{"id":"https://openalex.org/W3024643057","doi":"https://doi.org/10.1109/lats49555.2020.9093680","title":"Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells","display_name":"Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W3024643057","doi":"https://doi.org/10.1109/lats49555.2020.9093680","mag":"3024643057"},"language":"en","primary_location":{"id":"doi:10.1109/lats49555.2020.9093680","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093680","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/10923/18519","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027840377","display_name":"Zahira Perez-Rivera","orcid":"https://orcid.org/0000-0002-3053-3006"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Z. Perez","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062081934","display_name":"Javier Mesalles","orcid":null},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Javier Mesalles","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006378839","display_name":"Hector Villacorta","orcid":"https://orcid.org/0000-0003-4405-4935"},"institutions":[{"id":"https://openalex.org/I4210161008","display_name":"Universidad Polit\u00e9cnica de Aguascalientes","ror":"https://ror.org/05xg5y175","country_code":"MX","type":"education","lineage":["https://openalex.org/I4210161008"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"H. Villacorta","raw_affiliation_strings":["Polytechnic. University of Aguascalientes, Mexico"],"affiliations":[{"raw_affiliation_string":"Polytechnic. University of Aguascalientes, Mexico","institution_ids":["https://openalex.org/I4210161008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fabian Vargas","raw_affiliation_strings":["Catholic University of Rio Grande do Sul - PUCRS, Brazil"],"affiliations":[{"raw_affiliation_string":"Catholic University of Rio Grande do Sul - PUCRS, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico"],"affiliations":[{"raw_affiliation_string":"National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5027840377"],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03888216,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8824561834335327},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6077049970626831},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6052922010421753},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5397605895996094},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.5338109135627747},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4634641706943512},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.45345354080200195},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4450249671936035},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.44313159584999084},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4417819082736969},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41591811180114746},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3784225285053253},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36767151951789856},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2464931607246399}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8824561834335327},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6077049970626831},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6052922010421753},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5397605895996094},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.5338109135627747},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4634641706943512},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.45345354080200195},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4450249671936035},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.44313159584999084},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4417819082736969},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41591811180114746},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3784225285053253},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36767151951789856},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2464931607246399},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/lats49555.2020.9093680","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093680","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},{"id":"pmh:oai:repositorio.pucrs.br:10923/18519","is_oa":true,"landing_page_url":"https://hdl.handle.net/10923/18519","pdf_url":null,"source":{"id":"https://openalex.org/S4377196369","display_name":"PUCRS Repository (Pontifical Catholic University of Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45643870","host_organization_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","host_organization_lineage":["https://openalex.org/I45643870"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conferenceObject"}],"best_oa_location":{"id":"pmh:oai:repositorio.pucrs.br:10923/18519","is_oa":true,"landing_page_url":"https://hdl.handle.net/10923/18519","pdf_url":null,"source":{"id":"https://openalex.org/S4377196369","display_name":"PUCRS Repository (Pontifical Catholic University of Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45643870","host_organization_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","host_organization_lineage":["https://openalex.org/I45643870"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conferenceObject"},"sustainable_development_goals":[{"score":0.7200000286102295,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1567437819","https://openalex.org/W1667165204","https://openalex.org/W1910738982","https://openalex.org/W1966797259","https://openalex.org/W1988932225","https://openalex.org/W2010771403","https://openalex.org/W2034412792","https://openalex.org/W2045775916","https://openalex.org/W2082209063","https://openalex.org/W2082479800","https://openalex.org/W2093108103","https://openalex.org/W2103657905","https://openalex.org/W2117068879","https://openalex.org/W2134818410","https://openalex.org/W2141664222","https://openalex.org/W2165911664","https://openalex.org/W2346205343","https://openalex.org/W2415169000","https://openalex.org/W2904198392","https://openalex.org/W2942228371","https://openalex.org/W2953814537","https://openalex.org/W4235496104"],"related_works":["https://openalex.org/W2158870714","https://openalex.org/W1972492614","https://openalex.org/W2112776829","https://openalex.org/W1504951709","https://openalex.org/W4323831463","https://openalex.org/W2105010454","https://openalex.org/W3202758229","https://openalex.org/W2372710105","https://openalex.org/W2915176329","https://openalex.org/W2124241472"],"abstract_inverted_index":{"FinFET":[0,20,75],"technology":[1,10,17,21],"is":[2,30,65,103,128,146],"used":[3],"in":[4,38],"leading":[5],"high-performance/power-efficient":[6],"electronic":[7],"products.":[8],"This":[9,63],"has":[11,22],"proven":[12],"its":[13],"efficiency":[14],"after":[15],"22nm":[16],"nodes.":[18],"However,":[19],"new":[23,44],"manufacturing":[24],"and":[25,42,109,142],"design":[26],"complexities.":[27],"Thus,":[28],"it":[29],"required":[31],"to":[32,67,74],"study":[33],"the":[34,87,91,95,106,123,133],"behavior":[35,99],"of":[36,86,90,94,100,125,132,151],"defects":[37,49,69,102,127,153],"FunFET-based":[39],"SRAM":[40,77],"memories,":[41],"developing":[43],"test":[45,56,137],"strategies":[46,57],"for":[47,105],"those":[48],"that":[50,71],"are":[51,72],"not":[52],"covered":[53],"by":[54],"conventional":[55],"based":[58,76],"on":[59],"CMOS":[60],"fault":[61],"modeling.":[62],"paper":[64],"oriented":[66],"open-gate":[68,81],"hard-to-detect":[70],"unique":[73],"memory":[78,96],"cells.":[79],"The":[80,98,130,148],"defect":[82,114],"affects":[83],"only":[84],"one":[85],"parallel":[88],"fins":[89],"driver":[92],"transistors":[93],"cell.":[97],"these":[101,126,152],"studied":[104],"hold,":[107],"read":[108],"write":[110,120,135],"operations":[111],"using":[112,117,158],"realistic":[113],"models.":[115],"By":[116],"a":[118,159],"shorter":[119,134],"time":[121,136],"test,":[122],"detection":[124,149],"investigated.":[129],"effectiveness":[131],"method":[138],"at":[139],"nominal":[140],"parameters":[141],"under":[143],"process":[144],"variations":[145],"evaluated.":[147],"probability":[150],"can":[154],"be":[155],"further":[156],"enhanced":[157],"higher":[160],"power":[161],"supply":[162],"voltage.":[163]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}