{"id":"https://openalex.org/W2683947377","doi":"https://doi.org/10.1109/lascas.2017.7948079","title":"Improving a MOSFET model for design by hand","display_name":"Improving a MOSFET model for design by hand","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2683947377","doi":"https://doi.org/10.1109/lascas.2017.7948079","mag":"2683947377"},"language":"en","primary_location":{"id":"doi:10.1109/lascas.2017.7948079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2017.7948079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039289013","display_name":"Ademir de Jesus Costa","orcid":null},"institutions":[{"id":"https://openalex.org/I126158947","display_name":"Universidade Federal da Bahia","ror":"https://ror.org/03k3p7647","country_code":"BR","type":"education","lineage":["https://openalex.org/I126158947"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ademir de Jesus Costa","raw_affiliation_strings":["Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil","institution_ids":["https://openalex.org/I126158947"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037446209","display_name":"Bruno Jambeiro Alves","orcid":null},"institutions":[{"id":"https://openalex.org/I126158947","display_name":"Universidade Federal da Bahia","ror":"https://ror.org/03k3p7647","country_code":"BR","type":"education","lineage":["https://openalex.org/I126158947"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Bruno Jambeiro Alves","raw_affiliation_strings":["Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil","institution_ids":["https://openalex.org/I126158947"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066138025","display_name":"Shirlene de Santana Soares","orcid":null},"institutions":[{"id":"https://openalex.org/I126158947","display_name":"Universidade Federal da Bahia","ror":"https://ror.org/03k3p7647","country_code":"BR","type":"education","lineage":["https://openalex.org/I126158947"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Shirlene de Santana Soares","raw_affiliation_strings":["Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil","institution_ids":["https://openalex.org/I126158947"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053594173","display_name":"Edson Pinto Santana","orcid":"https://orcid.org/0000-0003-2685-025X"},"institutions":[{"id":"https://openalex.org/I126158947","display_name":"Universidade Federal da Bahia","ror":"https://ror.org/03k3p7647","country_code":"BR","type":"education","lineage":["https://openalex.org/I126158947"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Edson Pinto Santana","raw_affiliation_strings":["Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil","institution_ids":["https://openalex.org/I126158947"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011600149","display_name":"Ana Isabela Ara\u00fajo Cunha","orcid":"https://orcid.org/0000-0003-3955-3430"},"institutions":[{"id":"https://openalex.org/I126158947","display_name":"Universidade Federal da Bahia","ror":"https://ror.org/03k3p7647","country_code":"BR","type":"education","lineage":["https://openalex.org/I126158947"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ana Isabela Araujo Cunha","raw_affiliation_strings":["Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica, Escola Polit\u00e9cnica Universidade Federal da Bahia, Salvador, Brazil","institution_ids":["https://openalex.org/I126158947"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I126158947"],"apc_list":null,"apc_paid":null,"fwci":0.7584,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61494764,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.857789158821106},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.8517651557922363},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.751190185546875},{"id":"https://openalex.org/keywords/channel-length-modulation","display_name":"Channel length modulation","score":0.5461025834083557},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4947004020214081},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49193310737609863},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4784964621067047},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47146087884902954},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.46457844972610474},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4402340054512024},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4116972088813782},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39168769121170044},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19547560811042786},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.18384206295013428},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.0877196192741394}],"concepts":[{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.857789158821106},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.8517651557922363},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.751190185546875},{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.5461025834083557},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4947004020214081},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49193310737609863},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4784964621067047},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47146087884902954},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.46457844972610474},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4402340054512024},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4116972088813782},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39168769121170044},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19547560811042786},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18384206295013428},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0877196192741394}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas.2017.7948079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2017.7948079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"},{"id":"https://openalex.org/F4320323681","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado da Bahia","ror":"https://ror.org/0473khm44"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2014617689","https://openalex.org/W2019188868","https://openalex.org/W2068397651","https://openalex.org/W2114750951","https://openalex.org/W2321466716","https://openalex.org/W2898648611","https://openalex.org/W2901856686","https://openalex.org/W6700271415","https://openalex.org/W6719816635"],"related_works":["https://openalex.org/W2157112210","https://openalex.org/W3115561561","https://openalex.org/W2166559311","https://openalex.org/W1674342579","https://openalex.org/W2544451817","https://openalex.org/W2084173215","https://openalex.org/W2801781964","https://openalex.org/W2025921353","https://openalex.org/W2542162669","https://openalex.org/W2975003965"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"the":[3,6,40,43],"methodology":[4],"for":[5,64],"extraction":[7],"of":[8,14],"threshold":[9,33],"voltage":[10,34],"and":[11,32,52],"specific":[12],"current":[13],"a":[15,56],"compact":[16],"MOSFET":[17],"model":[18],"is":[19,46],"extended":[20],"in":[21],"order":[22,26],"to":[23,55],"incorporate":[24],"second":[25],"effects":[27],"such":[28],"as":[29],"mobility":[30],"degradation":[31],"dependence":[35],"on":[36,48],"channel":[37],"length.":[38],"As":[39],"original":[41],"method,":[42],"proposed":[44],"one":[45],"based":[47],"transconductance-to-current":[49],"ratio":[50],"characteristics":[51],"gives":[53],"rise":[54],"more":[57],"accurate":[58],"semi-empirical":[59],"model,":[60],"yet":[61],"simple":[62],"enough":[63],"hand":[65],"calculations.":[66]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}