{"id":"https://openalex.org/W4395679191","doi":"https://doi.org/10.1109/lascas60203.2024.10506165","title":"A Holistic Approach for Characterization of SET Effects in a Standard Digital Cell Library","display_name":"A Holistic Approach for Characterization of SET Effects in a Standard Digital Cell Library","publication_year":2024,"publication_date":"2024-02-27","ids":{"openalex":"https://openalex.org/W4395679191","doi":"https://doi.org/10.1109/lascas60203.2024.10506165"},"language":"en","primary_location":{"id":"doi:10.1109/lascas60203.2024.10506165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas60203.2024.10506165","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039322577","display_name":"Marko Andjelkovi\u0107","orcid":"https://orcid.org/0000-0001-6419-2062"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Marko Andjelkovic","raw_affiliation_strings":["IHP – Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"],"affiliations":[{"raw_affiliation_string":"IHP – Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP – Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"],"affiliations":[{"raw_affiliation_string":"IHP – Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5039322577"],"corresponding_institution_ids":["https://openalex.org/I96578850"],"apc_list":null,"apc_paid":null,"fwci":0.2225,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48303456,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6491562724113464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6349779963493347},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5875015258789062},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.57639479637146},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.5592482089996338},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5385928750038147},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5233936905860901},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.507595419883728},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5071139335632324},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.47423407435417175},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4724041819572449},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4549100995063782},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.41525426506996155},{"id":"https://openalex.org/keywords/propagation-of-uncertainty","display_name":"Propagation of uncertainty","score":0.4142591059207916},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.377097487449646},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3465918302536011},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3323701024055481},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2105579376220703},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20152103900909424},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.19401636719703674},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17237895727157593},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12423717975616455},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.09234744310379028}],"concepts":[{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6491562724113464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6349779963493347},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5875015258789062},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.57639479637146},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.5592482089996338},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5385928750038147},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5233936905860901},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.507595419883728},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5071139335632324},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.47423407435417175},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4724041819572449},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4549100995063782},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.41525426506996155},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.4142591059207916},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.377097487449646},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3465918302536011},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3323701024055481},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2105579376220703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20152103900909424},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.19401636719703674},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17237895727157593},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12423717975616455},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.09234744310379028},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas60203.2024.10506165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas60203.2024.10506165","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W364841832","https://openalex.org/W1888427026","https://openalex.org/W1972293597","https://openalex.org/W1979296439","https://openalex.org/W1981113618","https://openalex.org/W2061964009","https://openalex.org/W2062584389","https://openalex.org/W2062980181","https://openalex.org/W2070746369","https://openalex.org/W2072880397","https://openalex.org/W2099569658","https://openalex.org/W2100219166","https://openalex.org/W2105460788","https://openalex.org/W2108126303","https://openalex.org/W2115516668","https://openalex.org/W2140654092","https://openalex.org/W2143781639","https://openalex.org/W2149041233","https://openalex.org/W2151691428","https://openalex.org/W2170649610","https://openalex.org/W2285470358","https://openalex.org/W2294420364","https://openalex.org/W2346282901","https://openalex.org/W2349812101","https://openalex.org/W2526439187","https://openalex.org/W2618494826","https://openalex.org/W2767797438","https://openalex.org/W3004834510","https://openalex.org/W4230191437"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2518564956","https://openalex.org/W2066664769","https://openalex.org/W2168546702","https://openalex.org/W2897915160"],"abstract_inverted_index":{"This":[0],"work":[1],"introduces":[2],"a":[3,119],"framework":[4],"for":[5,41,50,75,92,133,188],"the":[6,37,45,59,62,70,89,112,123,130,137,143,148,166,173,179,189],"gate-level":[7],"characterization":[8,30,151],"and":[9,17,25,44,99,171,178],"modeling":[10],"of":[11,72,115,142,150,161],"Single":[12],"Event":[13],"Transient":[14],"(SET)":[15],"generation":[16,43,77],"propagation":[18],"effects":[19,117],"in":[20,61,118,136],"CMOS":[21],"standard":[22,125],"combinational":[23],"cells":[24],"their":[26],"hardened":[27],"variants.":[28],"The":[29,106,175],"is":[31],"based":[32],"on":[33,85],"electrical":[34],"simulations,":[35,147],"using":[36],"current":[38],"pulse":[39,48,97,102],"models":[40,91,108,177],"SET":[42,51,63,76,96,101,116,180],"trapezoidal":[46],"voltage":[47],"model":[49,131],"propagation.":[52],"We":[53],"have":[54],"shown":[55],"that":[56],"by":[57,128,156],"exploiting":[58],"similarities":[60],"response":[64],"under":[65],"different":[66],"input":[67],"logic":[68],"levels,":[69],"number":[71],"required":[73,168],"simulations":[74],"can":[78,153],"be":[79,154],"reduced":[80,155],"at":[81,157],"least":[82,158],"2x.":[83],"Based":[84],"obtained":[86],"simulation":[87],"results,":[88],"analytical":[90],"critical":[93],"charge,":[94],"generated":[95],"width":[98,103],"propagated":[100],"are":[104,182],"derived.":[105],"proposed":[107],"enable":[109],"to":[110,169,184],"simplify":[111],"subsequent":[113],"analysis":[114,192],"circuit":[120],"designed":[121],"with":[122],"characterized":[124],"cells.":[126],"Namely,":[127],"storing":[129],"coefficients":[132],"each":[134],"cell":[135],"look-up":[138],"table":[139],"(LUT),":[140],"instead":[141],"raw":[144],"data":[145,152],"from":[146],"amount":[149],"2":[159],"orders":[160],"magnitude,":[162],"thus":[163],"reducing":[164],"significantly":[165],"time":[167],"access":[170],"read":[172],"LUTs.":[174],"resulting":[176],"database":[181],"intended":[183],"serve":[185],"as":[186],"inputs":[187],"soft":[190],"error":[191],"tool.":[193]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}