{"id":"https://openalex.org/W3025658341","doi":"https://doi.org/10.1109/lats49555.2020.9093668","title":"An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems","display_name":"An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W3025658341","doi":"https://doi.org/10.1109/lats49555.2020.9093668","mag":"3025658341"},"language":"en","primary_location":{"id":"doi:10.1109/lats49555.2020.9093668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068207605","display_name":"Alexander Aponte-Moreno","orcid":"https://orcid.org/0000-0002-4569-0733"},"institutions":[{"id":"https://openalex.org/I36243813","display_name":"Universidad Nacional de Colombia","ror":"https://ror.org/059yx9a68","country_code":"CO","type":"education","lineage":["https://openalex.org/I36243813"]}],"countries":["CO"],"is_corresponding":true,"raw_author_name":"Alexander Aponte-Moreno","raw_affiliation_strings":["Dept. of Systems and Industrial Eng., Universidad Nacional de Colombia, Bogot\u00e1, D.C., Colombia"],"affiliations":[{"raw_affiliation_string":"Dept. of Systems and Industrial Eng., Universidad Nacional de Colombia, Bogot\u00e1, D.C., Colombia","institution_ids":["https://openalex.org/I36243813"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014943359","display_name":"Jos\u00e9 Isaza-Gonz\u00e1lez","orcid":"https://orcid.org/0000-0002-5772-2966"},"institutions":[{"id":"https://openalex.org/I86831216","display_name":"Universidad Tecnol\u00f3gica de Panam\u00e1","ror":"https://ror.org/030ve2c48","country_code":"PA","type":"education","lineage":["https://openalex.org/I86831216"]}],"countries":["PA"],"is_corresponding":false,"raw_author_name":"Jose Isaza-Gonzalez","raw_affiliation_strings":["Faculty of Systems Engineering, Universidad Tecnol\u00f3gica de Panam\u00e1, Panam\u00e1 City, Panam\u00e1"],"affiliations":[{"raw_affiliation_string":"Faculty of Systems Engineering, Universidad Tecnol\u00f3gica de Panam\u00e1, Panam\u00e1 City, Panam\u00e1","institution_ids":["https://openalex.org/I86831216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000867712","display_name":"Alejandro Serrano-Cases","orcid":"https://orcid.org/0000-0001-9794-8495"},"institutions":[{"id":"https://openalex.org/I130194489","display_name":"University of Alicante","ror":"https://ror.org/05t8bcz72","country_code":"ES","type":"education","lineage":["https://openalex.org/I130194489"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Alejandro Serrano-Cases","raw_affiliation_strings":["Dept. of Computer Technology, University of Alicante, Alicante, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Technology, University of Alicante, Alicante, Spain","institution_ids":["https://openalex.org/I130194489"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060002265","display_name":"Antonio Mart\u00ednez-\u00c1lvarez","orcid":"https://orcid.org/0000-0002-1500-857X"},"institutions":[{"id":"https://openalex.org/I130194489","display_name":"University of Alicante","ror":"https://ror.org/05t8bcz72","country_code":"ES","type":"education","lineage":["https://openalex.org/I130194489"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Antonio Martinez-Alvarez","raw_affiliation_strings":["Dept. of Computer Technology, University of Alicante, Alicante, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Technology, University of Alicante, Alicante, Spain","institution_ids":["https://openalex.org/I130194489"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021296662","display_name":"Sergio Cuenca-Asensi","orcid":"https://orcid.org/0000-0002-5830-6104"},"institutions":[{"id":"https://openalex.org/I130194489","display_name":"University of Alicante","ror":"https://ror.org/05t8bcz72","country_code":"ES","type":"education","lineage":["https://openalex.org/I130194489"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Sergio Cuenca-Asensi","raw_affiliation_strings":["Dept. of Computer Technology, University of Alicante, Alicante, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Technology, University of Alicante, Alicante, Spain","institution_ids":["https://openalex.org/I130194489"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014729135","display_name":"Felipe Restrepo\u2010Calle","orcid":"https://orcid.org/0000-0003-4226-1324"},"institutions":[{"id":"https://openalex.org/I36243813","display_name":"Universidad Nacional de Colombia","ror":"https://ror.org/059yx9a68","country_code":"CO","type":"education","lineage":["https://openalex.org/I36243813"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Felipe Restrepo-Calle","raw_affiliation_strings":["Dept. of Systems and Industrial Eng., Universidad Nacional de Colombia, Bogot\u00e1, D.C., Colombia"],"affiliations":[{"raw_affiliation_string":"Dept. of Systems and Industrial Eng., Universidad Nacional de