{"id":"https://openalex.org/W3024297510","doi":"https://doi.org/10.1109/lats49555.2020.9093691","title":"Influence of sampling frequency on TID response of SAR ADCs","display_name":"Influence of sampling frequency on TID response of SAR ADCs","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W3024297510","doi":"https://doi.org/10.1109/lats49555.2020.9093691","mag":"3024297510"},"language":"en","primary_location":{"id":"doi:10.1109/lats49555.2020.9093691","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093691","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083610301","display_name":"Bruno L. Costa","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Bruno L. Costa","raw_affiliation_strings":["Electrical Engineering Department, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100711265","display_name":"Carlos J. Gonz\u00e1lez","orcid":"https://orcid.org/0000-0003-3399-7874"},"institutions":[{"id":"https://openalex.org/I4210129376","display_name":"Corporaci\u00f3n Unificada Nacional de Educaci\u00f3n Superior","ror":"https://ror.org/04axvmf19","country_code":"CO","type":"education","lineage":["https://openalex.org/I4210129376"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Carlos J. Gonzalez","raw_affiliation_strings":["Electronic Engineering Dep., Corporaci\u00f3n Unificada Nacional de Educaci\u00f3n Superior, Bogot\u00e1, Colombia"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Dep., Corporaci\u00f3n Unificada Nacional de Educaci\u00f3n Superior, Bogot\u00e1, Colombia","institution_ids":["https://openalex.org/I4210129376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026938022","display_name":"Rafael G. Vaz","orcid":"https://orcid.org/0000-0002-1456-6748"},"institutions":[{"id":"https://openalex.org/I4210123805","display_name":"Instituto de Aeron\u00e1utica e Espa\u00e7o","ror":"https://ror.org/025n1fp68","country_code":"BR","type":"other","lineage":["https://openalex.org/I4210123805"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Rafael G. Vaz","raw_affiliation_strings":["Aeronautics Science and Technology Dep., Institute for Advanced Studies, S\u00e3o Jos\u00e9 dos Campos, Brazil"],"affiliations":[{"raw_affiliation_string":"Aeronautics Science and Technology Dep., Institute for Advanced Studies, S\u00e3o Jos\u00e9 dos Campos, Brazil","institution_ids":["https://openalex.org/I4210123805"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010586917","display_name":"Odair L\u00e9lis Gon\u00e7alez","orcid":"https://orcid.org/0000-0003-3446-5159"},"institutions":[{"id":"https://openalex.org/I4210123805","display_name":"Instituto de Aeron\u00e1utica e Espa\u00e7o","ror":"https://ror.org/025n1fp68","country_code":"BR","type":"other","lineage":["https://openalex.org/I4210123805"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Odair L. Goncalez","raw_affiliation_strings":["Aeronautics Science and Technology Dep., Institute for Advanced Studies, S\u00e3o Jos\u00e9 dos Campos, Brazil"],"affiliations":[{"raw_affiliation_string":"Aeronautics Science and Technology Dep., Institute for Advanced Studies, S\u00e3o Jos\u00e9 dos Campos, Brazil","institution_ids":["https://openalex.org/I4210123805"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042649608","display_name":"Tiago R. Balen","orcid":"https://orcid.org/0000-0001-9641-300X"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Tiago R. Balen","raw_affiliation_strings":["Graduate Program on Microelectronics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5083610301"],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.1027,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4052805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8480492830276489},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.8167935609817505},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6842619180679321},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6394544243812561},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.633184552192688},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6012581586837769},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46374377608299255},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.430575430393219},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4280615448951721},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.42364734411239624},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.415929913520813},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2967662811279297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.253196656703949},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22553503513336182},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.20100760459899902},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19535019993782043},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.09556761384010315}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8480492830276489},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.8167935609817505},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6842619180679321},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6394544243812561},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.633184552192688},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6012581586837769},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46374377608299255},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.430575430393219},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4280615448951721},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.42364734411239624},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.415929913520813},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2967662811279297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.253196656703949},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22553503513336182},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.20100760459899902},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19535019993782043},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.09556761384010315},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats49555.2020.9093691","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093691","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.47999998927116394,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W77521556","https://openalex.org/W1416418966","https://openalex.org/W2020846551","https://openalex.org/W2035112049","https://openalex.org/W2053330176","https://openalex.org/W2081551815","https://openalex.org/W2126376408","https://openalex.org/W2148071019","https://openalex.org/W2149610364","https://openalex.org/W2150943407","https://openalex.org/W2161944474","https://openalex.org/W2172130438","https://openalex.org/W2472387553","https://openalex.org/W2551910508","https://openalex.org/W2605950814","https://openalex.org/W2744060242","https://openalex.org/W2774697022","https://openalex.org/W2909913318","https://openalex.org/W4247114301"],"related_works":["https://openalex.org/W2759986866","https://openalex.org/W2551040039","https://openalex.org/W2260965739","https://openalex.org/W2316679782","https://openalex.org/W4394393350","https://openalex.org/W3170226631","https://openalex.org/W2765701569","https://openalex.org/W4386387962","https://openalex.org/W3030386905","https://openalex.org/W2368405386"],"abstract_inverted_index":{"In":[0],"this":[1],"work":[2],"the":[3,35,45,50,66,70,91,99,115,128,133,137],"main":[4,116],"failure":[5,117],"mechanism":[6],"of":[7,21,78,98,132,136],"irradiated":[8],"charge":[9],"redistribution":[10],"Successive":[11],"Approximation":[12],"Register":[13],"(SAR)":[14],"Analog-to-Digital":[15],"Converters":[16],"(ADCs)":[17],"is":[18,82,120],"studied.":[19],"Results":[20],"a":[22,79,105],"gamma":[23],"radiation":[24,86],"experiment":[25],"on":[26,49],"two":[27],"identical":[28],"130nm,":[29],"8-bit":[30],"SAR":[31,80],"ADCs":[32],"(implemented":[33],"in":[34,124],"same":[36,92],"die),":[37],"operating":[38,55,96],"with":[39,109],"distinct":[40],"sampling":[41,51,67],"rates,":[42],"show":[43,104],"that":[44],"degradation":[46],"severity":[47],"depends":[48],"frequency.":[52],"The":[53],"converter":[54,71],"at":[56,60],"lower":[57,61],"frequency":[58,68],"fails":[59],"accumulated":[62],"dose,":[63],"while":[64],"increasing":[65],"increases":[69],"robustness":[72],"to":[73,84,113,122,127],"radiation.":[74],"A":[75],"SPICE":[76],"model":[77],"ADC":[81],"used":[83],"simulate":[85],"induced":[87],"leakage":[88,123],"effects,":[89],"considering":[90],"technology":[93],"node":[94],"and":[95],"conditions":[97],"tested":[100],"converters.":[101],"Simulation":[102],"results":[103],"very":[106],"good":[107],"agreement":[108],"experimental":[110],"data,":[111],"allowing":[112],"explain":[114],"mechanism,":[118],"which":[119],"related":[121],"switches":[125],"connected":[126],"programmable":[129],"capacitor":[130],"array":[131],"internal":[134],"DAC":[135],"converter.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}