{"id":"https://openalex.org/W2629714914","doi":"https://doi.org/10.1109/lascas.2017.7948075","title":"Radiation sensitivity of XOR topologies in multigate technologies under voltage variability","display_name":"Radiation sensitivity of XOR topologies in multigate technologies under voltage variability","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2629714914","doi":"https://doi.org/10.1109/lascas.2017.7948075","mag":"2629714914"},"language":"en","primary_location":{"id":"doi:10.1109/lascas.2017.7948075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2017.7948075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090269446","display_name":"Ygor Quadros de Aguiar","orcid":"https://orcid.org/0000-0003-4416-2610"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ygor Q. de Aguiar","raw_affiliation_strings":["Instituto de Informática, PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil","Instituto de Inform\u00e1tica, Universidade Federal do RioGrande do Sul (UFRGS), Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informática, PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform\u00e1tica, Universidade Federal do RioGrande do Sul (UFRGS), Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016825373","display_name":"Cristina Meinhardt","orcid":"https://orcid.org/0000-0003-1088-1000"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Cristina Meinhardt","raw_affiliation_strings":["Centro de Ciências Computacionais, PPGComp, Universidade Federal do Rio Grande (FURG), Brazil","Centro de Ci\u00eancias Computacionais, Universidade Federal do Rio Grande (FURG), Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro de Ciências Computacionais, PPGComp, Universidade Federal do Rio Grande (FURG), Brazil","institution_ids":["https://openalex.org/I126460647"]},{"raw_affiliation_string":"Centro de Ci\u00eancias Computacionais, Universidade Federal do Rio Grande (FURG), Brazil","institution_ids":["https://openalex.org/I126460647"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo A. L. Reis","raw_affiliation_strings":["Instituto de Informática, PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil","Instituto de Inform\u00e1tica, Universidade Federal do RioGrande do Sul (UFRGS), Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informática, PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform\u00e1tica, Universidade Federal do RioGrande do Sul (UFRGS), Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.792,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.94438388,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7909048199653625},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6390402913093567},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.549396276473999},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.5409004092216492},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5122922658920288},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5000295639038086},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4885009527206421},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.48708534240722656},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4603253901004791},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.44406935572624207},{"id":"https://openalex.org/keywords/xor-gate","display_name":"XOR gate","score":0.4364981949329376},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.43621695041656494},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43352121114730835},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3288021683692932},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30530601739883423},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29336655139923096},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20981574058532715},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11737596988677979},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09114649891853333},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.08116349577903748}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7909048199653625},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6390402913093567},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.549396276473999},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.5409004092216492},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5122922658920288},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5000295639038086},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4885009527206421},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.48708534240722656},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4603253901004791},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.44406935572624207},{"id":"https://openalex.org/C28495749","wikidata":"https://www.wikidata.org/wiki/Q155516","display_name":"XOR gate","level":3,"score":0.4364981949329376},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.43621695041656494},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43352121114730835},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3288021683692932},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30530601739883423},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29336655139923096},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20981574058532715},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11737596988677979},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09114649891853333},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.08116349577903748},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas.2017.7948075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2017.7948075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7300000190734863,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W891163824","https://openalex.org/W1502438297","https://openalex.org/W1586979311","https://openalex.org/W1587386427","https://openalex.org/W1997325123","https://openalex.org/W2030501553","https://openalex.org/W2033591438","https://openalex.org/W2086237982","https://openalex.org/W2087974539","https://openalex.org/W2088416801","https://openalex.org/W2099569658","https://openalex.org/W2103902557","https://openalex.org/W2135818056","https://openalex.org/W2145100945","https://openalex.org/W2148480471","https://openalex.org/W2505323316","https://openalex.org/W2520656187","https://openalex.org/W2584544613","https://openalex.org/W3149410719","https://openalex.org/W6629920227"],"related_works":["https://openalex.org/W2787635923","https://openalex.org/W2308335786","https://openalex.org/W2086855029","https://openalex.org/W2580446878","https://openalex.org/W3186520623","https://openalex.org/W2060067973","https://openalex.org/W3208050235","https://openalex.org/W4205653939","https://openalex.org/W4205993785","https://openalex.org/W2007759991"],"abstract_inverted_index":{"Integrated":[0],"Circuits":[1],"are":[2],"becoming":[3],"more":[4,71],"susceptible":[5],"to":[6,10,16,26,37,69,81,96],"numerous":[7],"effects":[8],"due":[9],"the":[11,20,27,33,38,84,92,99,102],"reduction":[12],"of":[13,22,30,50,53,101],"its":[14],"robustness":[15],"external":[17],"noise.":[18],"Additionally,":[19],"increase":[21],"uncertainty":[23],"degree":[24],"related":[25],"many":[28],"sources":[29],"variation":[31],"in":[32,83],"manufacturing":[34],"process":[35],"contributes":[36],"reliability":[39],"issues.":[40],"This":[41],"work":[42],"is":[43],"aimed":[44],"at":[45],"presenting":[46],"a":[47],"comparative":[48],"analysis":[49],"radiation":[51],"sensitivity":[52],"different":[54],"XOR":[55],"implementations":[56],"using":[57],"two":[58],"multigate":[59],"devices:":[60],"double-gate":[61],"FinFET":[62,74],"and":[63],"Trigate.":[64],"Trigate-based":[65],"circuits":[66],"have":[67],"shown":[68],"be":[70],"robust":[72],"than":[73],"with":[75],"improvement":[76],"percentage":[77],"from":[78],"6,2%":[79],"up":[80,95],"12,6%":[82],"threshold":[85,93],"LET.":[86],"Further,":[87],"voltage":[88],"fluctuation":[89],"can":[90],"reduce":[91],"LET":[94],"20,8%,":[97],"increasing":[98],"susceptibility":[100],"analyzed":[103],"circuits.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}