{"id":"https://openalex.org/W7125127947","doi":"https://doi.org/10.1109/latincom67778.2025.11345425","title":"Enhancing Fault Tolerance in Optical Transport Networks: A Software-Defined Control Architecture","display_name":"Enhancing Fault Tolerance in Optical Transport Networks: A Software-Defined Control Architecture","publication_year":2025,"publication_date":"2025-11-05","ids":{"openalex":"https://openalex.org/W7125127947","doi":"https://doi.org/10.1109/latincom67778.2025.11345425"},"language":null,"primary_location":{"id":"doi:10.1109/latincom67778.2025.11345425","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latincom67778.2025.11345425","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Latin-American Conference on Communications (LATINCOM)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5123508527","display_name":"Jes\u00fas Chaffe","orcid":null},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Jes\u00fas Chaffe","raw_affiliation_strings":["Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile","institution_ids":["https://openalex.org/I75778554"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063680510","display_name":"Nicol\u00e1s Jara","orcid":"https://orcid.org/0000-0003-2495-8929"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Nicol\u00e1s Jara","raw_affiliation_strings":["Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile","institution_ids":["https://openalex.org/I75778554"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5123507485","display_name":"Patricia Morales","orcid":null},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Patricia Morales","raw_affiliation_strings":["Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Técnica Federico Santa María,Department of Electronics Engineering,Valparaíso,Chile","institution_ids":["https://openalex.org/I75778554"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I75778554"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.6411773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10847","display_name":"Advanced Optical Network Technologies","score":0.40849998593330383,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10847","display_name":"Advanced Optical Network Technologies","score":0.40849998593330383,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.10109999775886536,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12216","display_name":"Network Time Synchronization Technologies","score":0.07760000228881836,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4693000018596649},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.40540000796318054},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.4049000144004822},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.3467000126838684},{"id":"https://openalex.org/keywords/systems-architecture","display_name":"Systems architecture","score":0.3285999894142151},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.3165000081062317}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5307000279426575},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4693000018596649},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.40540000796318054},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.4049000144004822},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35600000619888306},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.3467000126838684},{"id":"https://openalex.org/C98025372","wikidata":"https://www.wikidata.org/wiki/Q477538","display_name":"Systems architecture","level":3,"score":0.3285999894142151},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3165000081062317},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3061999976634979},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.2759999930858612},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2727999985218048},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2662000060081482},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.26179999113082886},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2605000138282776},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.25060001015663147}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/latincom67778.2025.11345425","is_oa":false,"landing_page_url":"https://doi.org/10.1109/latincom67778.2025.11345425","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Latin-American Conference on Communications (LATINCOM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1552030972","https://openalex.org/W2109918582","https://openalex.org/W2599162046","https://openalex.org/W2626353086","https://openalex.org/W2889941759","https://openalex.org/W2971479921","https://openalex.org/W3002486776","https://openalex.org/W3024733286","https://openalex.org/W3155539798","https://openalex.org/W3184112829","https://openalex.org/W4224228016","https://openalex.org/W4385656060","https://openalex.org/W4391558144"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-01-22T00:00:00"}