{"id":"https://openalex.org/W7147729079","doi":"https://doi.org/10.1109/lascas67804.2026.11457153","title":"Polysilicon Heater Control for Fast and Stable Temperature-Dependent Measurements","display_name":"Polysilicon Heater Control for Fast and Stable Temperature-Dependent Measurements","publication_year":2026,"publication_date":"2026-02-24","ids":{"openalex":"https://openalex.org/W7147729079","doi":"https://doi.org/10.1109/lascas67804.2026.11457153"},"language":null,"primary_location":{"id":"doi:10.1109/lascas67804.2026.11457153","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas67804.2026.11457153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5117163950","display_name":"Nicolas Gabriel Cotti","orcid":null},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]}],"countries":["AR"],"is_corresponding":true,"raw_author_name":"Nicolas Gabriel Cotti","raw_affiliation_strings":["Universidad Tecnológica Nacional,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Universidad Tecnológica Nacional,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina","institution_ids":["https://openalex.org/I128590013"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5095085111","display_name":"Lucas Lia\u00f1o","orcid":null},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Lucas Lia\u00f1o","raw_affiliation_strings":["Universidad Tecnológica Nacional,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Universidad Tecnológica Nacional,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina","institution_ids":["https://openalex.org/I128590013"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088810600","display_name":"F\u00e9lix Palumbo","orcid":"https://orcid.org/0000-0002-7749-5035"},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Felix Palumbo","raw_affiliation_strings":["Universidad Tecnológica Nacional, Allegro MicroSystems,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Universidad Tecnológica Nacional, Allegro MicroSystems,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina","institution_ids":["https://openalex.org/I128590013"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041114326","display_name":"A. Kasulin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andres Kasulin","raw_affiliation_strings":["Allegro MicroSystems,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Allegro MicroSystems,Buenos Aires,Argentina","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013774134","display_name":"Juan Pablo Goyret","orcid":"https://orcid.org/0000-0003-3652-3236"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Juan Pablo Goyret","raw_affiliation_strings":["Allegro MicroSystems,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Allegro MicroSystems,Buenos Aires,Argentina","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5132598355","display_name":"Mariano Garcia-Inza","orcid":null},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Mariano Garcia-Inza","raw_affiliation_strings":["Universidad Tecnológica Nacional, CONICET,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina"],"affiliations":[{"raw_affiliation_string":"Universidad Tecnológica Nacional, CONICET,Nanoelectronics Laboratory, UIDI-FRBA,Buenos Aires,Argentina","institution_ids":["https://openalex.org/I128590013"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5117163950"],"corresponding_institution_ids":["https://openalex.org/I128590013"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.93808784,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.3635999858379364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.3635999858379364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.17749999463558197,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.06449999660253525,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6564000248908997},{"id":"https://openalex.org/keywords/temperature-control","display_name":"Temperature control","score":0.5965999960899353},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5572999715805054},{"id":"https://openalex.org/keywords/temperature-cycling","display_name":"Temperature cycling","score":0.5252000093460083},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5238000154495239},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4788999855518341},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.4472000002861023},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.40220001339912415}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6564000248908997},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.5965999960899353},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5616000294685364},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5572999715805054},{"id":"https://openalex.org/C177564732","wikidata":"https://www.wikidata.org/wiki/Q7698333","display_name":"Temperature cycling","level":3,"score":0.5252000093460083},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5238000154495239},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4788999855518341},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4472000002861023},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4442000091075897},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4083999991416931},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.40220001339912415},{"id":"https://openalex.org/C72832162","wikidata":"https://www.wikidata.org/wiki/Q2131545","display_name":"Rapid thermal processing","level":3,"score":0.38119998574256897},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3596000075340271},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.34630000591278076},{"id":"https://openalex.org/C60327585","wikidata":"https://www.wikidata.org/wiki/Q723733","display_name":"Millisecond","level":2,"score":0.31150001287460327},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29739999771118164},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.2784000039100647},{"id":"https://openalex.org/C66726788","wikidata":"https://www.wikidata.org/wiki/Q175973","display_name":"Thermistor","level":2,"score":0.27379998564720154},{"id":"https://openalex.org/C128014804","wikidata":"https://www.wikidata.org/wiki/Q3150682","display_name":"Thermal mass","level":3,"score":0.26829999685287476},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.26829999685287476},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2547999918460846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas67804.2026.11457153","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas67804.2026.11457153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6661733388900757,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1965449493","https://openalex.org/W1988589550","https://openalex.org/W2007719944","https://openalex.org/W2052201268","https://openalex.org/W2065124251","https://openalex.org/W2088642617","https://openalex.org/W2089278103","https://openalex.org/W2090423589","https://openalex.org/W2099884755","https://openalex.org/W2104869653","https://openalex.org/W2115316626","https://openalex.org/W2132519925","https://openalex.org/W2134344835","https://openalex.org/W2532726906","https://openalex.org/W4229011206","https://openalex.org/W4308207269","https://openalex.org/W4367322498","https://openalex.org/W4409475444"],"related_works":[],"abstract_inverted_index":{"Accurate":[0],"and":[1,27,63],"rapid":[2],"temperature":[3,33,70],"control":[4,18,48],"is":[5],"essential":[6],"for":[7,68,77],"reliability":[8],"analysis":[9],"of":[10,44],"semiconductor":[11],"devices.":[12],"This":[13],"work":[14],"introduces":[15],"a":[16,22,28,32,42,56,74],"thermal":[17,39,61],"system":[19,49],"based":[20],"on":[21],"silicided":[23],"polysilicon":[24],"heater":[25],"(poly-heater)":[26],"diode":[29],"functioning":[30],"as":[31],"sensor.":[34],"These":[35],"devices":[36],"achieve":[37],"high-amplitude":[38],"cycling":[40],"in":[41],"matter":[43],"milliseconds":[45],"while":[46],"the":[47,65],"maintains":[50],"high":[51],"stability.":[52],"Experimental":[53],"results":[54],"show":[55],"significant":[57],"improvement":[58],"over":[59],"conventional":[60],"chucks":[62],"demonstrate":[64],"system's":[66],"potential":[67],"automating":[69],"sweeps,":[71],"making":[72],"it":[73],"compelling":[75],"tool":[76],"studying":[78],"temperature-dependent":[79],"degradation.":[80]},"counts_by_year":[],"updated_date":"2026-04-02T13:53:19.096889","created_date":"2026-04-02T00:00:00"}