{"id":"https://openalex.org/W4309679213","doi":"https://doi.org/10.1109/kse56063.2022.9953777","title":"Detecting Coincidental Correctness and Mitigating Its Impacts on Localizing Variability Faults","display_name":"Detecting Coincidental Correctness and Mitigating Its Impacts on Localizing Variability Faults","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4309679213","doi":"https://doi.org/10.1109/kse56063.2022.9953777"},"language":"en","primary_location":{"id":"doi:10.1109/kse56063.2022.9953777","is_oa":false,"landing_page_url":"https://doi.org/10.1109/kse56063.2022.9953777","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 14th International Conference on Knowledge and Systems Engineering (KSE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011481562","display_name":"Thu-Trang Nguyen","orcid":"https://orcid.org/0000-0002-3596-2352"},"institutions":[{"id":"https://openalex.org/I4210117845","display_name":"University Of Information Technology","ror":"https://ror.org/03bxja712","country_code":"MM","type":"education","lineage":["https://openalex.org/I4210117845"]},{"id":"https://openalex.org/I142732210","display_name":"University of Engineering and Technology Lahore","ror":"https://ror.org/0051w2v06","country_code":"PK","type":"education","lineage":["https://openalex.org/I142732210"]}],"countries":["MM","PK"],"is_corresponding":true,"raw_author_name":"Thu-Trang Nguyen","raw_affiliation_strings":["VNU University of Engineering and Technology,Faculty of Information Technology","Faculty of Information Technology, VNU University of Engineering and Technology"],"affiliations":[{"raw_affiliation_string":"VNU University of Engineering and Technology,Faculty of Information Technology","institution_ids":["https://openalex.org/I4210117845"]},{"raw_affiliation_string":"Faculty of Information Technology, VNU University of Engineering and Technology","institution_ids":["https://openalex.org/I142732210"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084251723","display_name":"Hieu Dinh Vo","orcid":"https://orcid.org/0000-0002-9407-1971"},"institutions":[{"id":"https://openalex.org/I142732210","display_name":"University of Engineering and Technology Lahore","ror":"https://ror.org/0051w2v06","country_code":"PK","type":"education","lineage":["https://openalex.org/I142732210"]},{"id":"https://openalex.org/I4210117845","display_name":"University Of Information Technology","ror":"https://ror.org/03bxja712","country_code":"MM","type":"education","lineage":["https://openalex.org/I4210117845"]}],"countries":["MM","PK"],"is_corresponding":false,"raw_author_name":"Hieu Dinh Vo","raw_affiliation_strings":["VNU University of Engineering and Technology,Faculty of Information Technology","Faculty of Information Technology, VNU University of Engineering and Technology"],"affiliations":[{"raw_affiliation_string":"VNU University of Engineering and Technology,Faculty of Information Technology","institution_ids":["https://openalex.org/I4210117845"]},{"raw_affiliation_string":"Faculty of Information Technology, VNU University of Engineering and Technology","institution_ids":["https://openalex.org/I142732210"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5011481562"],"corresponding_institution_ids":["https://openalex.org/I142732210","https://openalex.org/I4210117845"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13405441,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.8274314403533936},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6590211987495422},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.6522913575172424},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6087612509727478},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5941042900085449},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.44629958271980286},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4460690915584564},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4207729697227478},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4142315685749054},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3331611752510071},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.2960085868835449},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24039128422737122},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18422815203666687},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1652379333972931},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1382814645767212},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10161718726158142}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.8274314403533936},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6590211987495422},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.6522913575172424},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6087612509727478},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5941042900085449},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.44629958271980286},