{"id":"https://openalex.org/W2336144228","doi":"https://doi.org/10.1109/lascas.2016.7451012","title":"A 90 dB PSRR, 4 dBm EMI resistant MOSFET-Only Voltage Reference","display_name":"A 90 dB PSRR, 4 dBm EMI resistant MOSFET-Only Voltage Reference","publication_year":2016,"publication_date":"2016-02-01","ids":{"openalex":"https://openalex.org/W2336144228","doi":"https://doi.org/10.1109/lascas.2016.7451012","mag":"2336144228"},"language":"en","primary_location":{"id":"doi:10.1109/lascas.2016.7451012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2016.7451012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 7th Latin American Symposium on Circuits &amp; Systems (LASCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030071078","display_name":"David Cordova","orcid":"https://orcid.org/0000-0003-1471-0436"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"David Cordova","raw_affiliation_strings":["Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006843167","display_name":"Pedro Toledo","orcid":"https://orcid.org/0000-0002-5084-491X"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Pedro Toledo","raw_affiliation_strings":["Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026712887","display_name":"Hamilton Klimach","orcid":"https://orcid.org/0000-0003-2692-9371"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Hamilton Klimach","raw_affiliation_strings":["Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046426137","display_name":"S\u00e9rgio Bampi","orcid":"https://orcid.org/0000-0002-9018-6309"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Sergio Bampi","raw_affiliation_strings":["Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081525917","display_name":"Eric Fabris","orcid":"https://orcid.org/0000-0003-3313-4059"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Eric Fabris","raw_affiliation_strings":["Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"Graduate Program on Microelectronics, UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5030071078"],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.1874,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55254766,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"71","last_page":"74"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.9015194177627563},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6312900185585022},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5898095369338989},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.5813796520233154},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5170795917510986},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.5016424655914307},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4595372676849365},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.45105424523353577},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4429682791233063},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41892579197883606},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3824117183685303},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.367209792137146},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36191868782043457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16259688138961792}],"concepts":[{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.9015194177627563},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6312900185585022},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5898095369338989},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.5813796520233154},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5170795917510986},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.5016424655914307},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4595372676849365},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.45105424523353577},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4429682791233063},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41892579197883606},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3824117183685303},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.367209792137146},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36191868782043457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16259688138961792},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lascas.2016.7451012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas.2016.7451012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 7th Latin American Symposium on Circuits &amp; Systems (LASCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W595070222","https://openalex.org/W1603519780","https://openalex.org/W1972137959","https://openalex.org/W2004711226","https://openalex.org/W2081297699","https://openalex.org/W2122561791","https://openalex.org/W4245093133"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W4385545073","https://openalex.org/W1921091955","https://openalex.org/W3118196563","https://openalex.org/W2004711226"],"abstract_inverted_index":{"Electromagnetic":[0],"Interference":[1],"(EMI)":[2],"degrades":[3],"the":[4,44,65,71,118,141,146],"performance":[5],"of":[6,22,70,92,106,113,130,161],"voltage":[7],"and":[8,67,84,158,164],"current":[9],"references,":[10],"due":[11],"to":[12,123,145],"its":[13],"finite":[14],"Power":[15,148],"Supply":[16],"Rejection":[17],"Ratio":[18],"(PSRR).":[19],"The":[20,37,51,73],"design":[21],"a":[23,79,103,110,154],"90":[24],"dB":[25],"PSRR,":[26],"4":[27,131],"dBm":[28,132],"EMI":[29,128],"resistant":[30],"MOSFET-Only":[31],"Voltage":[32,38,107],"Reference":[33,39,108],"is":[34,40,53],"herein":[35],"presented.":[36],"designed":[41,77],"based":[42],"on":[43],"Zero":[45],"Temperature":[46,111],"Coefficient":[47,112],"(ZTC)":[48],"transistor":[49],"point.":[50],"high-PSRR":[52],"obtained":[54],"using":[55],"zero-V":[56],"<sub":[57,135,167],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[58,90,136,168],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[59],"transistors":[60],"as":[61],"active":[62],"loads":[63],"in":[64,78,140,153],"open":[66],"feedback":[68],"loop":[69],"circuit.":[72],"final":[74],"circuit":[75],"was":[76],"130":[80],"nm":[81],"CMOS":[82],"process":[83],"occupies":[85],"around":[86],"0.014":[87],"mm":[88],"<sup":[89],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[91],"silicon":[93],"area":[94],"while":[95],"consuming":[96],"just":[97],"1.15":[98],"\u03bcW.":[99],"Postlayout":[100],"simulations":[101],"present":[102],"206":[104],"mV":[105],"with":[109],"321":[114],"ppm/\u00b0":[115],"C,":[116],"for":[117],"temperature":[119],"range":[120],"from":[121],"-55":[122],"125":[124],"\u00b0":[125],"C.":[126],"An":[127],"source":[129],"(1":[133],"V":[134],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">pp</sub>":[137,169],")":[138],"injected":[139],"power":[142],"supply,":[143],"according":[144],"Direct":[147],"Injection":[149],"(DPI)":[150],"standard,":[151],"yield":[152],"maximum":[155],"DC":[156],"Shift":[157],"Peak-to-Peak":[159],"ripple":[160],"-0.17":[162],"%":[163],"822":[165],"\u03bcV":[166],",":[170],"respectively.":[171]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}