{"id":"https://openalex.org/W4200233947","doi":"https://doi.org/10.1109/lats53581.2021.9651760","title":"Comparing different solutions for testing resistive defects in low-power SRAMs","display_name":"Comparing different solutions for testing resistive defects in low-power SRAMs","publication_year":2021,"publication_date":"2021-10-27","ids":{"openalex":"https://openalex.org/W4200233947","doi":"https://doi.org/10.1109/lats53581.2021.9651760"},"language":"en","primary_location":{"id":"doi:10.1109/lats53581.2021.9651760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats53581.2021.9651760","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044194118","display_name":"Nunzio Mirabella","orcid":"https://orcid.org/0000-0003-2315-2552"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]},{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","CZ","IT"],"is_corresponding":false,"raw_author_name":"N. Mirabella","raw_affiliation_strings":["AMS R&D STMicroelectronics s.r.l., Catania, Italy","Politecnico di Torino, Torino, Italy","AMS R&#x0026","D STMicroelectronics s.r.l., Catania, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMS R&D STMicroelectronics s.r.l., Catania, Italy","institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"AMS R&#x0026","institution_ids":[]},{"raw_affiliation_string":"D STMicroelectronics s.r.l., Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020130217","display_name":"Matt Grosso","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"M. Grosso","raw_affiliation_strings":["AMS R&D STMicroelectronics s.r.l., Torino, Italy","AMS R&#x0026","D STMicroelectronics s.r.l., Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMS R&D STMicroelectronics s.r.l., Torino, Italy","institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"AMS R&#x0026","institution_ids":[]},{"raw_affiliation_string":"D STMicroelectronics s.r.l., Torino, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049807061","display_name":"Giovanna Antonella Franchino","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"G. Franchino","raw_affiliation_strings":["AMS R&D STMicroelectronics s.r.l., MB, Italy","D STMicroelectronics s.r.l., MB, Italy","AMS R&#x0026"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMS R&D STMicroelectronics s.r.l., MB, Italy","institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"D STMicroelectronics s.r.l., MB, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"AMS R&#x0026","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087084333","display_name":"Salvatore Rinaudo","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","CZ","IT"],"is_corresponding":false,"raw_author_name":"S. Rinaudo","raw_affiliation_strings":["AMS R&D STMicroelectronics s.r.l., Catania, Italy","D STMicroelectronics s.r.l., Catania, Italy","AMS R&#x0026"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMS R&D STMicroelectronics s.r.l., Catania, Italy","institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"D STMicroelectronics s.r.l., Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"AMS R&#x0026","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057499489","display_name":"Ioannis Deretzis","orcid":"https://orcid.org/0000-0001-7252-1831"},"institutions":[{"id":"https://openalex.org/I4210165120","display_name":"Institute for Microelectronics and Microsystems","ror":"https://ror.org/05vk2g845","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210155236","https://openalex.org/I4210165120"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"I. Deretzis","raw_affiliation_strings":["IMM-CNR, Catania, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMM-CNR, Catania, Italy","institution_ids":["https://openalex.org/I4210165120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080003216","display_name":"A. La Magna","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165120","display_name":"Institute for Microelectronics and Microsystems","ror":"https://ror.org/05vk2g845","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210155236","https://openalex.org/I4210165120"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. La Magna","raw_affiliation_strings":["IMM-CNR, Catania, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMM-CNR, Catania, Italy","institution_ids":["https://openalex.org/I4210165120"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.781836748123169},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.7454066872596741},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5155705809593201},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5137146711349487},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4577748477458954},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4308894872665405},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.4105483293533325},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40684980154037476},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25208204984664917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24238353967666626},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.15832555294036865},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08267292380332947},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07046833634376526},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.062038958072662354}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.781836748123169},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.7454066872596741},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5155705809593201},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5137146711349487},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4577748477458954},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4308894872665405},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.4105483293533325},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40684980154037476},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25208204984664917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24238353967666626},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15832555294036865},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08267292380332947},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07046833634376526},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.062038958072662354},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats53581.2021.9651760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats53581.2021.9651760","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W90534402","https://openalex.org/W1604482631","https://openalex.org/W1922040173","https://openalex.org/W1968645806","https://openalex.org/W2007506199","https://openalex.org/W2050259762","https://openalex.org/W2096607693","https://openalex.org/W2104166947","https://openalex.org/W2106935654","https://openalex.org/W2133690084","https://openalex.org/W2152890548","https://openalex.org/W2593537785","https://openalex.org/W2997286115","https://openalex.org/W3028401437","https://openalex.org/W3146456165","https://openalex.org/W4244759228","https://openalex.org/W7005742109"],"related_works":["https://openalex.org/W2054635671","https://openalex.org/W2545245183","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2078381924","https://openalex.org/W4298011929","https://openalex.org/W2626667124","https://openalex.org/W2004526657","https://openalex.org/W2199653281"],"abstract_inverted_index":{"Low-power":[0],"SRAM":[1],"architectures":[2],"are":[3],"especially":[4],"sensitive":[5],"to":[6,65],"many":[7],"types":[8,26],"of":[9,27,74],"defects":[10,19,29,68],"that":[11,30,45],"may":[12,31,46],"occur":[13],"during":[14],"manufacturing.":[15],"Among":[16],"these,":[17],"resistive":[18],"can":[20],"appear.":[21],"This":[22],"paper":[23],"analyzes":[24],"some":[25],"such":[28,57,67],"impair":[32],"the":[33,41],"device":[34],"functionalities":[35],"in":[36,72],"subtle":[37],"ways,":[38],"depending":[39],"on":[40],"defect":[42],"characteristics,":[43],"and":[44,69,76],"not":[47],"be":[48],"directly":[49],"or":[50],"easily":[51],"detectable":[52],"by":[53],"traditional":[54],"test":[55,66,77],"methods,":[56],"as":[58],"March":[59],"algorithms.":[60],"We":[61],"analyze":[62],"different":[63],"methods":[64],"discuss":[70],"them":[71],"terms":[73],"complexity":[75],"time.":[78]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-27T08:26:11.824852","created_date":"2025-10-10T00:00:00"}