{"id":"https://openalex.org/W2922427716","doi":"https://doi.org/10.1109/lascas.2019.8667578","title":"An All-Thin-Devices Level Shifter in Standard-Cell Format for Auto Place-and-Route Flow","display_name":"An All-Thin-Devices Level Shifter in Standard-Cell Format for Auto Place-and-Route Flow","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2922427716","doi":"https://doi.org/10.1109/lascas.2019.8667578","mag":"2922427716"},"language":"en","primary_location":{"id":"doi:10.1109/lascas.2019.8667578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2019.8667578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 10th Latin American Symposium on Circuits &amp; Systems (LASCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041291449","display_name":"Nestor Cuevas","orcid":"https://orcid.org/0000-0002-9211-7657"},"institutions":[{"id":"https://openalex.org/I115684694","display_name":"Industrial University of Santander","ror":"https://ror.org/00xc1d948","country_code":"CO","type":"education","lineage":["https://openalex.org/I115684694"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Nestor Cuevas","raw_affiliation_strings":["Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia","institution_ids":["https://openalex.org/I115684694"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052022415","display_name":"Javier Ardila","orcid":"https://orcid.org/0000-0001-6331-3133"},"institutions":[{"id":"https://openalex.org/I115684694","display_name":"Industrial University of Santander","ror":"https://ror.org/00xc1d948","country_code":"CO","type":"education","lineage":["https://openalex.org/I115684694"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Javier Ardila","raw_affiliation_strings":["Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia","institution_ids":["https://openalex.org/I115684694"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070510631","display_name":"Elkim Roa","orcid":"https://orcid.org/0000-0003-0290-7493"},"institutions":[{"id":"https://openalex.org/I115684694","display_name":"Industrial University of Santander","ror":"https://ror.org/00xc1d948","country_code":"CO","type":"education","lineage":["https://openalex.org/I115684694"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Elkim Roa","raw_affiliation_strings":["Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Systems Research Group - OnChip, Universidad Industrial de Santander, Bucaramanga, Colombia","institution_ids":["https://openalex.org/I115684694"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I115684694"],"apc_list":null,"apc_paid":null,"fwci":0.4843,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64495806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"45","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/logic-level","display_name":"Logic level","score":0.6401069760322571},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5386483669281006},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.519369900226593},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5109204649925232},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48741415143013},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4611987769603729},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4598584473133087},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.445162296295166},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.44104236364364624},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3525615334510803},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34233811497688293},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3286527395248413},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2884588837623596},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2085472047328949},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10998448729515076}],"concepts":[{"id":"https://openalex.org/C146569638","wikidata":"https://www.wikidata.org/wiki/Q173378","display_name":"Logic level","level":3,"score":0.6401069760322571},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5386483669281006},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.519369900226593},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5109204649925232},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48741415143013},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4611987769603729},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4598584473133087},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.445162296295166},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.44104236364364624},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3525615334510803},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34233811497688293},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3286527395248413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2884588837623596},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2085472047328949},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10998448729515076},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas.2019.8667578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2019.8667578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 10th Latin American Symposium on Circuits &amp; Systems (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1480050920","https://openalex.org/W1607087355","https://openalex.org/W1965484872","https://openalex.org/W2078175791","https://openalex.org/W2082007216","https://openalex.org/W2114898850","https://openalex.org/W2222911434","https://openalex.org/W2604184726","https://openalex.org/W2789272543","https://openalex.org/W2802153532"],"related_works":["https://openalex.org/W2532740565","https://openalex.org/W2049246612","https://openalex.org/W3014521742","https://openalex.org/W2271044277","https://openalex.org/W1900707063","https://openalex.org/W98108296","https://openalex.org/W3008786049","https://openalex.org/W2169508744","https://openalex.org/W2056291297","https://openalex.org/W1933280719"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,32,69,81,98],"standard-cell":[4,27],"format":[5],"all-thin-devices":[6],"level":[7,46,87],"shifter":[8,88],"suited":[9],"for":[10],"commercial":[11,23],"digital-flow":[12],"tools.":[13],"Despite":[14],"the":[15,60],"fact":[16],"that":[17],"it":[18],"is":[19],"possible":[20,82],"to":[21,59,72],"find":[22],"level-shifter":[24],"cells":[25,30],"in":[26,97],"format,":[28],"those":[29],"require":[31],"mixed":[33],"of":[34,40,64,92],"thick-":[35],"and":[36,55],"thin-devices.":[37],"The":[38,85],"use":[39],"only":[41],"thin-oxide":[42],"transistors":[43],"allows":[44],"placing":[45],"shifters":[47],"within":[48],"thin-device":[49],"based":[50],"digital":[51],"cells,":[52],"optimizing":[53],"area":[54,91],"place-and-route":[56],"process.":[57],"Due":[58],"maximum":[61],"voltage":[62,75],"ratings":[63],"thin":[65],"transistors,":[66],"we":[67],"adopted":[68],"switching":[70],"technique":[71],"prevent":[73],"high":[74],"differences":[76],"between":[77],"their":[78],"terminals,":[79],"avoiding":[80],"device":[83],"breakdown.":[84],"proposed":[86],"occupies":[89],"an":[90],"156\u03bcm":[93],"<sup":[94],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[95],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[96],"0.18\u03bcm":[99],"CMOS":[100],"node.":[101]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}