{"id":"https://openalex.org/W4313157144","doi":"https://doi.org/10.1109/lats57337.2022.9936940","title":"On BTI Aging Rejuvenation in Memory Address Decoders","display_name":"On BTI Aging Rejuvenation in Memory Address Decoders","publication_year":2022,"publication_date":"2022-09-05","ids":{"openalex":"https://openalex.org/W4313157144","doi":"https://doi.org/10.1109/lats57337.2022.9936940"},"language":"en","primary_location":{"id":"doi:10.1109/lats57337.2022.9936940","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats57337.2022.9936940","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 23rd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079668112","display_name":"Cemil Cem G\u00fcrsoy","orcid":"https://orcid.org/0000-0001-7529-9092"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Cemil Cem Gursoy","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021719030","display_name":"Dani\u00ebl Kraak","orcid":"https://orcid.org/0000-0001-6892-1859"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Daniel Kraak","raw_affiliation_strings":["Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055358541","display_name":"Foisal Ahmed","orcid":"https://orcid.org/0000-0001-8109-6929"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Foisal Ahmed","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mottaqiallah Taouil","raw_affiliation_strings":["Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia,19086","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Department of Quantum and Computer Engineering,Delft,The Netherlands,2628 CD","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6859087944030762},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5783407092094421},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.5282168388366699},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5025908946990967},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4713292419910431},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46442046761512756},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.44900450110435486},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.4285033643245697},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.42328086495399475},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42280298471450806},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32533174753189087},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2753467857837677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2105194330215454},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1619090735912323},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07797825336456299},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07796460390090942},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06644806265830994}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6859087944030762},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5783407092094421},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5282168388366699},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5025908946990967},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4713292419910431},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46442046761512756},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.44900450110435486},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.4285033643245697},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42328086495399475},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42280298471450806},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32533174753189087},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2753467857837677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2105194330215454},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1619090735912323},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07797825336456299},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07796460390090942},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06644806265830994},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/lats57337.2022.9936940","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats57337.2022.9936940","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 23rd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},{"id":"pmh:oai:tudelft.nl:uuid:e5121da2-ecb4-48a6-8671-2b152258bdde","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:e5121da2-ecb4-48a6-8671-2b152258bdde","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2750063476","display_name":"Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design","funder_award_id":"722325","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G8689881305","display_name":"CRASHLESS - Cross-Layer Reliability and Self-Health Awareness for Intelligent Autonomous Systems","funder_award_id":"PRG1467","funder_id":"https://openalex.org/F4320321090","funder_display_name":"Eesti Teadusagentuur"},{"id":"https://openalex.org/G900587751","display_name":null,"funder_award_id":"PUT PRG1467","funder_id":"https://openalex.org/F4320321090","funder_display_name":"Eesti Teadusagentuur"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320321090","display_name":"Eesti Teadusagentuur","ror":"https://ror.org/00jjeja18"},{"id":"https://openalex.org/F4320338080","display_name":"European Social Fund","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320338475","display_name":"H2020 LEIT Information and Communication Technologies","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1503396677","https://openalex.org/W1582724633","https://openalex.org/W1596163276","https://openalex.org/W1958909498","https://openalex.org/W2046796401","https://openalex.org/W2059193309","https://openalex.org/W2095823567","https://openalex.org/W2113115586","https://openalex.org/W2389387540","https://openalex.org/W2544896567","https://openalex.org/W2579352521","https://openalex.org/W2613010563","https://openalex.org/W2760037701","https://openalex.org/W2802502993","https://openalex.org/W2811152459","https://openalex.org/W2935281756","https://openalex.org/W2943604793","https://openalex.org/W2967902529","https://openalex.org/W4232751114","https://openalex.org/W4243422895","https://openalex.org/W4251213825"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W4401568740","https://openalex.org/W3148568549","https://openalex.org/W2098207691","https://openalex.org/W2000785801","https://openalex.org/W986318368","https://openalex.org/W1648516568","https://openalex.org/W2384410913","https://openalex.org/W361036515","https://openalex.org/W2269474412"],"abstract_inverted_index":{"Memory":[0],"designs":[1],"require":[2],"timing":[3],"margins":[4,23],"to":[5,51,77,80,101,111,129],"compensate":[6],"for":[7,38],"aging":[8,16,70,82],"and":[9,21,35,57],"fabrication":[10],"process":[11],"variations.":[12],"With":[13],"technology":[14],"downscaling,":[15],"mechanisms":[17],"became":[18],"more":[19],"apparent,":[20],"larger":[22,32],"are":[24,115],"considered":[25],"necessary.":[26],"This,":[27],"in":[28],"return,":[29],"means":[30],"a":[31,68,98,145],"area":[33],"requirement":[34],"lower":[36],"performance":[37],"the":[39,48,90,102,121,131],"memory.":[40,103],"Bias":[41],"Temperature":[42],"Instability":[43],"(BTI)":[44],"is":[45,108],"one":[46],"of":[47,120],"main":[49],"contributors":[50],"aging,":[52],"which":[53,73],"slows":[54],"down":[55],"transistors":[56,95,113],"ultimately":[58],"causes":[59],"permanent":[60],"faults.":[61],"In":[62],"this":[63],"paper,":[64],"first,":[65],"we":[66,125],"propose":[67],"low-cost":[69],"mitigation":[71,132],"scheme,":[72],"can":[74],"be":[75],"applied":[76],"existing":[78],"hardware":[79],"mitigate":[81,89],"on":[83,93,117],"memory":[84],"address":[85,122],"decoder":[86],"logic.":[87],"We":[88],"BTI":[91],"effect":[92],"critical":[94,118],"by":[96],"applying":[97],"rejuvenation":[99],"workload":[100,107],"Such":[104],"an":[105],"auxiliary":[106],"executed":[109],"periodically":[110],"rejuvenate":[112],"that":[114],"located":[116],"paths":[119],"decoder.":[123],"Second,":[124],"analyze":[126],"workloads'":[127],"efficiency":[128],"optimize":[130],"scheme.":[133],"Experimental":[134],"results":[135],"performed":[136],"with":[137,144],"realistic":[138],"benchmarks":[139],"demonstrate":[140],"several-times":[141],"lifetime":[142],"extension":[143],"negligible":[146],"execution":[147],"overhead.":[148]},"counts_by_year":[],"updated_date":"2026-07-20T07:56:41.581041","created_date":"2023-01-06T00:00:00"}