Colombia, Bogot\u00e1, D.C., Colombia","institution_ids":["https://openalex.org/I36243813"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5068207605"],"corresponding_institution_ids":["https://openalex.org/I36243813"],"apc_list":null,"apc_paid":null,"fwci":0.3082,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55651087,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.9569393396377563},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.7837761640548706},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6742444634437561},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6661920547485352},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5883949398994446},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5573573708534241},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.550476610660553},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5168543457984924},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43947669863700867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.292228102684021},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.18033787608146667},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11316049098968506},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08967757225036621},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07522058486938477},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07131373882293701}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.9569393396377563},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.7837761640548706},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6742444634437561},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6661920547485352},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5883949398994446},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5573573708534241},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.550476610660553},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5168543457984924},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43947669863700867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.292228102684021},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.18033787608146667},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11316049098968506},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08967757225036621},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07522058486938477},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07131373882293701},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats49555.2020.9093668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats49555.2020.9093668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Latin-American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W2047171058","https://openalex.org/W2062132293","https://openalex.org/W2062623691","https://openalex.org/W2096927458","https://openalex.org/W2121043529","https://openalex.org/W2122442616","https://openalex.org/W2252608406","https://openalex.org/W2416955034","https://openalex.org/W2512937801","https://openalex.org/W2921276465","https://openalex.org/W2943742477","https://openalex.org/W2969553121","https://openalex.org/W3149134903","https://openalex.org/W6677752811"],"related_works":["https://openalex.org/W1995583186","https://openalex.org/W3094215878","https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2082366402","https://openalex.org/W2120242933","https://openalex.org/W1657300322","https://openalex.org/W2055295790","https://openalex.org/W2083209667","https://openalex.org/W2185394135"],"abstract_inverted_index":{"Early":[0],"reliability":[1,38],"evaluations":[2],"of":[3,12,29,39,60,67,88,116],"a":[4,21,48,114],"microprocessor-based":[5],"system":[6,69],"can":[7],"be":[8],"achieved":[9],"by":[10,58,102],"means":[11,59],"fault":[13,30,61,95,117],"injection":[14,62,96,118],"tools":[15,97],"based":[16],"on":[17,51,75,105,122],"simulation.":[18],"This":[19],"is":[20,45],"widely":[22],"used":[23],"method":[24],"to":[25,35,72],"validate":[26],"the":[27,37,55,68,76,89,99,106,112,123],"effectiveness":[28],"mitigation":[31],"strategies,":[32],"and":[33],"also":[34],"assess":[36],"mission-critical":[40],"systems.":[41],"However,":[42],"more":[43],"research":[44],"needed":[46],"for":[47],"better":[49],"understanding":[50],"how":[52],"accurate":[53],"are":[54,120],"results":[56,90,100],"obtained":[57,91,101],"campaigns":[63],"using":[64,92],"simulated":[65],"models":[66],"in":[70],"comparison":[71,87],"emulated":[73],"faults":[74,104],"real":[77,107],"processor":[78],"system.":[79],"In":[80],"this":[81],"work,":[82],"we":[83],"present":[84],"an":[85],"experimental":[86],"two":[93],"simulation-based":[94],"against":[98],"emulating":[103],"processor.":[108],"To":[109],"carry":[110],"out":[111],"comparison,":[113],"series":[115],"experiments":[119],"performed":[121],"Texas":[124],"Instruments":[125],"MSP430":[126],"microcontroller.":[127]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}