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4460690915584564},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4207729697227478},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4142315685749054},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3331611752510071},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.2960085868835449},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24039128422737122},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18422815203666687},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1652379333972931},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1382814645767212},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10161718726158142},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/kse56063.2022.9953777","is_oa":false,"landing_page_url":"https://doi.org/10.1109/kse56063.2022.9953777","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 14th International Conference on Knowledge and Systems Engineering (KSE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1574376759","https://openalex.org/W1979496811","https://openalex.org/W2010833880","https://openalex.org/W2029079408","https://openalex.org/W2059018540","https://openalex.org/W2065201438","https://openalex.org/W2083825874","https://openalex.org/W2090883284","https://openalex.org/W2124682367","https://openalex.org/W2130323538","https://openalex.org/W2293624369","https://openalex.org/W2343875716","https://openalex.org/W2511206070","https://openalex.org/W2563500353","https://openalex.org/W2789767897","https://openalex.org/W2793769076","https://openalex.org/W2945111072","https://openalex.org/W2953901361","https://openalex.org/W3034583845","https://openalex.org/W3047637237","https://openalex.org/W3081485108","https://openalex.org/W3181990673","https://openalex.org/W3199560344","https://openalex.org/W4231040899","https://openalex.org/W4252984174","https://openalex.org/W6800903942"],"related_works":["https://openalex.org/W1667647204","https://openalex.org/W2404647514","https://openalex.org/W4247536566","https://openalex.org/W4241418540","https://openalex.org/W2018477250","https://openalex.org/W3119814709","https://openalex.org/W2404151853","https://openalex.org/W2030553922","https://openalex.org/W2419251450","https://openalex.org/W2383699822"],"abstract_inverted_index":{"Coincidental":[0],"correctness":[1],"is":[2,21,75,158],"the":[3,85,94,98,104,109,120,125,169,189,203,249],"phenomenon":[4],"that":[5,82,159,230],"test":[6,64,80,86,221],"cases":[7,222],"execute":[8],"faulty":[9],"statements":[10],"yet":[11],"still":[12],"produce":[13],"correct/expected":[14],"outputs.":[15],"In":[16,127,195,242],"software":[17],"testing,":[18],"this":[19,128],"problem":[20],"prevalent":[22],"and":[23,37,72,118,140,171],"causes":[24],"negative":[25,204],"impacts":[26,40,143,205],"on":[27,41,144,209,219,240],"fault":[28,115,211,250],"localization":[29,116,212,251],"performance.":[30],"Although":[31],"detecting":[32],"coincidentally":[33,193],"correct":[34],"(CC)":[35],"tests":[36,53,139,157,162,208],"mitigating":[38],"their":[39,142],"localizing":[42,145],"faults":[43,147],"in":[44,54,84,148],"non-configurable":[45],"systems":[46,59,228],"have":[47,60,173],"been":[48,61],"studied":[49],"in-depth,":[50],"handling":[51],"CC":[52,79,138,156,207,235],"Software":[55],"Product":[56],"Line":[57],"(SPL)":[58],"unexplored.":[62],"To":[63],"an":[65],"SPL":[66,149,227],"system,":[67],"products":[68],"are":[69],"often":[70],"sampled,":[71],"each":[73],"product":[74,100],"tested":[76],"individually.":[77],"The":[78],"cases,":[81],"occur":[83],"suite":[87],"of":[88,97,108,168,186,206,223],"a":[89,133,174],"product,":[90],"not":[91],"only":[92,184],"affect":[93,103,114],"testing":[95,106,176],"results":[96,107,218],"corresponding":[99],"but":[101],"also":[102],"overall":[105],"system.":[110,126],"This":[111],"could":[112,191,245],"negatively":[113],"performance":[117,252],"decelerate":[119],"quality":[121],"assurance":[122],"process":[123],"for":[124],"paper,":[129],"we":[130,197],"introduce":[131],"DEMiC,":[132],"novel":[134],"approach":[135],"to":[136,154,164,201,247],"detect":[137,155,234],"mitigate":[141,202],"variability":[146,210],"systems.":[150],"Our":[151,216],"key":[152],"idea":[153],"two":[160],"similar":[161,166,175],"tend":[163],"examine":[165],"behaviors":[167],"system":[170],"should":[172],"state":[177],"(i.e.,":[178],"both":[179],"passed":[180],"or":[181],"failed).":[182],"If":[183],"one":[185],"them":[187],"failed,":[188],"other":[190],"be":[192],"passed.":[194],"addition,":[196,243],"propose":[198],"several":[199],"solutions":[200],"at":[213],"different":[214],"levels.":[215],"experimental":[217],"+2,6M":[220],"five":[224],"widely":[225],"used":[226],"show":[229],"DEMiC":[231,244],"can":[232],"effectively":[233],"tests,":[236],"with":[237],"97%":[238],"accuracy":[239],"average.":[241],"help":[246],"improve":[248],"by":[253],"61%.":[254]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}