076416492462},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38946807384490967},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34385019540786743},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29911237955093384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1718815565109253},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10502159595489502},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats58125.2023.10154490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats58125.2023.10154490","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 24th Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2108167458","https://openalex.org/W2610849239","https://openalex.org/W2041608016","https://openalex.org/W2088504085","https://openalex.org/W2037642033","https://openalex.org/W2360388749","https://openalex.org/W1674491244","https://openalex.org/W2028881124","https://openalex.org/W2588941787"],"abstract_inverted_index":{"The":[0,97,129],"continuous":[1],"scaling":[2],"in":[3,37,65],"semiconductor":[4],"technolo-":[5],"gies":[6],"has":[7,17],"allowed":[8],"faster":[9],"devices":[10],"with":[11],"lower":[12],"power":[13],"consumption.":[14],"FinFET":[15,38],"technology":[16,39],"become":[18],"an":[19],"attractive":[20],"candidate":[21],"for":[22,116],"high-performance":[23],"and":[24,45,81,87,99,139],"power-efficient":[25],"applications.":[26],"This":[27,51],"paper":[28],"proposes":[29],"a":[30,61,93],"new":[31,52],"defect":[32,53,104,136,148],"model":[33],"that":[34,146],"could":[35],"occur":[36],"using":[40,107,137],"Self-Aligned":[41],"Double":[42],"Patterning":[43],"(SADP)":[44],"replacement":[46],"metal":[47],"gate":[48,76],"(RMG)":[49],"process.":[50],"was":[54],"found":[55],"by":[56,124],"analyzing":[57],"the":[58,66,83,88,103,117,135,147],"impact":[59],"of":[60,102],"single":[62,71],"dust":[63,72],"particle":[64,73],"manufacturing":[67],"process":[68],"flux.":[69],"A":[70,111],"disconnects":[74],"two":[75,84,89],"transistors":[77],"from":[78],"their":[79],"inputs,":[80],"both":[82],"disconnected":[85,90],"inputs":[86],"gates":[91],"have":[92],"zero-resistance":[94],"bridge":[95],"defect.":[96],"logic":[98],"delay":[100,140],"behavior":[101,113],"are":[105,143],"analyzed":[106],"SPICE":[108],"electrical":[109],"simulator.":[110],"unique":[112],"is":[114],"observed":[115],"defect,":[118],"whose":[119],"detection":[120],"can":[121],"be":[122],"missed":[123],"existing":[125],"test":[126,130,141,151],"generation":[127],"methodologies.":[128],"pattern":[131],"conditions":[132],"to":[133],"detect":[134],"boolean":[138],"techniques":[142],"determined,":[144],"showing":[145],"requires":[149],"specific":[150],"generation.":[152]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}